Patents by Inventor Kuang Pu Wen
Kuang Pu Wen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10841561Abstract: An apparatus for three-dimensional inspection includes a carrier, an image sensing component, and a processor. The carrier is configured to hold an object. The image sensing component is configured to capture a first image, a second image and a third image of the object along a first axis, a second axis, and a third axis respectively, and the first axis, the second axis, and the third axis are not parallel with each other. The processor is configured to analyze the first image and the second image to obtain a first directional stereo information, and analyze the third image and a determined image of the object to obtain a second directional stereo information.Type: GrantFiled: March 24, 2017Date of Patent: November 17, 2020Assignee: Test Research, Inc.Inventors: Wen-Tzong Lee, Kuang-Pu Wen, Don Lin
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Patent number: 10438340Abstract: An automatic optical inspection system includes a first AOI machine and a second AOI machine, and the second AOI machine is electrically connected to the first AOI machine. The first AOI machine is configured to use a first resolution to inspect an object, so as to detect a possible defective region(s) of the object. The second AOI machine is configured to use a second resolution higher than the first resolution of the first AOI machine to inspect within the possible defective region(s) only, so as to detect whether there is/are any defect(s) within the possible defective region(s) of the object.Type: GrantFiled: October 6, 2017Date of Patent: October 8, 2019Assignee: Test Research, Inc.Inventors: Kuang-Pu Wen, Wen-Ming Wu, Chun-Yen Huang
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Publication number: 20180276811Abstract: An automatic optical inspection system includes a first AOI machine and a second AOI machine, and the second AOI machine is electrically connected to the first AOI machine. The first AOI machine is configured to use a first resolution to inspect an object, so as to detect a possible defective region(s) of the object. The second AOI machine is configured to use a second resolution higher than the first resolution of the first AOI machine to inspect within the possible defective region(s) only, so as to detect whether there is/are any defect(s) within the possible defective region(s) of the object.Type: ApplicationFiled: October 6, 2017Publication date: September 27, 2018Inventors: Kuang-Pu WEN, Wen-Ming WU, Chun-Yen HUANG
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Publication number: 20180278911Abstract: An apparatus for three-dimensional inspection includes a carrier, an image sensing component, and a processor. The carrier is configured to hold an object. The image sensing component is configured to capture a first image, a second image and a third image of the object along a first axis, a second axis, and a third axis respectively, and the first axis, the second axis, and the third axis are not parallel with each other. The processor is configured to analyze the first image and the second image to obtain a first directional stereo information, and analyze the third image and a determined image of the object to obtain a second directional stereo information.Type: ApplicationFiled: March 24, 2017Publication date: September 27, 2018Inventors: Wen-Tzong LEE, Kuang-Pu WEN, Don LIN
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Patent number: 9885561Abstract: An optical inspection system includes a first optical module and a second optical module. The first optical module includes a first light source having a first optical axis and a first image capturing unit having a first image capturing axis. The first optical axis and the first image capturing axis are symmetric relative a normal line of an inspection plane. A first angle is formed between the first optical axis and the first image capturing axis. The second optical module includes a second light source having a second optical axis and a second image capturing unit having a second image capturing axis. The second optical axis and the second image capturing axis are symmetric relative to the normal line. A second angle is formed between the second optical axis and the second image capturing axis and is different from the first angle.Type: GrantFiled: December 15, 2014Date of Patent: February 6, 2018Assignee: Test Research, Inc.Inventors: Liang-Pin Yu, Kuang-Pu Wen, Yeong-Feng Wang
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Patent number: 9838612Abstract: An inspecting device for inspecting an inspection target is provided. The inspecting device includes a mono-color image-retrieving module, illuminating modules and a control module. The mono-color image-retrieving module is disposed above the inspection target with an optical axis orienting toward the inspection target. Each of the illuminating modules includes light-emitting elements of different colors. The control module controls the illuminating modules to sequentially generate illuminating lights both in an order of different colors and different incident angles to further control the mono-color image-retrieving module to sequentially retrieve mono-color images each in response to one illumination of the illuminating lights. The control module performs an inspection of the inspection target based on the mono-color images.Type: GrantFiled: July 13, 2015Date of Patent: December 5, 2017Assignee: Test Research, Inc.Inventors: Yeong-Feng Wang, Kuang-Pu Wen
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Publication number: 20170019578Abstract: An inspecting device for inspecting an inspection target is provided. The inspecting device includes a mono-color image-retrieving module, illuminating modules and a control module. The mono-color image-retrieving module is disposed above the inspection target with an optical axis orienting toward the inspection target. Each of the illuminating modules includes light-emitting elements of different colors. The control module controls the illuminating modules to sequentially generate illuminating lights both in an order of different colors and different incident angles to further control the mono-color image-retrieving module to sequentially retrieve mono-color images each in response to one illumination of the illuminating lights. The control module performs an inspection of the inspection target based on the mono-color images.Type: ApplicationFiled: July 13, 2015Publication date: January 19, 2017Inventors: Yeong-Feng WANG, Kuang-Pu WEN
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Patent number: 9420235Abstract: A measuring system for a 3D object includes a base, a horizontal scanning device disposed on the base, a first light emitting device, a second light emitting device, an image capture device, and a control device. The first light emitting device, the second light emitting device, and the image capture device are connected to the horizontal scanning device. The control device controls the horizontal scanning device to cause planar motion relative to the base. With the control of the control device, the first light emitting device and the second light emitting device alternate in projecting a light source onto a 3D object. The image capture device includes a double-sided telecentric lens to capture a plurality of images of the 3D object when the light source is projected onto the 3D object.Type: GrantFiled: October 4, 2010Date of Patent: August 16, 2016Assignee: Test Research, Inc.Inventors: Kuang-Pu Wen, Don Lin, Liang-Pin Yu
