Patents by Inventor Krishna Prasad Sigdel

Krishna Prasad Sigdel has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Force detection for microscopy based on direct tip trajectory observation
    Patent number: 9562927
    Abstract: With example embodiments described herein, a probe tip of a scanning probe microscope (such as an atomic force microscope (AFM)) is directly detected as it moves in a tapping mode to determine the tip positions over time, and a force for the tip is computed from these determined tip positions.
    Type: Grant
    Filed: October 1, 2015
    Date of Patent: February 7, 2017
    Assignee: The Curators of the University of Missouri
    Inventors: Gavin McLean King, Krishna Prasad Sigdel
  • Force Detection for Microscopy Based on Direct Tip Trajectory Observation
    Publication number: 20160124014
    Abstract: With example embodiments described herein, a probe tip of a scanning probe microscope (such as an atomic force microscope (AFM)) is directly detected as it moves in a tapping mode to determine the tip positions over time, and a force for the tip is computed from these determined tip positions.
    Type: Application
    Filed: October 1, 2015
    Publication date: May 5, 2016
    Inventors: Gavin McLean King, Krishna Prasad Sigdel