Abstract: In examples, an electronic device comprises a first speaker port, a second speaker port, and storage comprising a first port attribute corresponding to the first speaker port and a second port attribute corresponding to the second speaker port. The storage comprises executable code. The electronic device comprises a processor coupled to the first and second speaker ports and the storage. The processor, upon executing the executable code, is to collect ambient noise data using a first speaker corresponding to the first speaker port in response to the first port attribute indicating that the first speaker is to be used as a microphone and the second port attribute indicating that a second speaker corresponding to the second speaker port is to be used as a speaker. The processor is to modify an audio output signal using the ambient noise data collected using the first speaker. The processor is to provide the modified audio output signal to the second speaker port.

Abstract: An image test system includes a test assembly and an image capture card. The test assembly is provided for obtaining a test signal from a test object, and includes an interface conversion circuit for converting signal transmission form of the test signal. The image capture card is provided for obtaining the test signal from the test assembly, and obtaining an image data from the test signal. The image test system further includes a test signal clock generation circuit for obtaining a test signal clock from the test signal, or the image capture card further includes a pair of clock input pins for obtaining the test signal clock directly from the test object.

Abstract: An image test system includes a test assembly and an image capture card. The test assembly is provided for obtaining a test signal from a test object, and includes an interface conversion circuit for converting signal transmission form of the test signal. The image capture card is provided for obtaining the test signal from the test assembly, and obtaining an image data from the test signal. The image test system further includes a test signal clock generation circuit for obtaining a test signal clock from the test signal, or the image capture card further includes a pair of clock input pins for obtaining the test signal clock directly from the test object.

Abstract: An image test system includes a test assembly and an image capture card. The test assembly is provided for capturing test signals from test objects, and incudes a first transmission interface, a second transmission interface, and an interface conversion circuit. The interface conversion circuit is connected with the first transmission interface, and converts signal transmission forms of the test signals. The second transmission interface is connected with the interface conversion circuit. Besides, the image capture card is provided for connecting with the second transmission interface, and captures image data from the test signals.

Abstract: An image test system includes a test assembly and an image capture card. The test assembly is provided for capturing test signals from test objects, and incudes a first transmission interface, a second transmission interface, and an interface conversion circuit. The interface conversion circuit is connected with the first transmission interface, and converts signal transmission forms of the test signals. The second transmission interface is connected with the interface conversion circuit. Besides, the image capture card is provided for connecting with the second transmission interface, and captures image data from the test signals.