Abstract: A semiconductor logic circuit apparatus which include a first switching element consisting of a field effect transistor for changing holding data, an inverter circuit whose input is connected with one end of the first switching element, a feedback circuit whose input and output are connected with the output and input of the inverter circuit, and a second switching element connected between the output of the feedback circuit and first or second potential. The second switching element is effective for enabling and disabling the feedback circuit.The first and second switching elements are opened/closed in reverse phase to each other. Feedback of the feedback circuit is prevented until the inverter circuit is driven from its "0" to its "1" holding state, so that driving of the inverter circuit becomes easy and operational stability and operating speed are enhanced.

Abstract: The semiconductor memory device includes a memory cell array for storing a plurality of data on a word basis, a data input-output device and a read control device. The data input-output device includes a plurality of data holding circuits corresponding to one word. The data of one word is divided into a plurality of subwords. The read control device brings to an active state any one of a plurality of control signals corresponding to the plurality of subwords in response to an externally applied subword selection signal. The data holding circuit corresponding to one subword is thereby activated. As a result, any subword among the data of one word held in the data holding circuit is rewritten with a corresponding subword among the data of one word read from the memory cell array.

Abstract: A semiconductor memory device includes a plurality of ports enabling simultaneous writing and reading of data of M words.times.N bits. A plurality of memory cells are arranged in (M/n) rows.times.(n.times.N) columns in a memory call array, write and read word lines are commonly connected to the memory cells of one row, and write column selecting line are connected to every n (the number of words) memory cells of the memory cells of one row. Write and read bit lines are connected to the memory cells of one column. Data is input to the write bit line from an input terminal through a write circuit. and data read from the memory cell is output to an output terminal through a sense amplifier. A first port is formed by the write word lines, the write column selecting lines, the write bit lines and the input terminal, and a second port is formed by the read word lines, read bit lines and the output terminal. M, N and n are natural numbers and M, N.gtoreq.n.

Abstract: Test data stored in a data register 13a are applied to a data generator 11a and compared with a 1 bit signal stored in a scan latch 1c to determine the coincidence or non-coincidence therebetween. Outputs from the data generator 11a are applied to RAM 10 to be written in a designated region in a memory cell array 6. Data read from the said region of the memory cell array 6 are compared with expected value data in a comparator 12. Thus, the collation of data is carried out.