Patents by Inventor Kris Vallons

Kris Vallons has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Optical probe for scanning the features of an object and methods thereof
    Patent number: 7428061
    Abstract: An optical probe for measuring features of an object comprises two or more viewing directions and two or more projection directions. A method of measuring the features of an object comprises configuring an optical probe into two or more optical groups, wherein an optical group comprises one or more viewing directions and one or more projection directions, wherein at least one viewing direction and at least one projection direction is different between the optical groups, and wherein data obtained by the viewing directions is generated only from patterns projected by the projection directions of the same optical group. The method further comprises collecting data from each optical group while scanning the object.
    Type: Grant
    Filed: January 6, 2006
    Date of Patent: September 23, 2008
    Assignee: Metris IPR N.V.
    Inventors: Bart Van Coppenolle, Lieven De Jonge, Kris Vallons, Frank Thys
  • Optical probe for scanning the features of an object and methods thereof
    Publication number: 20060215176
    Abstract: An optical probe for measuring features of an object comprises two or more viewing directions and two or more projection directions. A method of measuring the features of an object comprises configuring an optical probe into two or more optical groups, wherein an optical group comprises one or more viewing directions and one or more projection directions, wherein at least one viewing direction and at least one projection direction is different between the optical groups, and wherein data obtained by the viewing directions is generated only from patterns projected by the projection directions of the same optical group. The method further comprises collecting data from each optical group while scanning the object.
    Type: Application
    Filed: January 6, 2006
    Publication date: September 28, 2006
    Inventors: Bart Van Coppenolle, Lieven De Jonge, Kris Vallons, Frank Thys
  • Optical probe for scanning the features of an object and methods therefor
    Patent number: 7009717
    Abstract: An optical probe for measuring features of an object comprises two or more viewing directions and two or more projection directions. A method of measuring the features of an object comprises configuring an optical probe into two or more optical groups, wherein an optical group comprises one or more viewing directions and one or more projection directions, wherein at least one viewing direction and at least one projection direction is different between the optical groups, and wherein data obtained by the viewing directions is generated only from patterns projected by the projection directions of the same optical group. The method further comprises collecting data from each optical group while scanning the object.
    Type: Grant
    Filed: August 13, 2003
    Date of Patent: March 7, 2006
    Assignee: Metris N.V.
    Inventors: Bart Van Coppenolle, Lieven De Jonge, Kris Vallons, Frank Thys
  • Optical probe for scanning the features of an object and methods therefor
    Publication number: 20040130729
    Abstract: An optical probe for measuring features of an object comprises two or more viewing directions and two or more projection directions. A method of measuring the features of an object comprises configuring an optical probe into two or more optical groups, wherein an optical group comprises one or more viewing directions and one or more projection directions, wherein at least one viewing direction and at least one projection direction is different between the optical groups, and wherein data obtained by the viewing directions is generated only from patterns projected by the projection directions of the same optical group. The method further comprises collecting data from each optical group while scanning the object.
    Type: Application
    Filed: August 13, 2003
    Publication date: July 8, 2004
    Inventors: Bart Van Coppenolle, Lieven De Jonge, Kris Vallons, Frank Thys