Abstract: The present invention provides a flashlight, and more particularly a flashlight with two different color lights and flicker frequencies. The flashlight comprises an anterior main body having a lamp housing, a posterior main body having a battery holder, a connecting base used to connect with the battery holder, and a starter for turning on/off the flashlight. Wherein the lamp housing is primarily configured to include a light-emitting chipset and a lens, and the battery holder is configured to accommodate a battery for supplying power. The light-emitting chipset of the present invention comprises at least two LED light-emitting chips that can generate different color lights, and a flicker frequency difference between said two different color lights is at least about 50 Hz.

Abstract: Semiconductor device metallization systems and methods are disclosed. In some embodiments, a metallization system for semiconductor devices includes a mainframe, and a plurality of modules disposed proximate the mainframe. One of the plurality of modules comprises a physical vapor deposition (PVD) module and one of the plurality of modules comprises an ultraviolet light (UV) cure module.

Abstract: Semiconductor device metallization systems and methods are disclosed. In some embodiments, a metallization system for semiconductor devices includes a mainframe, and a plurality of modules disposed proximate the mainframe. One of the plurality of modules comprises a physical vapor deposition (PVD) module and one of the plurality of modules comprises an ultraviolet light (UV) cure module.

Abstract: Semiconductor device metallization systems and methods are disclosed. In some embodiments, a metallization system for semiconductor devices includes a mainframe, and a plurality of modules disposed proximate the mainframe. One of the plurality of modules comprises a physical vapor deposition (PVD) module and one of the plurality of modules comprises an ultraviolet light (UV) cure module.

Abstract: A device includes a pedestal. The pedestal includes a ground electrode, a central portion, and a peripheral portion. The ground electrode includes a top surface from which the peripheral portion is projected, thereby having a height difference between the central portion and the peripheral portion.

Abstract: Semiconductor device metallization systems and methods are disclosed. In some embodiments, a metallization system for semiconductor devices includes a mainframe, and a plurality of modules disposed proximate the mainframe. One of the plurality of modules comprises a physical vapor deposition (PVD) module and one of the plurality of modules comprises an ultraviolet light (UV) cure module.

Abstract: A flashlight includes a receptacle receiving a processing device and a battery and a light controlling device, the processing device is coupled to the battery and the light controlling device, two light members are coupled to the light controlling device for generating flashlights of different colors, the processing device is coupled to the light members for generating the flashlights, a switch device is coupled to the battery for controlling the processing device to actuate the light members, a control button is coupled to the processing device for operating the light controlling device to operate the light members to generate the flashlights of different colors, and a stick is attachable to the receptacle.

Abstract: Atomic layer deposition (ALD) techniques typically involve briefly exposing the surface of a substrate to a precursor within an atomic layer deposition chamber, and purging the chamber with a purge gas, such as nitrogen, before exposing the substrate to a second precursor. A series of such cycles results in the deposition of microscopically thin film layers on the substrate surface that are further processed to generate a semiconductor component. In order to reduce unintended oxygen deposition, the chamber is typically evacuated to a vacuum level of 10e?06 torr-liters/second, which is suitable for the related techniques of chemical vapor deposition. However, atomic layer deposition is demonstrably more sensitive to oxygen contamination, due to the exposure of each layer to residual oxygen within the chamber. Tighter process control is achievable by performing atomic layer deposition at a higher vacuum level, not exceeding approximately 10e?06 torr-liters/second, in order to reduce oxygen contamination.

Abstract: A flashlight includes a receptacle for receiving a processing device and a battery and a light controlling device, the processing device is coupled to the battery and the light controlling device, two light members are coupled to the light controlling device for generating flashlights of different colors, the processing device is coupled to the light members for generating the flashlights, a switch device is coupled to the battery for controlling the processing device to actuate the light members, a control button is coupled to the processing device for operating the light controlling device to operate the light members to generate the flashlights of different colors, and a stick is attachable to the receptacle for guarding the user from being attacked by an evildoer.

Abstract: A manufacturing apparatus of conductive fiber is provided. The manufacturing apparatus includes a spinning unit, a conductive wire supply unit, and an insulating material supply unit. The spinning unit has at least one spinneret. The spinneret has a wire lead-in portion and a liquid lead-in portion connected with the wire lead-in portion. The liquid lead-in portion has a containing space and a capillary, and the wire lead-in portion is disposed in the containing space. The conductive wire supply unit is connected with the wire lead-in portion to lead a conductive wire through the capillary. The insulating material supply unit is connected with the liquid lead-in portion to supply a liquid insulating material to the containing space. The liquid insulating material is covered on the surface of the conductive wire passing through the capillary.

Abstract: The present invention discloses a testing circuit and method for thin film transistor display array, for testing the yield of thin film transistor array. The testing circuit comprising: An array tester, a test panel (DUT), a sense amplifier array. The sense amplifier is composed by a plurality of trans- impedance amplifier unit and a plurality of parasitic capacitance discharge circuit unit. Every sense amplifier includes: a trans-impedance amplifier, which is implemented by an operational amplifier, two switches and an operation capacitance, the trans-impedance amplifier is used to form an integrated circuit, the output is transmitted to a sampling/hold circuit via a switch; a parasitic capacitance discharge circuit is used to form a discharge rout for the charge of the parasitic capacitance.

