Patents by Inventor Kumar Raja
Kumar Raja has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240152063Abstract: Systems for maintaining light sources for semiconductor photolithography in which a module making up part of the light source is evaluated at various pulse counts to produce a binary prediction as to whether the module is sufficiently likely to operate without failure in an ensuing sequence of pulses. The binary prediction may be made by a machine learning model trained on metrics extracted from measurements taken on deinstalled modules. A group of models, each trained differently, can be made available according to a selection made by the user or according to the maintenance objectives of the user.Type: ApplicationFiled: February 24, 2022Publication date: May 9, 2024Inventors: Russell Allen Burdt, Kumar Raja Guvindan Raju, Matthew Minakais, David Wesley Manley
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Publication number: 20230418740Abstract: During a garbage collection process of a data storage device, superblocks may be filled with dummy data, which may decrease device performance. Embodiments described herein provide systems, methods, and computer readable media for varying a size of a superblock to reduce or eliminate dummy data in a data storage device including a plurality of superblocks. Each of the plurality of superblocks including a plurality of die blocks.Type: ApplicationFiled: June 23, 2022Publication date: December 28, 2023Inventors: Avinash Muthya Narahari, Sampath Kumar Raja Murthy, Aakar Deora
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Patent number: 11853203Abstract: During a garbage collection process of a data storage device, superblocks may be filled with dummy data, which may decrease device performance. Embodiments described herein provide systems, methods, and computer readable media for varying a size of a superblock to reduce or eliminate dummy data in a data storage device including a plurality of superblocks. Each of the plurality of superblocks including a plurality of die blocks.Type: GrantFiled: June 23, 2022Date of Patent: December 26, 2023Assignee: Western Digital Technologies, Inc.Inventors: Avinash Muthya Narahari, Sampath Kumar Raja Murthy, Aakar Deora
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Patent number: 11647917Abstract: A subject support (14) is configured to dock with a medical imaging device (50) with a fixed spatial relationship between the docked subject support and the medical imaging device. A patient positioning device includes a range camera (10) that acquires a two-dimensional (2D) range image of a human imaging subject (12) disposed on a subject support (14). The range image has pixel values corresponding to distances from the range camera. An electronic processor (16) is programmed to perform a positioning method to determine a reference point on or in the human subject in a frame of reference (FS) of the subject support from the 2D range image. This reference point is translated to a frame of reference (FD) of the imaging device based on a priori known spatial relationship of the medical imaging device and the docked subject support. Using 3D models, the loading process may be simulated.Type: GrantFiled: October 12, 2017Date of Patent: May 16, 2023Assignee: Koninklijke Philips N.V.Inventors: Sivaramakrishnan Krishnaiyer Raman, Girish Bogadi Eswara Prasad, Kumar Raja Gattamaneni, Girish Kumar Chegu, Prashanth Honnemaradahalli Shivamurthy
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Patent number: 11298567Abstract: It is an object of the invention to improve quality assurance when using MRI images for radiotherapy treatment planning. This object is achieved by a treatment plan evaluation tool A configured for calculating a quality indicator for a radiotherapy treatment plan. The radiotherapy treatment plan originates from a planning image, wherein the planning image is an MRI image acquired under a presence of a main magnetic field having a magnetic field inhomogeneity. The treatment plan evaluation tool is further configured to receive information about the magnetic field inhomogeneity and the treatment plan evaluation tool is further configured to calculate the quality indicator based on the information about the magnetic field homogeneity.Type: GrantFiled: April 17, 2017Date of Patent: April 12, 2022Assignee: KONINKLIJKE PHILIPS N.V.Inventors: Erkki Tapani Vahala, Lizette Warner, Kumar Raja Gattamaneni
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Patent number: 11085433Abstract: A diaphragm pump has at least one pump chamber, the pump chamber being connected to an inlet chamber via an inlet valve and to an outlet chamber via an outlet valve. The inlet valve has an inlet opening which can be closed by an inlet valve body, and the outlet valve has an outlet opening which can be closed by an outlet valve body. The outlet opening surrounds the inlet opening, or the inlet opening surrounds the outlet opening.Type: GrantFiled: November 8, 2017Date of Patent: August 10, 2021Assignee: PSG Germany GmbHInventors: Matthias Abel, Daniel Gisbertz, Andreas Frerix, Praveen Chandrashekaraiah, Gokilnathan Vasudevan, Vasantha Kumar Raja
