Patents by Inventor Kristina Helena Valborg Hedengren

Kristina Helena Valborg Hedengren has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6916290
    Abstract: An in situ breast tumor temperature profile measuring probe includes a rod, thermal sensors and electrical output leads. The thermal sensors are formed in spaced apart holes in an outer insulating layer of the rod and a common electrical input lead to provide an electrical input signal to the thermal sensors is disposed below and has portions exposed at the holes and electrically connected to the thermal sensors. The thermal sensors receive the electrical input signal from the common electrical input lead, sense the temperature of biological matter adjacent to the thermal sensors and produce an electrical output signal correlated thereto. Each electrical output lead mounted to the outer insulating layer is in electrical contact with a different one of the thermal sensors to receive the electrical output signal from the one thermal sensor and output the same.
    Type: Grant
    Filed: March 5, 2002
    Date of Patent: July 12, 2005
    Assignee: General Electric Company
    Inventors: Kristina Helena Valborg Hedengren, William Paul Kornrumpf, Mark Lloyd Miller, Egidijus Edward Uzgiris
  • Patent number: 6701615
    Abstract: An inspection and sorting system for part repair includes at least one sensor for inspecting a part. The sensor is configured to obtain inspection data for the part. A comparison module is configured to receive the inspection data, to generate a repair profile for the part using the inspection data, and to compare the repair profile with a baseline to arrive at a repair recommendation for the part. A method includes inspecting a part with at least one sensor to obtain preliminary inspection data for the part. The method further includes generating a preliminary repair profile from the preliminary inspection data, comparing the preliminary repair profile with a baseline, and arriving at a repair recommendation for the part based on the comparison.
    Type: Grant
    Filed: March 8, 2002
    Date of Patent: March 9, 2004
    Assignee: General Electric Company
    Inventors: Kevin George Harding, John William Devitt, Nelson Raymond Corby, Jr., Kristina Helena Valborg Hedengren
  • Patent number: 6697764
    Abstract: A reduced access field inspection system includes a multimodality endoscopic assembly. Circuitry is coupled to the multimodality endoscopic assembly for generating signals associated with the multimodality endoscopic assembly. A communications link links the circuitry to a remote center of excellence for providing maintenance information.
    Type: Grant
    Filed: February 27, 2001
    Date of Patent: February 24, 2004
    Assignee: General Electric Company
    Inventors: Nelson Raymond Corby, Jr., Kristina Helena Valborg Hedengren
  • Publication number: 20030167616
    Abstract: An inspection and sorting system for part repair includes at least one sensor for inspecting a part. The sensor is configured to obtain inspection data for the part. A comparison module is configured to receive the inspection data, to generate a repair profile for the part using the inspection data, and to compare the repair profile with a baseline to arrive at a repair recommendation for the part. A method includes inspecting a part with at least one sensor to obtain preliminary inspection data for the part. The method further includes generating a preliminary repair profile from the preliminary inspection data, comparing the preliminary repair profile with a baseline, and arriving at a repair recommendation for the part based on the comparison.
    Type: Application
    Filed: March 8, 2002
    Publication date: September 11, 2003
    Applicant: General Electric CRD
    Inventors: Kevin George Harding, John William Devitt, Nelson Raymond Corby, Kristina Helena Valborg Hedengren
  • Patent number: 6550681
    Abstract: A cooking apparatus includes a scanning device for reading a tag disposed upon a cooking item, which tag includes cooking instructions, and a network connection for receiving updated information relative to a respective cooking item. Circuitry is coupled to the scanning device and to the network connection for updated and implementing the cooking instructions.
