Patents by Inventor Kriti Sen Sharma

Kriti Sen Sharma has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Methods and systems for metal artifact reduction in spectral CT imaging
    Patent number: 9498179
    Abstract: Various methods and systems for spectral computed tomography imaging are provided. In one embodiment, a method comprises acquiring a first projection dataset and a second projection dataset, detecting a location of metal in the first projection dataset, applying corrections to the first and second projection datasets based on the location of the metal, and displaying an image reconstructed from the corrected first and second projection datasets. In this way, metal artifacts may be substantially reduced in dual or multi-energy CT imaging.
    Type: Grant
    Filed: May 7, 2015
    Date of Patent: November 22, 2016
    Assignee: General Electric Company
    Inventors: Kriti Sen Sharma, Hewei Gao, Debashish Pal
  • METHODS AND SYSTEMS FOR METAL ARTIFACT REDUCTION IN SPECTRAL CT IMAGING
    Publication number: 20160324499
    Abstract: Various methods and systems for spectral computed tomography imaging are provided. In one embodiment, a method comprises acquiring a first projection dataset and a second projection dataset, detecting a location of metal in the first projection dataset, applying corrections to the first and second projection datasets based on the location of the metal, and displaying an image reconstructed from the corrected first and second projection datasets. In this way, metal artifacts may be substantially reduced in dual or multi-energy CT imaging.
    Type: Application
    Filed: May 7, 2015
    Publication date: November 10, 2016
    Inventors: Kriti Sen Sharma, Hewei Gao, Debashish Pal