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Publication number: 20210194202Abstract: A light source apparatus includes a gas discharge stage including a three-dimensional body defining a cavity that is configured to interact with an energy source, the body including at least two ports that are transmissive to a light beam having a wavelength in the ultraviolet range; a sensor system comprising a plurality of sensors, each sensor is configured to measure a physical aspect of a respective distinct region of the body of the gas discharge stage relative to that sensor; and a control apparatus in communication with the sensor system. The control apparatus is configured to analyze the measured physical aspects from the sensors to thereby determine a position of the body of the gas discharge stage in an XYZ coordinate system defined by an X axis, wherein the X axis is defined by the geometry of the gas discharge stage.Type: ApplicationFiled: August 15, 2019Publication date: June 24, 2021Inventors: Andrei Dorobantu, Jacob Arthur Cohen, Kumar Raja Guvindan Raju, Walter Dale Gillespie, Eric Shaun Gross, Richard Carl Ujazdowski
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Patent number: 10974070Abstract: It is an object of the invention to improve the radiotherapy workflow. This object is achieved by a medical product configured to be used for image based radiotherapy planning. The medical product is configured to be connected to: —a medical imaging system configured for acquiring medical images of a patient; —a contour module configured for segmenting one or more contours based on one or more of the medical images and; —a treatment planning system configured for calculating a radiotherapy plan based on the one or more contours. The medical product comprises a user interface configured to receive user input on a treatment target in the patient and to receive user input on a treatment technique.Type: GrantFiled: August 11, 2017Date of Patent: April 13, 2021Assignee: KONINKLIJKE PHILIPS N.V.Inventors: Erkki Tapani Vahala, Kumar Raja Gattamaneni
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Publication number: 20200178839Abstract: A subject support (14) is configured to dock with a medical imaging device (50) with a fixed spatial relationship between the docked subject support and the medical imaging device. A patient positioning device includes a range camera (10) that acquires a two-dimensional (2D) range image of a human imaging subject (12) disposed on a subject support (14). The range image has pixel values corresponding to distances from the range camera. An electronic processor (16) is programmed to perform a positioning method to determine a reference point on or in the human subject in a frame of reference (FS) of the subject support from the 2D range image. This reference point is translated to a frame of reference (FD) of the imaging device based on a priori known spatial relationship of the medical imaging device and the docked subject support. Using 3D models, the loading process may be simulated.Type: ApplicationFiled: October 12, 2017Publication date: June 11, 2020Inventors: SIVARAMAKRISHNAN KRISHNAIYER RAMAN, Girish Bogadi Eswara PRASAD, Kumar Raja GATTAMANENI, Girish Kumar CHEGU, Prashanth HONNEMARADAHALLI SHIVAMURTHY
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Patent number: 10558946Abstract: According to an example of the present disclosure, a system is disclosed. The system comprises at least one sensing unit and a robotics engine in communication with the at least one sensing unit. The at least one sensing unit detects stock information associated with an item. The robotics engine performs a trend analysis based on the stock information collected over a predefined duration of time, and determines a threshold value based on the trend analysis. Furthermore, the robotics engine generates an alert when the stock information is below the threshold value, and selects a vendor based on one or more predefined parameters. The robotics engine also generates an instruction to obtain the replacement item from the selected vendor for replenishing the item in an inventory.Type: GrantFiled: May 19, 2017Date of Patent: February 11, 2020Assignee: ACCENTURE GLOBAL SOLUTIONS LIMITEDInventors: Paul Sundar Singh, Siva Kumar Raja Ramanathan, Deepa Rajendran