    Type: Grant
    Filed: February 3, 2000
    Date of Patent: April 22, 2003
    Assignee: General Electric Company
    Inventors: John Anderson Fergus Ross, Kirby Gannett Vosburgh, Jerome Johnson Tiemann, Kristina Helena Valborg Hedengren
  • Publication number: 20020099304
    Abstract: An in situ breast tumor temperature profile measuring probe (12) includes a rod (20), thermal sensors (22) and electrical output leads (24). The thermal sensors (22) are formed in spaced apart holes (30) in an outer insulating layer (26) of the rod (20) and a common electrical input lead (28) to provide an electrical input signal to the thermal sensors (22) is disposed below and has portions (28a) exposed at the holes (30) and electrically connected to the thermal sensors (22). The thermal sensors (22) receive the electrical input signal from the common electrical input lead (28), sense the temperature of biological matter adjacent to the thermal sensors (22) and produce an electrical output signal correlated thereto. Each electrical output lead (24) mounted to the outer insulating layer (26) is in electrical contact with a different one of the thermal sensors (22) to receive the electrical output signal from the one thermal sensor (22) and output the same.
    Type: Application
    Filed: March 5, 2002
    Publication date: July 25, 2002
    Inventors: Kristina Helena Valborg Hedengren, William Paul Kornrumpf, Mark Lloyd Miller, Egidijus Edward Uzgiris
  • Patent number: 6419635
    Abstract: An in situ breast tumor temperature profile measuring probe includes a rod, thermal sensors and electrical output leads. The thermal sensors are formed in spaced apart holes in an outer insulating layer of the rod and a common electrical input lead to provide an electrical input signal to the thermal sensors is disposed below and has portions exposed at the holes and electrically connected to the thermal sensors. The thermal sensors receive the electrical input signal from the common electrical input lead, sense the temperature of biological matter adjacent to the thermal sensors and produce an electrical output signal correlated thereto. Each electrical output lead mounted to the outer insulating layer is in electrical contact with a different one of the thermal sensors to receive the electrical output signal from the one thermal sensor and output the same.
    Type: Grant
    Filed: August 11, 2000
    Date of Patent: July 16, 2002
    Assignee: General Electric Compsany
    Inventors: Kristina Helena Valborg Hedengren, William Paul Kornrumpf, Mark Lloyd Miller, Egidijus Edward Uzgiris
  • Publication number: 20010034585
    Abstract: A reduced access field inspection system includes a multimodality endoscopic assembly. Circuitry is coupled to the multimodality endoscopic assembly for generating signals associated with the multimodality endoscopic assembly. A communications link links the circuitry to a remote center of excellence for providing maintenance information.
    Type: Application
    Filed: February 27, 2001
    Publication date: October 25, 2001
    Inventors: Nelson Raymond Corby, Kristina Helena Valborg Hedengren
  • Patent number: 6252393
    Abstract: The invention provides a system and method for normalizing and calibrating a sensor array. The sensor array can comprise differential element sensors, such as for example eddy current sensors, or absolute sensors. A single test specimen is used to normalize and calibrate the sensor array using one or more scans of the test specimen. Notably, only one alignment of the sensor array to the test specimen is required. The test specimen is preferably made of the same or similar type of material as the part to be tested and is of a similar geometric shape that can have a simple flat surface or a more complex surface. A linear feature and several notches are machined into the surface of the specimen by using, for example, electro-discharge machining methods, to provide the necessary signals when scanned by the sensor array. Signals from the linear feature on the test specimen are used to remove any bias and to normalize the dynamic ranges of all of the sensors in the array.
    Type: Grant
    Filed: June 10, 1999
    Date of Patent: June 26, 2001
    Assignee: General Electric Company
    Inventor: Kristina Helena Valborg Hedengren
  • Patent number: 6180867
    Abstract: A thermal sensor array includes a dielectric layer including a plurality of individual thermal sensors and a pattern of deposited electrical interconnections facing at least one surface of the dielectric layer for providing electrical connections from each of the plurality of individual thermal sensors, the dielectric layer and the pattern of deposited electrical interconnections being surface-conformable. The thermal sensor array can be used in a diagnostic tool that further includes: a scanning device coupled to the pattern of deposited electrical interconnections for obtaining sensor signals from the thermal sensors; and a computer for processing the sensor signals to estimate temperature distributions.
