Abstract: This invention is directed towards finding, locating, and confirming threat items and substances. The inspection system is designed to detect objects that are made from, but not limited to, special nuclear materials (“SNM”) and/or high atomic number materials. The system employs advanced image processing techniques to analyze images of an object under inspection (“OUI”), which includes, but is not limited to baggage, parcels, vehicles and cargo, and fluorescence detection.

Abstract: The present invention provides for an improved scanning process having a first stage to rapidly identify a threat location and a second stage to accurately identify the nature of the threat. The improved scanning process maintains a high degree of accuracy while still providing an operationally desirable high throughput. One embodiment of the present invention provides an apparatus for identifying an object concealed within a container. It comprises a first stage inspection system having a Computed Tomography system to generate a first set of data and a plurality of processors in data communication with the first stage inspection system. The processors process the first set of data and are used to identify at least one target region. A second stage inspection system is then used to generate an inspection region, which is then positioned relative to the target region and made to at least partially physically coincide with the target region.

Abstract: The present invention provides for an improved scanning process having microwave arrays comprised of microwave transmitters in radiographic alignment with microwave receivers. The microwave array emits controllably directed microwave radiation toward an object under inspection. The object under inspection absorbs radiation in a manner dependent upon its metal content. The microwave radiation absorption can be used to generate a measurement of metal content. The measurement, in turn, can be used to calculate at least a portion of the volume and shape of the object under inspection. The measurement can be compared to a plurality of predefined threats. The microwave screening system can be used in combination with other screening technologies, such as NQR-based screening, X-ray transmission based screening, X-ray scattered based screening, or Computed Tomography based screening.

Abstract: The present invention provides for an improved scanning process having a first stage to rapidly identify a threat location and a second stage to accurately identify the nature of the threat. The improved scanning process maintains a high degree of accuracy while still providing an operationally desirable high throughput. The present invention also uses improved processing techniques that enable the substantially automated detection of threats and decrease the dependence on operator accuracy. One embodiment of the present invention provides an apparatus for identifying an object concealed within a container. It comprises a first stage inspection system having at least two X-ray projection systems to generate a first set of data and a plurality of processors in data communication with the first stage inspection system. The processors process the first set of data to generate at least two images. The two images are used to identify at least one target region from the two images.

Abstract: A radiation detection device comprising a housing which comprises an entrance window and in which at least one ionization chamber detector is arranged. The detector comprises a flat high-voltage electrode which is directed transversely transverse the entrance window and a flat collector electrode which is arranged to be at least substantially parallel to the high-voltage electrode. The end faces of these electrodes which face the entrance window are in electrical contact with a flat auxiliary electrode which extends parallel to the entrance window. As a result, a small direct current flows in a direction transverse to the other electrodes during operation, because the auxiliary electrode has a low electrical conductivity. Consequently, the electrical field in the ionization chamber detector is very homogeneous, with the result that the measuring speed can be optimized.

Abstract: Xonics chambers can normally be used only with comparatively low electrode voltages in the Townsend-plateau region of the discharge where no charge carrier multiplication occurs. The sensitivity is then comparatively low. The sensitivity can be increased by increasing the electrode voltage, but this gives rise to a high electrode voltage for a reasonable charge carrier multiplication. According to the invention a gas is added whose ionization energy is smaller than the energy of the lowest metastable levels of the rare gas in the chamber. The charge carrier multiplication, and hence the sensitivity is thus improved without the electrode voltage being substantially increased. For example, when 0.2% by volume trimethylamine is added, an electrode voltage of 13 kV already suffices.

Abstract: An x-ray exposure device comprising a flat and plane rectangular chamber containing an ionizable gas and having walls provided with electrode structures which generate a potential distribution corresponding to that of two concentric spherical electrodes, an insulating foil on which charge carriers resulting from ionization of the gas by the x-radiation and displaceable in the longitudinal direction of the chamber being arranged therewithin.