Patents by Inventor Kuk-won Ko
Kuk-won Ko has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 9562763Abstract: An apparatus for inspecting curvature, including: a radiation unit radiating a plurality of rays of light having different focal lengths onto a surface of an target material; and an inspection unit inspecting the surface of the target material using the rays of light reflected from the target material. The apparatus can inspect the curvature or the bending of the surface of a target material at a high speed and with high accuracy.Type: GrantFiled: October 29, 2014Date of Patent: February 7, 2017Assignee: Sunmoon University Industry—University CooperationInventor: Kuk Won Ko
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Patent number: 9482624Abstract: The present invention relates to an inspection apparatus, the inspection apparatus including a projection unit configured to project a plurality of lights, each having a different focal length relative to a surface of an inspection object, and an inspection unit configured to inspect a surface of an inspection object using the light reflected from the inspection object, wherein the projection unit is provided with a plurality of lenses configured to project the lights, and curvature of each lens is different, and the focal length is different due to the difference of the curvature, whereby the curve on a surface of the inspection object can be reliably measured.Type: GrantFiled: October 29, 2014Date of Patent: November 1, 2016Assignee: Sunmoon University Industry-University CooperationInventor: Kuk Won Ko
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Publication number: 20160124124Abstract: The present invention relates to an optic apparatus, the optic apparatus including an optical pattern unit configured to output an optical pattern, and a conversion unit configured to reduce and output the optical pattern by receiving the optical pattern. The present invention relates to an optic apparatus, the optic apparatus including an optical pattern unit configured to align a plurality of lenses in parallel on a same line perpendicular to an optical path, and an optical conversion unit configured to include a plurality of optical fibers, each optical fiber being different in an area of cross-section at both distal ends, whereby the size of lenses is greater than that of a conventional lens to enable obtainment of greater quantity of light over that of a conventional MLA, and it is easier to align a pinhole positioned at a focus of a lens.Type: ApplicationFiled: October 29, 2014Publication date: May 5, 2016Applicant: SUNMOON UNIVERSITY INDUSTRY-UNIVERSITY COOPERATIONInventor: Kuk Won KO
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Publication number: 20160123896Abstract: An apparatus for inspecting curvature, including: a radiation unit radiating a plurality of rays of light having different focal lengths onto a surface of an target material; and an inspection unit inspecting the surface of the target material using the rays of light reflected from the target material. The apparatus can inspect the curvature or the bending of the surface of a target material at a high speed and with high accuracy.Type: ApplicationFiled: October 29, 2014Publication date: May 5, 2016Applicant: Sunmoon University Industry-University CooperationInventor: Kuk Won KO
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Publication number: 20160123891Abstract: The present invention relates to an inspection apparatus, the inspection apparatus including a projection unit configured to project a plurality of lights, each having a different focal length relative to a surface of an inspection object, and an inspection unit configured to inspect a surface of an inspection object using the light reflected from the inspection object, wherein the projection unit is provided with a plurality of lenses configured to project the lights, and curvature of each lens is different, and the focal length is different due to the difference of the curvature, whereby the curve on a surface of the inspection object can be reliably measured.Type: ApplicationFiled: October 29, 2014Publication date: May 5, 2016Applicant: Sunmoon University Industry-University CooperationInventor: Kuk Won KO
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Publication number: 20150244913Abstract: A test device in which a detector unit has a movable camera taking images of an object. The detector unit can obtain the position of the camera and acquire the position of the object based on the position of the camera.Type: ApplicationFiled: November 28, 2014Publication date: August 27, 2015Applicant: SUNMOON UNIVERSITY Industry-University CooperationInventor: Kuk Won KO
