Patents by Inventor Kumar Apurva

Kumar Apurva has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230409906
    Abstract: Methods and systems for using machine learning to identify extremely rare events in high-dimensional space are disclosed. A method includes: identifying, by a computing device, a plurality of derived attributes using an external data source; selecting, by the computing device, a plurality of key performance indicators from the plurality of derived attributes using a neural network and based on an extremely rare event being modeled; constructing, by the computing device, a linear model using the plurality of key performance indicators; and predicting, by the computing device, occurrences of the extremely rare event using the linear model.
    Type: Application
    Filed: September 6, 2023
    Publication date: December 21, 2023
    Inventors: Sanket Jain, Kumar Apurva, Vikram Yadav
  • Patent number: 11797840
    Abstract: Methods and systems for using machine learning to identify extremely rare events in high-dimensional space are disclosed. A method includes: identifying, by a computing device, a plurality of derived attributes using an external data source; selecting, by the computing device, a plurality of key performance indicators from the plurality of derived attributes using a neural network and based on an extremely rare event being modeled; constructing, by the computing device, a linear model using the plurality of key performance indicators; and predicting, by the computing device, occurrences of the extremely rare event using the linear model.
    Type: Grant
    Filed: November 28, 2018
    Date of Patent: October 24, 2023
    Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Sanket Jain, Kumar Apurva, Vikram Yadav
  • Publication number: 20200167634
    Abstract: Methods and systems for using machine learning to identify extremely rare events in high-dimensional space are disclosed. A method includes: identifying, by a computing device, a plurality of derived attributes using an external data source; selecting, by the computing device, a plurality of key performance indicators from the plurality of derived attributes using a neural network and based on an extremely rare event being modeled; constructing, by the computing device, a linear model using the plurality of key performance indicators; and predicting, by the computing device, occurrences of the extremely rare event using the linear model.
    Type: Application
    Filed: November 28, 2018
    Publication date: May 28, 2020
    Inventors: Sanket Jain, Kumar Apurva, Vikram Yadav