Abstract: An atomic force microscope (AFM) system capable of imaging multiple physical properties of a sample material at the nanoscale level. The system provides an apparatus and method for imaging physical properties using an electromagnetic coil placed under the sample. Excitation of the coil creates currents in the sample, which may be used to image a topography of the sample, a physical property of the sample, or both.

Abstract: A non-contact near field high resolution acoustic imaging system of a sample, the system including an acoustic wave generator generating a plurality of acoustic waves a ultrasonic horn amplifying the waves to an amplitude of between about 20 microns and about 300 microns, and a frequency between about 20 kHz and about 40 khz. The ultrasonic horn further directs the amplified waves to impinge upon the sample. On contact between the waves and the sample, a plurality of transmitted energy is transmitted to the sample, a plurality of longitudinal displacements and surface acoustic wave displacements in the sample are created. An adjustable separation distance lies between the sample and the ultrasonic horn, the distance adjusted to maximize the transmitted energy. The distance is preferably greater than the maximum displacement of the ultrasonic horn, or approximately 0.1 mm.

Abstract: An atomic force microscope (AFM) system capable of imaging multiple physical properties of a sample material at the nanoscale level. The system provides an apparatus and method for imaging physical properties using an electromagnetic coil placed under the sample. Excitation of the coil creates currents in the sample, which may be used to image a topography of the sample, a physical property of the sample, or both.

Abstract: A non-contact acousto-thermal method and apparatus are provided for detection of incipient damage in materials. The apparatus utilizes an ultrasonic horn which receives an acoustic wave generated by an ultrasonic transducer energized by an RF pulse. The ultrasonic horn is placed at a distance from the sample to be tested with sufficient gap so that when excited, the face of the ultrasonic horn does not come into contact with the sample. An IR camera is placed at a distance from the opposite side of the sample. The acoustic wave is amplified by the ultrasonic horn, and the interaction between the sample and the acoustic wave produces changes in the temperature of the sample in the region of interaction during acoustic excitation such that the temperature of the material rapidly increases. The temperature-time profile is captured by the IR camera and may be analyzed by a data acquisition unit.