Abstract: A direct-view stereoscopic confocal microscope including a light source, an aperture plate, image collector, and first and second vibrators. The light source is used for illuminating a portion of a specimen and the aperture plate is used for passing a portion of the light emanating from the light source onto a portion of the specimen. The image collector is optically coupled to the illuminated portion of the specimen and acts to separate the image created by the illuminated portion of the specimen from the light illuminating the specimen. A first vibrator is coupled to the specimen for vibrating the specimen along a first axis and the second vibrator is coupled to the image collector, and synchronized with said first vibrator, for vibrating the collecting means along a second axis.

Abstract: The assembly (10, 10') is a real time imaging device for detecting radiation from an object field (12) which is periodic in time. A video camera (14) detects emitted and reflected radiation from the object field (12) and produces a video signal of the image and a timing signal. A processor (16) synchronously averages successive video signals and stores same in an image buffer (26) to obtain an image from which has been eliminated unsynchronous noise. Alternatively, the elimination of unsynchronous or ambient noise may be performed partially or wholly within the camera (14) prior to processing.

Abstract: A method for constructing a Nipkow disk using a zone plate disk, comprises the steps of constructing a zone plate disk, including the substep of disposing a plurality of focusing means a long a disk, wherein the plurality of focusing means have a common focal distance; placing a photographic plate at the focal distance of the plurality of focusing means; illuminating the plurality of focusing means with a light source such that the illumination is passed through the plurality of focusing means and focused onto the photographic plate thereby creating an image of a plurality of points of focused illumination; and capturing the image created on the photographic plate and using it to construct the Nipkow disk.

Abstract: The assembly (10) utilizes real-time imaging for detecting radiation from an object field (12) which has a component which is periodic in time. A video camera (14) detects emitted and reflected radiation from the object field (12) and produces a video signal comprising a series of pixels representing a frame of the image. A dynamically averaged offset derived from the original video signal is subtracted from the video signal leaving only information from the time-varying component of the video object field. The resulting signal is digitized by a digitizer (18) contained in a processor (16). The processor (16) averages the successive frames as synchronous images based on the periodicity of the object field (12) to eliminate unsynchronous noise from the image and to display an image synchronous with the periodicity of the object field (12). Because the final video image is a digitization of the amplified difference, the dynamic range of the corrected image is greatly increased.

Abstract: A confocal microscope comprises a focusing lens for focusing a light source onto a pin hole. The use of the lens for this purpose, when used within a confocal microscope apparatus, greatly reduces image artifacts and creates an increased transfer efficiently between the light source and the sample.

Abstract: A single beam interferometer (10) comprises an intensity modulated laser beam (16) having a focus area for heating a test area (18) on the surface of a sample (12) producing a thermal bump (20). An unfocused probe laser beam (30) is directed toward the solid at an angle and has a beam area greater than the focus area of the heating beam (16). The sample (12) has a reflective surface for reflecting the probe beam (30). The reflected beam (31) comprises an AC beam portion (32) refracted by the thermal bump (20) and a DC beam portion (34) reflected off the unheated surface of the sample (12). The interference pattern (36) produced by the reflected beam (31) is detected and processed to obtain optical, elastic and thermal parameters of the sample (12).

Abstract: The assembly (10) is a real-time imaging device for detecting radiation from an object field which is periodic in time. A video camera (14) detects emitted and reflected radiation from the object field (12) and produces a video signal comprising a series of pixels representing a frame of the image. The video signal is digitized (18) and received by a processor (16). The processor (16) averages the successive frames as in-phase images and quadrature images based on the periodicity of the object field to eliminate unsynchronous noise from the image and to display an image synchronous with the periodicity.

Abstract: A thermal wave imaging apparatus generates a real time image of the surface and subsurface of an opaque solid object. A.C. electrical signals indicative of the configuration of the surface and subsurface of the object which are generated during a thermal wave scan of the object by a first heating beam which generates a localized temperature gradient on the object and a deflectable second probe beam heating beam, which deflection is detected by a detection device mounted adjacent to the object, are stored in an image memory under the control of a central processor. A refresh counter generates sequential, incremental signals used to control the X and Y axis deflection of a display monitor. Such signals also address the image memory and generate output data controlling the intensity of the display point at each generated X and Y axis deflection point.

Abstract: A thermal wave imaging apparatus generates a real time image of the surface and subsurface of an opaque solid object. A.C. electrical signals indicative of the configuration of the surface and subsurface of the object which are generated during a thermal wave scan of the object by a first heating beam which generates a localized temperature gradient on the object and a deflectable second probe beam heating beam, which deflection is detected by a detection device mounted adjacent to the object, are stored in an image memory under the control of a central processor. A refresh counter generates sequential, incremental signals used to control the X and Y axis deflection of a display monitor. Such signals also address the image memory and generate output data controlling the intensity of the display point at each generated X and Y axis deflection point.