Abstract: A method of generating a test vector pattern for an array, including determining a failure of a test of the array, defining a type of test vector pattern to generate using a graphical user interface, generating the test vector pattern, and testing the array using the test vector pattern. A test vector pattern generation tool, including an array, a test vector pattern, and a graphical user interface generating the test vector pattern. The array is tested using the custom test vector pattern.

Abstract: An apparatus and method for resetting a dynamic logic circuit is disclosed. The apparatus includes an input circuit coupled to a plurality of input nodes wherein the input circuit comprises a plurality of FETs connected between a first voltage node and a dynamic node of a logic circuit. The gate electrode of each input circuit FET is connected to one of the input nodes. Precharged FET is connected between the dynamic node and a second voltage node. The precharge FET is configured to conduct a current for precharging the dynamic node to a predetermined voltage. An inverter is coupled between the dynamic node and an output node. A precharge control circuit is connected in a feedback path between the output node and the precharge FET. The precharge control signal activates the precharge control FET in response to a RESET pulse width and deactivates the precharge FET in response to the voltage on the dynamic node.

Abstract: An apparatus and method for resetting a dynamic logic circuit is disclosed. The apparatus includes an input circuit coupled to a plurality of input nodes wherein the input circuit comprises a plurality of FETs connected between a first voltage node and a dynamic node of a logic circuit. The gate electrode of each input circuit FET is connected to one of the input nodes. Precharged FET is connected between the dynamic node and a second voltage node. The precharge FET is configured to conduct a current for precharging the dynamic node to a predetermined voltage. An inverter is coupled between the dynamic node and an output node. A precharge control circuit is connected in a feedback path between the output node and the precharge FET. The precharge control signal activates the precharge control FET in response to a RESET pulse width and deactivates the precharge FET in response to the voltage on the dynamic node.

Abstract: A dynamic pulse register which uses a standard clock signal and exhibits reduced propagation delay. The dynamic pulse register includes a precharge logic block configured to precharge an evaluate signal and an evaluate complement signal during a precharge phase. During an evaluate phase, a pulldown logic block is configured to discharge either the evaluate or evaluate complement signal in response to a valid data input to the pulse register. A driver logic block is configured to convey a data out signal as the complement of the evaluate complement signal, and a data out complement signal as the complement of the evaluate signal. Either the data out signal or the data out complement signal is thus charged (thereby producing the rising edge of the output pulse) in response to the discharging performed by the pulldown logic block.

Abstract: A dynamic pulse register which uses a standard clock signal and exhibits reduced propagation delay. The dynamic pulse register includes a precharge logic block configured to precharge an evaluate signal and an evaluate complement signal during a precharge phase. During an evaluate phase, a pulldown logic block is configured to discharge either the evaluate or evaluate complement signal in response to a valid data input to the pulse register. A driver logic block is configured to convey a data out signal as the complement of the evaluate complement signal, and a data out complement signal as the complement of the evaluate signal. Either the data out signal or the data out complement signal is thus charged (thereby producing the rising edge of the output pulse) in response to the discharging performed by the pulldown logic block.

Abstract: A memory circuit which steers read/write data to a memory array including a plurality of columns (at least one of which is redundant). Coupled to the bit line of each column are a normal mode write transistor and a redundant mode write transistor. If a failing column is detected during manufacturing testing of the memory array, a repair signal for each of the failing column and subsequent columns in the array are de-asserted. When a write operation is performed on the array, an input data bit is provided corresponding to each non-redundant column in the array. The input data bit written to a particular bit line, however, depends upon the state of the repair signal for that column. If the repair signal for a particular column is asserted, the input to the normal mode write transistor is conveyed as write data. Conversely, the input to the redundant mode write transistor is conveyed as write data if the repair signal is de-asserted for a particular column.

Abstract: Logic circuitry utilizing the advantages of static and dynamic design techniques utilize feed-forward from the inputs to the logic circuit and feed-back from the output of the logic circuit in order to provide a RESET signal to precharge the logic circuit to a predetermined state. This technique also provides for initialization of the circuit before the arrival of data input signals.