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Patent number: 8009298Abstract: Disclosed herein is a method of acquiring a reference grating of a three-dimensional measurement system using moiré, wherein the three-dimensional measurement system includes a light source, a projection grating, a grating actuator and a camera, and analyzes the moiré pattern acquired through the camera to measure the shape of the object. The method includes the steps of acquiring an initial reference grating using the light source and the projection grating, confirming whether or not the acquired initial reference grating includes noise through a noise detector, and moving the projection grating through the grating actuator to acquire the next reference grating when the initial reference grating does not include noise and correcting the reference grating when the reference grating includes noise. The method can remove the noise included in the reference grating to improve the accuracy of measurement of an object.Type: GrantFiled: February 18, 2009Date of Patent: August 30, 2011Assignees: Industry-University Cooperation Foundation Sunmoon UniversityInventors: Kuk-Won Ko, Yu-Hyun Moon
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Patent number: 7859683Abstract: Disclosed herein is an apparatus for measuring the shape of a 3D object using an interferometer. The apparatus includes a light source unit, a beam splitter, a reference mirror, an actuator, an image pickup device, and a control unit. The light source unit emits light. The beam splitter divides the light from the light source unit. The reference mirror reflects light as a reference beam. The actuator moves the reference mirror. The image pickup device acquires a plurality of interference patterns by causing the reflected beam and the reference beam to interfere with each other. The control unit measures the shape of the object from the acquired interference patterns, outputs reference mirror drive signals to the actuator, and issues an image capture command at the end of image capture time that is shorter than settling time.Type: GrantFiled: February 18, 2009Date of Patent: December 28, 2010Assignee: Industry-University Cooperation Foundation Sunmoon UniversityInventors: Kuk-Won Ko, Young-Chul Kwon
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Publication number: 20090279102Abstract: Disclosed herein is a method of acquiring a reference grating of a three-dimensional measurement system using moiré, wherein the three-dimensional measurement system includes a light source, a projection grating, a grating actuator and a camera, and analyzes the moiré pattern acquired through the camera to measure the shape of the object. The method includes the steps of acquiring an initial reference grating using the light source and the projection grating, confirming whether or not the acquired initial reference grating includes noise through a noise detector, and moving the projection grating through the grating actuator to acquire the next reference grating when the initial reference grating does not include noise and correcting the reference grating when the reference grating includes noise. The method can remove the noise included in the reference grating to improve the accuracy of measurement of an object.Type: ApplicationFiled: February 18, 2009Publication date: November 12, 2009Inventors: Kuk-Won Ko, Yu-Hyun Moon
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Publication number: 20090278965Abstract: Disclosed herein is a high-speed photographing apparatus comprising a first camera for acquiring an image of an object, a second camera for acquiring the same image as the image acquired by the first camera, reflection means for reflecting the image of the object so that the first camera and the second camera obtain the same image with respect to the object, a controller for alternately providing a photographing signal to the first camera and the second camera at a speed higher than intrinsic photographing speeds of the first camera and the second camera such that the first camera and the second camera alternately capture images of the object, and an image synthesis section for synthesizing the alternately captured images.Type: ApplicationFiled: February 18, 2009Publication date: November 12, 2009Inventor: Kuk-Won Ko
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Publication number: 20090268212Abstract: Disclosed herein is a moiré shape measurement apparatus using a Liquid Crystal Display (LCD) panel. The moiré shape measurement apparatus includes a light source, a variable grating, a viewing lens, a light receiving unit, a computation unit, and a driving device. The light source emits light. The variable grating passes the emitted light therethrough, and creates a projection grating pattern. The viewing lens focuses a reflected grating pattern that is obtained when the projection grating pattern is reflected from the object. The light receiving unit receives the light of the reflected grating pattern passed through the viewing lens. The computation unit previously stores the viewing grating pattern, forms the moiré pattern by overlaying the reflected grating pattern, received from the light receiving unit, on the stored viewing grating pattern, and computes the shape of the object using the moiré pattern. The driving device adjusts a direction and a pitch in order to form a grating of the variable grating.Type: ApplicationFiled: February 18, 2009Publication date: October 29, 2009Inventors: Kuk-Won Ko, Kyoung-Chul Koh
