Patents by Inventor Kuang-Jung Li

Kuang-Jung Li has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Apparatus, system and method for testing electronic elements
    Patent number: 8130006
    Abstract: An electronic element testing apparatus for use with a number of probes. Each probe has a lower pole and an upper pole. The apparatus includes: a first plate having a first side and a second side, the first side having an array of lower pole regions disposed thereabout, each lower pole region configured to receive a lower pole of a probe; and a plurality of signal conductor regions disposed proximate the array of lower pole regions, each signal conductor region arranged to provide a non-cable electrical path between a lower pole region and a switching circuit. The switching circuits are operable to sequentially connect each electronic element to a testing circuit via the upper and lower poles.
    Type: Grant
    Filed: January 12, 2010
    Date of Patent: March 6, 2012
    Assignee: Vishay General Semiconductor, inc.
    Inventors: Kuang-Jung Li, Chin-Chen Hsu, Yi-Li Lin, Shyan-I Wu
  • APPARATUS, SYSTEM AND METHOD FOR TESTING ELECTRONIC ELEMENTS
    Publication number: 20100109692
    Abstract: An electronic element testing apparatus for use with a number of probes. Each probe has a lower pole and an upper pole. The apparatus includes: a first plate having a first side and a second side, the first side having an array of lower pole regions disposed thereabout, each lower pole region configured to receive a lower pole of a probe; and a plurality of signal conductor regions disposed proximate the array of lower pole regions, each signal conductor region arranged to provide a non-cable electrical path between a lower pole region and a switching circuit. The switching circuits are operable to sequentially connect each electronic element to a testing circuit via the upper and lower poles.
    Type: Application
    Filed: January 12, 2010
    Publication date: May 6, 2010
    Applicant: VISHAY GENERAL SEMICONDUCTOR, INC.
    Inventors: Kuang-Jung LI, Chin-Chen HSU, Yi-Li Lin, Shyan-I Wu
  • Apparatus, system and method for testing electronic elements
    Patent number: 7671611
    Abstract: An electronic element testing apparatus for use with a number of probes. Each probe has a lower pole and an upper pole. The apparatus includes: a first plate having a first side and a second side, the first side having an array of lower pole regions disposed thereabout, each lower pole region configured to receive a lower pole of a probe; and a plurality of signal conductor regions disposed proximate the array of lower pole regions, each signal conductor region arranged to provide a non-cable electrical path between a lower pole region and a switching circuit. The switching circuits are operable to sequentially connect each electronic element to a testing circuit via the upper and lower poles.
    Type: Grant
    Filed: February 13, 2008
    Date of Patent: March 2, 2010
    Assignee: Vishay General Semiconductor LLC
    Inventors: Kuang-Jung Li, Chin-Chen Hsu, Yi-Li Lin, Shyan-I Wu
  • Apparatus, system and method for testing electronic elements
    Publication number: 20080136431
    Abstract: An electronic element testing apparatus for use with a number of probes. Each probe has a lower pole and an upper pole. The apparatus includes: a first plate having a first side and a second side, the first side having an array of lower pole regions disposed thereabout, each lower pole region configured to receive a lower pole of a probe; and a plurality of signal conductor regions disposed proximate the array of lower pole regions, each signal conductor region arranged to provide a non-cable electrical path between a lower pole region and a switching circuit. The switching circuits are operable to sequentially connect each electronic element to a testing circuit via the upper and lower poles.
    Type: Application
    Filed: February 13, 2008
    Publication date: June 12, 2008
    Applicant: Vishay General Semiconductor, Inc.
    Inventors: Kuang-Jung Li, Chin-Chen Hsu, Yi-Li Lin, Shyan-l Wu
  • Apparatus, system and method for testing electronic elements
    Patent number: 7374293
    Abstract: An electronic element testing apparatus for use with a number of probes. Each probe has a lower pole and an upper pole. The apparatus includes: a first plate having a first side and a second side, the first side having an array of lower pole regions disposed thereabout, each lower pole region configured to receive a lower pole of a probe; and a plurality of signal conductor regions disposed proximate the array of lower pole regions, each signal conductor region arranged to provide a non-cable electrical path between a lower pole region and a switching circuit. The switching circuits are operable to sequentially connect each electronic element to a testing circuit via the upper and lower poles.
    Type: Grant
    Filed: March 25, 2005
    Date of Patent: May 20, 2008
    Assignee: Vishay General Semiconductor Inc.
    Inventors: Kuang-Jung Li, Chin-Chen Hsu, Yi-Li Lin, Shyan-I Wu