Patents by Inventor Krishna N. H. Sri

Krishna N. H. Sri has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20200116805
    Abstract: A test and measurement instrument, comprising at least one port configured to receive a signal from a device under test; a user interface configured to receive a user input, the user input indicating magnetic properties of a magnetic material of the device under test, and one or more processors. The one or more processors are configured to generate a hysteresis loop mask based on the magnetic properties of the magnetic material, determine whether the signal received from the device under test violates the hysteresis loop mask, and generate an alert when the signal received from the device under test violates the hysteresis loop mask. The test and measurement instrument may also include a display configured to display the hysteresis loop mask, the signal received from the device under test, and/or the alert.
    Type: Application
    Filed: October 15, 2018
    Publication date: April 16, 2020
    Applicant: Tektronix, Inc.
    Inventors: U N Vasudev, Gajendra Kumar Patro, Krishna N H Sri
  • Patent number: 9618965
    Abstract: A system for dynamically calibrating operational parameters of a Device Under Test (DUT) includes a signal generator for generating a data pattern, a DUT structured to generate a clock signal, an oscilloscope structured to measure margins of the generated clock signal compared to an eye-diagram produced on the oscilloscope from the data pattern, and a calibration unit. The calibration unit can produce a candidate a jitter value for the signal generator, receive a determination from the oscilloscope whether the data pattern generated with the candidate jitter value causes the DUT to produce the generated clock signal within a pre-determined tolerance level, and modify the jitter value accordingly. The calibration unit may also be further structured to generate voltage swing values.
    Type: Grant
    Filed: July 30, 2015
    Date of Patent: April 11, 2017
    Assignee: Tektronix, Inc.
    Inventors: Ganesh K. Kumar, Krishna N H Sri, Madhusudhan Acharya, Kamlesh Mishra
  • Publication number: 20160334833
    Abstract: A system for dynamically calibrating operational parameters of a Device Under Test (DUT) includes a signal generator for generating a data pattern, a DUT structured to generate a clock signal, an oscilloscope structured to measure margins of the generated clock signal compared to an eye-diagram produced on the oscilloscope from the data pattern, and a calibration unit. The calibration unit can produce a candidate a jitter value for the signal generator, receive a determination from the oscilloscope whether the data pattern generated with the candidate jitter value causes the DUT to produce the generated clock signal within a pre-determined tolerance level, and modify the jitter value accordingly. The calibration unit may also be further structured to generate voltage swing values.
    Type: Application
    Filed: July 30, 2015
    Publication date: November 17, 2016
    Inventors: Ganesh K. Kumar, Krishna N H Sri, Madhusudhan Acharya, Kamlesh Mishra
  • Publication number: 20150032393
    Abstract: The disclosed technology relates to a method and apparatus for graphically displaying a switching cycle of a switching device. A switching voltage and a switching current are acquired for a device under test via a voltage probe and a current probe, respectively, for a plurality of switching cycles of the device under test. The switching current versus the switching voltage is plotted on a current versus voltage plot as a curve for each of the switching cycles. Each of the curves on the current versus voltage plot overlap each other and are displayed to a user.
    Type: Application
    Filed: April 21, 2014
    Publication date: January 29, 2015
    Applicant: TEKTRONIX, INC.
    Inventors: KRISHNA N H SRI, GAJENDRA KUMAR PATRO, ABHINAV BAL, GURUSHIDDAPPA M N
  • Patent number: 8670947
    Abstract: Embodiments of the invention provide a system and method to measure and represent the measured value of a limit in terms of another measurement, such as clock values or cycles of the system. The system can include, for example, a test and measurement instrument such as an oscilloscope. In another embodiment of the present invention, slew rate de-rated values may be automatically determined through the use of configurable lookup tables.
    Type: Grant
    Filed: April 30, 2010
    Date of Patent: March 11, 2014
    Assignee: Tektronix, Inc.
    Inventors: G. R. N. Prasanth, Pechluck Pongched, Raghavendran N., Mark L. Guenther, Krishna N. H. Sri, Manisha D. Ajgaonkar, Anuradha V.
  • Publication number: 20110119688
    Abstract: Embodiments of the invention provide a system and method to measure and represent the measured value of a limit in terms of another measurement, such as clock values or cycles of the system. The system can include, for example, a test and measurement instrument such as an oscilloscope. In another embodiment of the present invention, slew rate de-rated values may be automatically determined through the use of configurable lookup tables.
    Type: Application
    Filed: April 30, 2010
    Publication date: May 19, 2011
    Applicant: TEKTRONIX, INC.
    Inventors: G R N Prasanth, Pechluck Pongched, Raghavendran N, Mark L. Guenther, Krishna N. H. Sri, Manisha D. Ajgaonkar, Anuradha V
  • Publication number: 20080297170
    Abstract: A system, apparatus, and method for dynamic measurement of inductance trend of a motor are disclosed. In one of the embodiment herein the system is configured to acquire inputs from the DUT using a Trigger system, a horizontal subsystem and the programming unit. The system is also configured to process such information for dynamic analysis and representation on an interface provided in the system based on different step sizes.
    Type: Application
    Filed: May 21, 2008
    Publication date: December 4, 2008
    Applicant: TEKTRONIX, INC.
    Inventors: Krishna N. H. Sri, Mukesh Soni, Narasimha Murthy K.