Patents by Inventor Kristiaan Van Rossen

Kristiaan Van Rossen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11340284
    Abstract: A first light source is directed at an outer surface of a workpiece in an inspection module. The light from the first light source that is reflected from the outer surface of the workpiece is directed to the camera via a first pathway. The light from the first light source transmitted through the workpiece is directed to the camera via a second pathway. A second light source is directed at the outer surface of the workpiece 180° from that of the first light source. The light from the second light source that is reflected from the outer surface of the workpiece is directed to the camera via the second pathway. The light from the second light source transmitted through the workpiece is directed to the camera via the first pathway.
    Type: Grant
    Filed: July 12, 2020
    Date of Patent: May 24, 2022
    Assignee: KLA Corporation
    Inventors: Kristiaan Van Rossen, Christophe Wouters
  • Publication number: 20210025934
    Abstract: A first light source is directed at an outer surface of a workpiece in an inspection module. The light from the first light source that is reflected from the outer surface of the workpiece is directed to the camera via a first pathway. The light from the first light source transmitted through the workpiece is directed to the camera via a second pathway. A second light source is directed at the outer surface of the workpiece 180° from that of the first light source. The light from the second light source that is reflected from the outer surface of the workpiece is directed to the camera via the second pathway. The light from the second light source transmitted through the workpiece is directed to the camera via the first pathway.
    Type: Application
    Filed: July 12, 2020
    Publication date: January 28, 2021
    Inventors: Kristiaan Van Rossen, Christophe Wouters
  • Patent number: 9255893
    Abstract: An apparatus for illuminating monocrystalline and polycrystalline substrates in order to image micro cracks, pinholes and inclusions in the substrates is disclosed. A first illumination system illuminates a first line of light on the front surface of the substrate. A second illumination system illuminates a second line of light on the front surface of the substrate. The first line of light and the second line of light are oriented transverse to the transport direction (T). The second illumination system is arranged within a 3-dimensional coordinate system such that the substrate is illuminated under a second angle. The arrangement of the second illumination system is comparable to a street lamp. A camera, preferably a camera, is arranged such that it faces the back surface of the substrate. The camera captures light which is transmitted through the substrate from the first illumination system and the second illumination system.
    Type: Grant
    Filed: April 18, 2011
    Date of Patent: February 9, 2016
    Assignee: KLA-Tencor Corporation
    Inventors: Wojciech Grzegorczyk, Kristiaan Van Rossen, Johan De Greeve, Dominique Janssens
  • Publication number: 20130035881
    Abstract: A system for characterizing interruption defect induced efficiency loss in a photovoltaic cell includes an inspection system configured to acquire inspection data from a photovoltaic cell, a control system configured to: receive the inspection data acquired from the photovoltaic cell, identify one or more interruption defects in one or more fingers of an electrode of the one photovoltaic cell utilizing the inspection data, determine a spatial parameter associated with at least one of the identified interruption defects and one or more floating finger portions of the one or more fingers created by two or more identified interruption defects, determine an interruption-defect-induced efficiency loss of the photovoltaic cell based on the determined spatial parameter associated with the at least one of the identified interruption defects and the floating finger portions of the one or more fingers created by two or more identified interruption defects.
    Type: Application
    Filed: August 2, 2012
    Publication date: February 7, 2013
    Applicant: KLA-TENCOR CORPORATION
    Inventors: Choon (George) Hoong Hoo, Patrick Tung-Sing Pak, Choon Wai Chang, Kristiaan Van Rossen, Johan DeGreeve, Lieve Govaerts, Jia-Jie Patrick Yin
  • Publication number: 20120262566
    Abstract: Apparatus for illuminating monocrystalline and polycrystalline substrates (10) is disclosed in order to image micro cracks, pinholes and inclusions in the substrates (10). A first illumination system (1) illuminates a first line (11) of light on the front surface (31) of the substrate (10). A second illumination system (2) illuminates a second line (12) of light on the front surface (31) of the substrate (10). The first line (11) of light and the second line (12) of light are oriented transverse to the transport direction (T). The second illumination system (2) is arranged within a 3-dimensional coordinate system such that the substrate (10) is illuminated under a second angle ?. The arrangement of the second illumination system (2) is comparable to a street lamp. A camera, preferably a camera (6), is arranged such that it faces the back surface (32) of the substrate (10).
    Type: Application
    Filed: April 18, 2011
    Publication date: October 18, 2012
    Applicant: KLA-TENCOR CORPORATION
    Inventors: Wojciech Grzegorczyk, Kristiaan Van Rossen, Johan De Greeve, Dominique Janssens