    Type: Grant
    Filed: September 13, 1999
    Date of Patent: January 30, 2001
    Assignee: General Electric Company
    Inventors: Kristina Helena Valborg Hedengren, William Paul Kornrumpf, Mark Lloyd Miller, Beale Hibbs Opsahl-Ong, Egidijus Edward Uzgiris
  • Patent number: 6084174
    Abstract: A thermocouple array includes a dielectric layer having via openings therethrough, a first patterned conductive layer facing one surface of the dielectric layer, and a second patterned conductive layer facing another surface of the dielectric layer. Portions of the second patterned conductive layer can extend through the via openings to couple respective portions of the first patterned conductive layer. The second patterned conductive layer has a different thermal emf than the first patterned conductive layer. The dielectric layer, the first patterned conductive layer, and the second patterned conductive layer can be surface-conformable.
    Type: Grant
    Filed: May 12, 1999
    Date of Patent: July 4, 2000
    Assignee: General Electric Company
    Inventors: Kristina Helena Valborg Hedengren, William Paul Kornrumpf, Mark Lloyd Miller
  • Patent number: 6029530
    Abstract: An exemplary inspection apparatus for inspecting an article comprises a flexible sensor for sensing a characteristic of the article, which sensor conforms to a surface of the article, a finger cover which fits over a finger of a user, and an attachment device for removably attaching the sensor to the finger cover. The apparatus allows the user to traverse the sensor over a large range of smoothly varying concave or convex inspection surfaces, for example, while providing the user with direct control of the sensor.
    Type: Grant
    Filed: November 19, 1998
    Date of Patent: February 29, 2000
    Assignee: General Electric Company
    Inventors: Thadd Clark Patton, Robert John Filkins, James Paul Fulton, Kristina Helena Valborg Hedengren, John David Young
  • Patent number: 5909004
    Abstract: A thermocouple array includes a dielectric layer having via openings therethrough, a first patterned conductive layer facing one surface of the dielectric layer, and a second patterned conductive layer facing another surface of the dielectric layer. Portions of the second patterned conductive layer can extend through the via openings to couple respective portions of the first patterned conductive layer. The second patterned conductive layer has a different thermal emf than the first patterned conductive layer. The dielectric layer, the first patterned conductive layer, and the second patterned conductive layer can be surface-conformable.
    Type: Grant
    Filed: April 17, 1996
    Date of Patent: June 1, 1999
    Assignee: General Electric Company
    Inventors: Kristina Helena Valborg Hedengren, William Paul Kornrumpf, Mark Lloyd Miller
  • Patent number: 5895871
    Abstract: An exemplary inspection apparatus for inspecting an article comprises a flexible sensor for sensing a characteristic of the article, which sensor conforms to a surface of the article, a finger cover which fits over a finger of a user, and an attachment device for removably attaching the sensor to the finger cover. The apparatus allows the user to traverse the sensor over a large range of smoothly varying concave or convex inspection surfaces, for example, while providing the user with direct control of the sensor.
    Type: Grant
    Filed: July 25, 1997
    Date of Patent: April 20, 1999
    Assignee: General Electric Company
    Inventors: Thadd Clark Patton, Robert John Filkins, James Paul Fulton, Kristina Helena Valborg Hedengren, John David Young
  • Patent number: 5841277
    Abstract: A probe, such as an eddy current probe, which can be moved by hand to a surface to be tested. A toroidal-shaped first resilient member contacts the bottom face of a support member. An elastic membrane extends over the bore of the first resilient member, contacts the bottom lateral surface of the first resilient member, and is unattached to the radially-inward-facing surface of the first resilient member. A more elastic, second resilient member is placed in the bore, is unattached to the first resilient member, and contacts the bottom surface of the elastic membrane. A flexible, surface-conformable, eddy current sensing coil overlies a portion of the bottom side of the second resilient member.
