Abstract: The present invention provides a system and method for high throughput processing using sample holders. The system has a plurality of work perimeters, with a rotational robot preferably associated with each work perimeter. At least one transfer station area is provided between adjacent work perimeters to facilitate robotic transfer of sample holders from one work perimeter to another area. Each work perimeter typically includes a plurality of defined station locations, with each station location positioned to be accessible by the robot associated with that area. In addition, each station location is typically configured to receive a device, such as an automated instrument or a holding nest. Device components are arranged at selected station locations according to specific application requirements to provide a flexible, robust, reliable, and accurate high throughput processing system.

Abstract: Briefly, the present invention provides a system and method for high throughput processing using sample holders. The system has a plurality of work perimeters, with a rotational robot preferably associated with each work perimeter. At least one transfer station area is provided between adjacent work perimeters to facilitate robotic transfer of sample holders from one work perimeter to another area. Each work perimeter typically includes a plurality of defined station locations, with each station location positioned to be accessible by the robot associated with that area. In addition, each station location is typically configured to receive a device, such as an automated instrument or a holding nest. Device components are arranged at selected station locations according to specific application requirements to provide a flexible, robust, reliable, and accurate high throughput processing system.

Abstract: The specimen plate lid is generally a block, with a cover portion and a side portion. An alignment protrusion extends from the side portion and cooperates with an alignment member of the specimen plate to assist in manually or roboticly guiding the lid onto the specimen plate. An underside surface of the cover has a sealing perimeter for receiving a seal constructed from a compliant material, and shaped to cooperate with a complimentary sealing surface on the specimen plate. The lid is weighted so that when the lid is aligned and positioned on the specimen plate, the weight of the lid provides a gravitational force to sufficiently compress the seal against the sealing surface on the specimen plate. Accordingly, the lid is sufficiently sealed to the specimen plate to avoid contamination and impermissible drying.

Abstract: The specimen plate lid is generally a block, with a cover portion and a side portion. An alignment protrusion extends from the side portion and cooperates with an alignment member of the specimen plate to assist in manually or roboticly guiding the lid onto the specimen plate. An underside surface of the cover has a sealing perimeter for receiving a seal constructed from a compliant material, and shaped to cooperate with a complimentary sealing surface on the specimen plate. The lid is weighted so that when the lid is aligned and positioned on the specimen plate, the weight of the lid provides a gravitational force to sufficiently compress the seal against the sealing surface on the specimen plate. Accordingly, the lid is sufficiently sealed to the specimen plate to avoid contamination and impermissible drying.

Abstract: Briefly, the present invention provides a system and method for high throughput processing using sample holders. The system has a plurality of work perimeters, with a rotational robot preferably associated with each work perimeter. At least one transfer station area is provided between adjacent work perimeters to facilitate robotic transfer of sample holders from one work perimeter to another area. Each work perimeter typically includes a plurality of defined station locations, with each station location positioned to be accessible by the robot associated with that area. In addition, each station location is typically configured to receive a device, such as an automated instrument or a holding nest. Device components are arranged at selected station locations according to specific application requirements to provide a flexible, robust, reliable, and accurate high throughput processing system.