Abstract: An apparatus for testing electronic devices employs a programmable device to adjust the timing of the strobes such that the strobes sample the bit stream from a device under test at or near the center of the bit position. The strobe time adjustment is performed based on pairs of strobe readings made around a number of different bit positions. The programmable device examines the pairs of strobe reading made around each of the different bit positions to determine whether or not a bit transition has occurred there. The programmable device selects the bit positions around which a bit transition has not occurred as eye candidates, and defines the center of the largest contiguous region of eye candidates as the center of the bit position.

Abstract: Testing an integrated circuit (IC) device, for example, an IC that includes an embedded memory, may involve specifying one or more test parameters including at least one of a pipeline depth data (e.g., latency delay information) and a data width data (e.g. corresponding to a data width of an embedded memory), generating a test sequence by associating test parameters with a test pattern, and applying the generated test sequence to the integrated circuit device. A test system for testing ICs having embedded memories may include multiple test patterns and multiple data structures, each data structure defining one or more test parameters including at least one of a pipeline depth and a data width, an algorithmic pattern generator, and software for controlling the algorithmic pattern generator to generate a test sequence by associating a specified data structure with a specified test pattern.

Abstract: An apparatus for testing electronic devices employs a programmable device to adjust the timing of the strobes such that the strobes sample the bit stream from a device under test at or near the center of the bit position. The strobe time adjustment is performed based on pairs of strobe readings made around a number of different bit positions. The programmable device examines the pairs of strobe reading made around each of the different bit positions to determine whether or not a bit transition has occurred there. The programmable device selects the bit positions around which a bit transition has not occurred as eye candidates, and defines the center of the largest contiguous region of eye candidates as the center of the bit position.

Abstract: An apparatus for testing an integrated circuit includes a sequence control logic unit having an output channel connectable to an input pin of a device under test, a first memory to store a first instruction set comprising instructions executable by the sequence control logic unit, and a second memory to store a second instruction set comprising instructions executable by the sequence control logic unit, wherein at least one of the first memory and the second memory comprises a memory accessible in a non-sequential fashion.

Abstract: An apparatus for testing an integrated circuit includes a sequence control logic unit having an output channel connectable to an input pin of a device under test, a first memory to store a first instruction set comprising instructions executable by the sequence control logic unit, and a second memory to store a second instruction set comprising instructions executable by the sequence control logic unit, wherein at least one of the first memory and the second memory comprises a memory accessible in a non-sequential fashion.

Abstract: Testing an integrated circuit (IC) device, for example, an IC that includes an embedded memory, may involve specifying one or more test parameters including at least one of a pipeline depth data (e.g., latency delay information) and a data width data (e.g. corresponding to a data width of an embedded memory), generating a test sequence by associating test parameters with a test pattern, and applying the generated test sequence to the integrated circuit device. A test system for testing ICs having embedded memories may include multiple test patterns and multiple data structures, each data structure defining one or more test parameters including at least one of a pipeline depth and a data width, an algorithmic pattern generator, and software for controlling the algorithmic pattern generator to generate a test sequence by associating a specified data structure with a specified test pattern.