Patents by Inventor Krzysztof Iniewski

Krzysztof Iniewski has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20210022695
    Abstract: Various aspects include methods for compensating for the effects of charge sharing among pixelate detectors in X-ray detectors by applying a correspondence factor to counts of X-ray photons in energy bins to estimate incident X-ray photon energy bins. The correspondence factor may be determined by determining an incident X-ray photon energy spectrum, adjusting the incident X-ray photon energy spectrum to account for an energy resolution of the pixelated detector, generating a charge sharing model for the adjusted incident X-ray photon energy spectrum based on a percentage charge sharing parameter of the pixelated detector, applying the charge sharing model to energy bins of the pixelated detector to estimate counts in each of the energy bins, and determining the correspondence factor by comparing the estimated counts in each of the energy bins to counts in the energy bins that would be expected for the adjusting the incident X-ray photon energy spectrum.
    Type: Application
    Filed: July 17, 2020
    Publication date: January 28, 2021
    Inventors: Krzysztof INIEWSKI, Elmaddin GULIYEV, Conny HANSSON
  • Publication number: 20200393576
    Abstract: Various aspects include circuits and methods for use in X-ray detectors for obtaining time information regarding when an indication of an X-ray photon's energy, such as a CSA output voltage, and using the time information to obtain temporal-spectral data regarding an X-ray photon detection. The temporal-spectral data may be used to determine the X-ray photon's energy, to detect and account for multiple X-ray photon detection events (“pile ups”), and/or accommodating detection events in which charge is shared between two pixel detectors.
    Type: Application
    Filed: June 5, 2020
    Publication date: December 17, 2020
    Inventors: Bernard HARRIS, Krzysztof INIEWSKI
  • Publication number: 20200367839
    Abstract: Various aspects include methods compensating for Compton scattering effects in pixel radiation detectors. Various aspects may include determining whether gamma ray detection events occurred in two or more detector pixels within an event frame, determining whether the detection events occurred in detector pixels within a threshold distance of each other in response to determining that detection events occurred in two or more detector pixels within the event frame, and recording the two or more detection events as a single detection event having an energy equal to the sum of the measured energies of the two or more detection events located in the detector pixel having a highest measured energy in response to determining that the detection events occurred in detector pixels within the threshold distance of each other.
    Type: Application
    Filed: May 15, 2020
    Publication date: November 26, 2020
    Inventors: Krzysztof INIEWSKI, Saeid TAHERION, Glenn BINDLEY
  • Publication number: 20200326290
    Abstract: Various aspects include methods and devices for reducing the scanning time for an X-ray diffraction scanner system by increasing the count rate or efficiency of the energy discriminating X-ray detector. In a first embodiment, the count rate of the energy discriminating X-ray detector is increased by increasing the number of detectors counting X-ray scatter photon in particular energy bins by configuring individual pixel detectors within a 2-D X-ray detector array to count photons within specific energy bins. In a second embodiment, the gain of amplifier components in the detector processing circuitry is increased in order to increase the energy resolution of the detector. In a third embodiment, the individual pixel detectors within a 2-D X-ray detector array are configured to count photons within specific energy bins and the gain of amplifier components in the detector processing circuitry is increased in order to increase the energy resolution of the detector.
    Type: Application
    Filed: April 9, 2020
    Publication date: October 15, 2020
    Inventors: Krzysztof INIEWSKI, Michael AYUKAWA, Conny HANSSON
  • Publication number: 20200150297
    Abstract: Various aspects include methods of compensating for issues caused by charge sharing between pixels in pixel radiation detectors. Various aspects may include measuring radiation energy spectra with circuitry capable of registering detection events occurring simultaneous or coincident in two or more pixels, adjusting energy measurements of simultaneous-multi-pixel detection events by a charge sharing correction factor, and determining a corrected energy spectrum by adding the adjusted energy measurements of simultaneous-multi-pixel detection events to energy spectra of detection events occurring in single pixels. Adjusting energy measurements of simultaneous-multi-pixel detection events may include multiplying measured energies of simultaneous-multi-pixel detection events by a factor of one plus the charge sharing correction factor.
    Type: Application
    Filed: November 9, 2018
    Publication date: May 14, 2020
    Inventors: Krzysztof INIEWSKI, Conny HANSSON, Robert CRESTANI, Glenn BINDLEY
  • Publication number: 20190383956
    Abstract: A set of N standard bin count distributions may be generated by irradiating a test radiation detector system with an X-ray beam attenuated by a respective one of N different K-edge filters for each of the at least one X-ray source energy setting. Energy bins of detectors of a target radiation detector system may be calibrated by generating measured bin count distributions for each calibration setting in which a respective one of the N different K-edge filters attenuates a source X-ray beam. Calibration parameters of the detectors of the target radiation detector system may be adjusted to match each of the measured bin count distributions to a corresponding standard bin count distribution. In addition, energy resolution of the radiation detectors can be measured and calibrated by fitting a portion of the measured X-ray spectrum near a K-edge to a fitting function.
    Type: Application
    Filed: October 9, 2018
    Publication date: December 19, 2019
    Inventors: Elmaddin GULIYEV, Georgios PREKAS, Michael ROZLER, Krzysztof INIEWSKI, Jean MARCOUX, Conny HANNSON
  • Patent number: 6407412
    Abstract: The present invention relates to a metal oxide semiconductor (MOS) varactor that takes advantage of the beneficial characteristics of MOS varactors to provide a high maximum to minimum capacitance ratio. By coupling in parallel at least one pair of MOS varactors with similar but shifted capacitance voltage (C-V) curves, the resulting capacitance is generally linear while preserving the desirable large capacitance ratio. A pair of MOS varactors, one with a p+ type gate and one with a n+ doped gate connected in parallel approximates the desired result. However, by adding further varactor elements, with their threshold voltages shifted by either implanting specific properties in their bodies or by providing offset voltages, a more linear C-V curve is attained while preserving the desired capacitance ratio.
    Type: Grant
    Filed: March 10, 2000
    Date of Patent: June 18, 2002
    Assignee: PMC-Sierra Inc.
    Inventors: Krzysztof Iniewski, Sebastian Claudiusz Magierowski