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Publication number: 20190209862Abstract: It is an object of the invention to improve the radiotherapy workflow. This object is achieved by a medical product configured to be used for image based radiotherapy planning. The medical product is configured to be connected to:—a medical imaging system configured for acquiring medical images of a patient;—a contour module configured for segmenting one or more contours based on one or more of the medical images and;—a treatment planning system configured for calculating a radiotherapy plan based on the one or more contours. The medical product comprises a user interface configured to receive user input on a treatment target in the patient and to receive user input on a treatment technique.Type: ApplicationFiled: August 11, 2017Publication date: July 11, 2019Inventors: ERKKI TAPANI VAHALA, KUMAR RAJA GATTAMANENI
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Publication number: 20190126072Abstract: It is an object of the invention to improve quality assurance when using MRI images for radiotherapy treatment planning. This object is achieved by a treatment plan evaluation tool A configured for calculating a quality indicator for a radiotherapy treatment plan. The radiotherapy treatment plan originates from a planning image, wherein the planning image is an MRI image acquired under a presence of a main magnetic field having a magnetic field inhomogeneity. The treatment plan evaluation tool is further configured to receive information about the magnetic field inhomogeneity and the treatment plan evaluation tool is further configured to calculate the quality indicator based on the information about the magnetic field homogeneity.Type: ApplicationFiled: April 17, 2017Publication date: May 2, 2019Inventors: ERKKI TAPANI VAHALA, LIZETTE WARNER, KUMAR RAJA GATTAMANENI
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Publication number: 20180260779Abstract: According to an example of the present disclosure, a system is disclosed. The system comprises at least one sensing unit and a robotics engine in communication with the at least one sensing unit. The at least one sensing unit detects stock information associated with an item. The robotics engine performs a trend analysis based on the stock information collected over a predefined duration of time, and determines a threshold value based on the trend analysis. Furthermore, the robotics engine generates an alert when the stock information is below the threshold value, and selects a vendor based on one or more predefined parameters. The robotics engine also generates an instruction to obtain the replacement item from the selected vendor for replenishing the item in an inventory.Type: ApplicationFiled: May 19, 2017Publication date: September 13, 2018Applicant: ACCENTURE GLOBAL SOLUTIONS LIMITEDInventors: Paul Sundar SINGH, Siva Kumar Raja RAMANATHAN, Deepa RAJENDRAN
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Patent number: 10062543Abstract: Methods and systems for determining overlay error between different patterned features of a design printed on a wafer in a multi-patterning step process are provided. For multi-patterning step designs, the design for a first patterning step is used as a reference and designs for each of the remaining patterning steps are synthetically shifted until the synthetically shifted designs have the best global alignment with the entire image based on global image-to-design alignment. The final synthetic shift of each design for each patterning step relative to the design for the first patterning step provides a measurement of relative overlay error between any two features printed on the wafer using multi-patterning technology.Type: GrantFiled: June 1, 2016Date of Patent: August 28, 2018Assignee: KLA-Tencor Corp.Inventors: Ajay Gupta, Thanh Huy Ha, Olivier Moreau, Kumar Raja
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Publication number: 20180142684Abstract: A diaphragm pump has at least one pump chamber, the pump chamber being connected to an inlet chamber via an inlet valve and to an outlet chamber via an outlet valve. The inlet valve has an inlet opening which can be closed by an inlet valve body, and the outlet valve has an outlet opening which can be closed by an outlet valve body. The outlet opening surrounds the inlet opening, or the inlet opening surrounds the outlet opening.Type: ApplicationFiled: November 8, 2017Publication date: May 24, 2018Inventors: Matthias ABEL, Daniel GISBERTZ, Andreas FRERIX, Praveen CHANDRASHEKARAIAH, Gokilnathan VASUDEVAN, Vasantha Kumar RAJA
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Publication number: 20160377425Abstract: Methods and systems for determining overlay error between different patterned features of a design printed on a wafer in a multi-patterning step process are provided. For multi-patterning step designs, the design for a first patterning step is used as a reference and designs for each of the remaining patterning steps are synthetically shifted until the synthetically shifted designs have the best global alignment with the entire image based on global image-to-design alignment. The final synthetic shift of each design for each patterning step relative to the design for the first patterning step provides a measurement of relative overlay error between any two features printed on the wafer using multi-patterning technology.Type: ApplicationFiled: June 1, 2016Publication date: December 29, 2016Inventors: Ajay Gupta, Thanh Huy Ha, Olivier Moreau, Kumar Raja