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Publication number: 20090251708Abstract: Disclosed herein is an apparatus for measuring the shape of a 3D object using an interferometer. The apparatus includes a light source unit, a beam splitter, a reference mirror, an actuator, an image pickup device, and a control unit. The light source unit emits light. The beam splitter divides the light from the light source unit. The reference mirror reflects light as a reference beam. The actuator moves the reference mirror. The image pickup device acquires a plurality of interference patterns by causing the reflected beam and the reference beam to interfere with each other. The control unit measures the shape of the object from the acquired interference patterns, outputs reference mirror drive signals to the actuator, and issues an image capture command at the end of image capture time that is shorter than settling time.Type: ApplicationFiled: February 18, 2009Publication date: October 8, 2009Inventors: Kuk-Won Ko, Young-Chul Kwon
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Patent number: 6459092Abstract: A 6 degree-of-freedom (DOF) motion measuring apparatus using a multidirectional reflector, and a swing arm type optical system using the 6-DOF motion measuring apparatus to measure the 6-DOF motion of a slider in a hard disc drive (HDD) are provided. The 6-DOF motion measuring apparatus includes: a multidirectional reflector having at least three reflecting sides by which the laser beam is slit and reflected in three directions, the multidirectional reflector being provided to the object whose motion is to be measured; three position-sensitive detectors for receiving three sub-laser beams reflected from the multidirectional reflector; and a controller for calculating the 6-DOF motion of the multidirectional reflector using the intensity distributions of the three sub-laser beams received by the three position sensitive detectors assuming that the laser beam before reflection has a Gaussian intensity distribution.Type: GrantFiled: May 9, 2001Date of Patent: October 1, 2002Assignees: Korean Advanced Institute of Science & Technology, Samsung Electronics Co., Ltd.Inventors: Hyung-suck Cho, Won-shik Park, Kuk-won Ko, Noh-yeol Park, Yong-kyu Byun
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Publication number: 20020011576Abstract: A 6 degree-of-freedom (DOF) motion measuring apparatus using a multidirectional reflector, and a swing arm type optical system using the 6-DOF motion measuring apparatus to measure the 6-DOF motion of a slider in a hard disc drive (HDD) are provided. The 6-DOF motion measuring apparatus includes: a multidirectional reflector having at least three reflecting sides by which the laser beam is slit and reflected in three directions, the multidirectional reflector being provided to the object whose motion is to be measured; three position-sensitive detectors for receiving three sub-laser beams reflected from the multidirectional reflector; and a controller for calculating the 6-DOF motion of the multidirectional reflector using the intensity distributions of the three sub-laser beams received by the three position sensitive detectors assuming that the laser beam before reflection has a Gaussian intensity distribution.Type: ApplicationFiled: May 9, 2001Publication date: January 31, 2002Inventors: Hyung-suck Cho, Won-shik Park, Kuk-won Ko, Noh-yeol Park, Yong-kyu Byun
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Patent number: 6222903Abstract: A laminography system includes a table, an X-ray source, an image intensifier, a view selector and a camera. The view selector has a prism for refracting a ray of light, and an adjusting part for adjusting the prism to a position in which images at a certain area of an image projecting plane of the image intensifier are received into the camera. The adjusting part has a first motor for rotating the prism along the circumferential direction of the image intensifier, and a second motor for rotating the prism in a direction perpendicular with respect to a radial direction of the image intensifier. Accordingly, the images at any areas of the image projecting plane of the image intensifier can be obtained. In addition, since an optical axis of the image passing through the prism and then received into the camera is in perpendicular relation with the camera, no image distortions occur.Type: GrantFiled: March 3, 1999Date of Patent: April 24, 2001Assignee: Samsung Electronics Co., Ltd.Inventors: Hyeong-cheol Kim, Jong-eun Byun, Jin-young Kim, Chang-hyo Kim, Hyung Seok Cho, Kuk-won Ko, Young-jun Roh