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Publication number: 20160169812Abstract: An optical inspection system includes a first optical module and a second optical module. The first optical module includes a first light source having a first optical axis and a first image capturing unit having a first image capturing axis. The first optical axis and the first image capturing axis are symmetric relative a normal line of an inspection plane. A first angle is formed between the first optical axis and the first image capturing axis. The second optical module includes a second light source having a second optical axis and a second image capturing unit having a second image capturing axis. The second optical axis and the second image capturing axis are symmetric relative to the normal line. A second angle is formed between the second optical axis and the second image capturing axis and is different from the first angle.Type: ApplicationFiled: December 15, 2014Publication date: June 16, 2016Inventors: Liang-Pin YU, Kuang-Pu WEN, Yeong-Feng WANG
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Patent number: 9019351Abstract: A three-dimensional image measuring apparatus includes a measurement platform, a movable optical head, a three-dimensional calculator module, a moving module and a calibration controlling module. The movable optical head includes a beam splitter unit, a projecting module, an image-capturing module and an indicator module. The measurement platform supports an object under measurement. The projecting module generates a structure light of parallel sinusoid strips pattern to the object under measurement. The image-capturing module includes image-capturing units facing the object under measurement from different directions or angles. Each image-capturing unit is configured to capture a reflection image which is formed from the structure light of parallel sinusoid strips pattern reflected by the object under measurement. The indicator module projects an alignment beam onto the object under measurement for forming an alignment mark.Type: GrantFiled: November 28, 2012Date of Patent: April 28, 2015Assignee: Test Research Inc.Inventors: Liang-Pin Yu, Don Lin, Kuang-Pu Wen
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Publication number: 20140022357Abstract: A three-dimensional image measuring apparatus includes a measurement platform, a movable optical head, a three-dimensional calculator module, a moving module and a calibration controlling module. The movable optical head includes a beam splitter unit, a projecting module, an image-capturing module and an indicator module. The measurement platform supports an object under measurement. The projecting module generates a structure light of parallel sinusoid strips pattern to the object under measurement. The image-capturing module includes image-capturing units facing the object under measurement from different directions or angles. Each image-capturing unit is configured to capture a reflection image which is formed from the structure light of parallel sinusoid strips pattern reflected by the object under measurement. The indicator module projects an alignment beam onto the object under measurement for forming an alignment mark.Type: ApplicationFiled: November 28, 2012Publication date: January 23, 2014Applicant: Test Research, Inc.Inventors: Liang-Pin YU, Don LIN, Kuang-Pu WEN
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Publication number: 20110228082Abstract: A measuring system for a 3D object is disclosed. The system comprises a base, a horizontal scanning device disposed on the base, a first light emitting device, a second light emitting device, an image capture device, and a control device. The first light emitting device, the second light emitting device, and the image capture device are connected to the horizontal scanning device. The control device controls the horizontal scanning device to cause planar motion relative to the base. With the control of the control device, the first light emitting device and the second light emitting device alternate in projecting a light source onto a 3D object. The image capture device comprises a double-sided telecentric lens to capture a plurality of images of the 3D object when the light source is projected onto the 3D object.Type: ApplicationFiled: October 4, 2010Publication date: September 22, 2011Inventors: Kuang-Pu Wen, Don Lin, Liang-Pin Yu
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Patent number: 7529336Abstract: A laminography inspection system comprises an irradiation source, a plurality of linear image detectors defining an image plane, a fixed table for placement of a test object in a stationary position between the irradiation source and the image detectors, and a computing device for processing a plurality of images of the test object acquired from the image detectors. The irradiation source and the image detectors perform a plurality of parallel linear scanning passes across the area of the test object to acquire images of the test object under different viewing angles. Based on the acquired image data, the computing device determines a warp compensation and generates a cross-sectional image of a selected section within the test object.Type: GrantFiled: May 31, 2007Date of Patent: May 5, 2009Assignee: Test Research, Inc.Inventors: Kuang Pu Wen, Shih-Liang Chen, Meng Kun Lee
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Publication number: 20080298538Abstract: A laminography inspection system comprises an irradiation source, a plurality of linear image detectors defining an image plane, a fixed table for placement of a test object in a stationary position between the irradiation source and the image detectors, and a computing device for processing a plurality of images of the test object acquired from the image detectors. The irradiation source and the image detectors perform a plurality of parallel linear scanning passes across the area of the test object to acquire images of the test object under different viewing angles. Based on the acquired image data, the computing device determines a warp compensation and generates a cross-sectional image of a selected section within the test object.Type: ApplicationFiled: May 31, 2007Publication date: December 4, 2008Applicant: Test Research, Inc.Inventors: Kuang Pu Wen, Shih-Liang Chen, Meng Kun Lee
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Patent number: 4893506Abstract: An apparatus and method for estimating rainfall. A rainfall sensing device is used to generate rain signal Vo; when it is raining (Vo=1), a number of consecutive sampled rain signals are picked up within a given period of time. The conditions (shower, heavy rain, light rain or no rain) of rainfall are estimated by comparing the sampled rain signals to predetermined raining index N1 and no-rain index N2. The rainfall sensing device comprises a Wheatstone bridge circuit and a differential amplifier. The two adjacent branches of the Wheatstone bridge circuit are provided with a thermal resistor as a rain-sensor and a thermal resistor as a temperature compensating element respectively.Type: GrantFiled: July 14, 1988Date of Patent: January 16, 1990Assignee: Industrial Technology Research InstituteInventors: Jia Ming Shyu, Kuang Pu Wen, Joseph Huang