    Type: Grant
    Filed: February 21, 1997
    Date of Patent: November 24, 1998
    Assignee: General Electric Company
    Inventors: Kristina Helena Valborg Hedengren, John David Young, Thomas Burrows Hewton, Carl Granger, Jr.
  • Patent number: 5822392
    Abstract: The present invention discloses a multi-resolution detector for use in an x-ray imaging implementation such as computed tomography and digital radiography. The multi-resolution detector includes a two-dimensional, m.times.n element array of low resolution detector elements and at least one high resolution detector element located about the two-dimensional, m.times.n element array of low resolution detector elements. After an object has been completely scanned with the multi-resolution detector the scan data from both the two-dimensional, m.times.n element array of low resolution detector elements and the high resolution detector element is used to reconstruct a high resolution image. In particular, the scan data generated from the two-dimensional, m.times.n element array of low resolution detector elements is used along with the initial scan data generated from the high resolution detector element to iteratively construct a high resolution image of the object.
    Type: Grant
    Filed: December 26, 1996
    Date of Patent: October 13, 1998
    Assignee: General Electric Company
    Inventor: Kristina Helena Valborg Hedengren
  • Patent number: 5801532
    Abstract: An eddy current probe which can be moved by hand to a surface to be tested. A toroidal-shaped first resilient member contacts the bottom face of a support member. An elastic membrane extends over the bore of the first resilient member, contacts the bottom lateral surface of the first resilient member, and is unattached to the radially-inward-facing surface of the first resilient member. A more elastic, second resilient member is placed in the bore, is unattached to the first resilient member, and contacts the bottom surface of the elastic membrane. A flexible, surface-conformable, eddy current sensing coil overlies a portion of the bottom side of the second resilient member.
    Type: Grant
    Filed: February 21, 1997
    Date of Patent: September 1, 1998
    Assignee: General Electric Company
    Inventors: Thadd Clark Patton, Robert John Filkins, James Paul Fulton, Kristina Helena Valborg Hedengren, John David Young
  • Patent number: 5717332
    Abstract: A system and method for determining fiber-depth of at least one layer of reinforcing fibers within an electrically conductive workpiece is provided. The system comprises an eddy current probe having one or more eddy current elements for generating a respective electrical signal indicative of a spacing with respect to a predetermined section of the reinforcing fibers. A signal processor is connected to the eddy current probe to receive and to process each spacing-indication electrical signal so as to generate data indicative of fiber-depth of the predetermined section relative to a workpiece surface. A display device may be connected to the signal processor to provide visual indicia representative of the fiber depth. Further a controller may be connected to receive and store the fiber-depth data which can be used by a machining device for selectively removing material from the workpiece surface, in accordance with the stored fiber-depth data.
    Type: Grant
    Filed: January 23, 1997
    Date of Patent: February 10, 1998
    Assignee: General Electric Company
    Inventors: Kristina Helena Valborg Hedengren, Richard Oscar McCary
  • Patent number: 5659248
    Abstract: An eddy current surface measurement array structure for complete coverage of an underlying inspection surface without requiring mechanical scanning is disclosed. A three-dimensional array of eddy current sense elements is organized as a plurality of layers of two-dimensional sub-arrays. The sub-arrays, although in different layers, are essentially identical in configuration, and are staggered such that the sense elements of one layer provide at least partial coverage of portions of the inspection surface not covered by the sense elements of another layer. As many staggered layers are included as are necessary to ensure that no "blind spots" remain, for complete coverage of the underlying inspection surface. The sense elements are disposed in a layered flexible structure fabricated employing high density interconnect fabrication techniques or other photolithographic techniques.
    Type: Grant
    Filed: April 15, 1996
    Date of Patent: August 19, 1997
    Assignee: General Electric Company
    Inventors: Kristina Helena Valborg Hedengren, William Paul Kornrumpf