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Patent number: 9449788Abstract: One embodiment relates to an electron beam apparatus for inspection and/or review. An electron source generates a primary electron beam, and an electron-optics system shapes and focuses said primary electron beam onto a sample held by a stage. A detection system detects signal-carrying electrons including secondary electrons and back-scattered electrons from said sample, and an image processing system processes data from said detection system. A host computer system that controls and coordinates operations of the electron-optics system, the detection system, and the image processing system. A graphical user interface shows a parameter space and provides for user selection and activation of operating parameters of the apparatus. Another embodiment relates to a method for detecting and/or reviewing defects using an electron beam apparatus. Other embodiments, aspects and features are also disclosed.Type: GrantFiled: June 10, 2014Date of Patent: September 20, 2016Assignee: KLA-Tencor CorporationInventors: Gary G. Fan, Kumar Raja Guvindan Raju, Wade Lenn Jensen, Hong Xiao, Lorraine Ellen Young
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Publication number: 20150090877Abstract: One embodiment relates to an electron beam apparatus for inspection and/or review. An electron source generates a primary electron beam, and an electron-optics system shapes and focuses said primary electron beam onto a sample held by a stage. A detection system detects signal-carrying electrons including secondary electrons and back-scattered electrons from said sample, and an image processing system processes data from said detection system. A host computer system that controls and coordinates operations of the electron-optics system, the detection system, and the image processing system. A graphical user interface shows a parameter space and provides for user selection and activation of operating parameters of the apparatus. Another embodiment relates to a method for detecting and/or reviewing defects using an electron beam apparatus. Other embodiments, aspects and features are also disclosed.Type: ApplicationFiled: June 10, 2014Publication date: April 2, 2015Applicant: KLA-TENCOR CORPORATIONInventors: Gary G. FAN, Kumar Raja GUVINDAN RAJU, Wade Lenn JENSEN, Hong XIAO, Lorraine Ellen YOUNG
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Patent number: 8230327Abstract: A system which enables an administrator to conveniently specify statements of a web page description which may require additional processing. The administrator may select from a list of statement types, and a language grammar corresponding to the selected statement type is displayed. The administrator may provide variable data associated with the fields of the displayed language grammar, and a rule instance is created from the language grammar and the variable data. An intermediate server may determine whether each statement of a web page description matches any of the rule instances. If a match is detected, the corresponding statement is determined to potentially require additional processing (such as modification of a URL in a reverse proxy server).Type: GrantFiled: March 3, 2003Date of Patent: July 24, 2012Assignee: Oracle America, Inc.Inventors: Nagendra Kumar Raja, Thomas R. Mueller, Sanjib Ghosh
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Patent number: 7409439Abstract: An approach which enables the overhead of performing a task associated with performing a procedure (function) call to be shifted to clients from a reverse proxy server when the reverse proxy server forwards web pages, the content of which may be dynamically created on the clients according to a description (e.g., using Java Script Language). The reverse proxy server may include instructions associated with the description to re-define the procedure call such that the task (in addition to the logic of the pre-defined procedure call) is performed on the clients. For example, with reference to a procedure call containing a URL accessible only within an intranet, the reverse proxy server may insert instructions which cause each client to insert the URL of the reverse proxy server such that any requests for a resource (corresponding to the URL) are passed through the reverse proxy server.Type: GrantFiled: December 9, 2002Date of Patent: August 5, 2008Assignee: Sun Microsystems Inc.Inventors: Nagendra Kumar Raja, Lakshmanan Aruunachalam