Patents by Inventor Kumiko Horikoshi
Kumiko Horikoshi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240410834Abstract: An information providing apparatus 10 according to one embodiment includes an acquisition unit 141, a calculation unit 142, and a providing unit 143. The acquisition unit 141 acquires a thickness measurement value of each of portions of paper and a moisture percentage measurement value of each of the portions of the paper before or after a pressing process of pressing each of the portions of the paper with a different pressing force by using a roll based on an index that is provided. The calculation unit 142 calculates an estimated value of a thickness of the paper after a moisture percentage of the paper has changed, based on the thickness measurement value and the moisture percentage measurement value. The providing unit 143 provides the estimated value as the index to an apparatus that performs the pressing process.Type: ApplicationFiled: June 4, 2024Publication date: December 12, 2024Inventors: Kazufumi NISHIDA, Kumiko HORIKOSHI
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Publication number: 20230062325Abstract: An integrating sphere (10) of the present disclosure includes a hollow member (1) and a diffusive coating (4), on the inner surface of the hollow member (1), configured to scatter and reflect light from a light source within the hollow member (1) to yield diffused light. The diffusive coating (4) is coated with a hydrophobic coating (5). The accuracy of optical measurements using the integrating sphere (10) is improved by suppressed moisture absorption of the integrating sphere (10) and suppressed fluctuations in the efficiency of the integrating sphere (10).Type: ApplicationFiled: August 26, 2022Publication date: March 2, 2023Inventors: Kazufumi Nishida, Kumiko Horikoshi, Hitoshi Hara
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Patent number: 9194823Abstract: A radiation inspection apparatus may include a radiation source that irradiates linear radiation, which is parallel to an inspection direction set on an inspection target, to the inspection target, a line type detector that detects the radiation transmitted through the inspection target, a correction detector that is disposed in at least one of a position between the radiation source and the inspection target and a position between the inspection target and the line type detector, the correction detector moving along the inspection direction to detect the radiation, which has been irradiated from the radiation source, at each of a plurality of inspection positions along the inspection direction, and a correction device that corrects the detection result of the line type detector by using the detection result of the correction detector.Type: GrantFiled: February 27, 2012Date of Patent: November 24, 2015Assignee: YOKOGAWA ELECTRIC CORPORATIONInventors: Hirohiko Obinata, Kumiko Horikoshi
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Patent number: 9170194Abstract: A material property measuring apparatus includes a radiation source irradiator configured to irradiate a measurement target material with radiation beams having n different wavelengths, a detector configured to detect intensities of radiation beams having the respective wavelengths after the irradiation of the measurement target material, and a processing unit configured to correct the detected intensity of the radiation beam having at least a part of the respective wavelengths using a correction coefficient in which rows and columns are respectively represented by a matrix of an order of n or less, and to calculate an index value indicating a property of the measurement target material on the basis of relative intensities of the radiation beams having the respective wavelengths after the correction.Type: GrantFiled: March 28, 2013Date of Patent: October 27, 2015Assignee: YOKOGAWA ELECTRIC CORPORATIONInventors: Yasushi Ichizawa, Kumiko Horikoshi, Kazuki Setsuda, Naomichi Chida
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Publication number: 20150090885Abstract: A material property measuring apparatus includes a radiation source irradiator configured to irradiate a measurement target material with radiation beams having n different wavelengths, a detector configured to detect intensities of radiation beams having the respective wavelengths after the irradiation of the measurement target material, and a processing unit configured to correct the detected intensity of the radiation beam having at least a part of the respective wavelengths using a correction coefficient in which rows and columns are respectively represented by a matrix of an order of n or less, and to calculate an index value indicating a property of the measurement target material on the basis of relative intensities of the radiation beams having the respective wavelengths after the correction.Type: ApplicationFiled: March 28, 2013Publication date: April 2, 2015Applicant: YOKOGAWA ELECTRIC CORPORATIONInventors: Yasushi Ichizawa, Kumiko Horikoshi, Kazuki Setsuda, Naomichi Chida
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Patent number: 8547544Abstract: A multichannel photometric measurement apparatus according to one embodiment includes: a single signal generator for generating an initial signal, the initial signal containing a harmonic component for collectively generating a plurality of modulation signals; a light emitting device including a plurality of light sources that are respectively drivable by each of the plurality of modulation signals having different frequencies; a light detector for detecting a plurality of kinds of light emitted from the light emitting device; and discriminating means for discriminating a detected signal output from the light detector per frequency domain of each of the different frequencies for each of the modulation signals.Type: GrantFiled: July 20, 2011Date of Patent: October 1, 2013Assignee: Yokogawa Electric CorporationInventors: Kumiko Horikoshi, Yasushi Ichizawa, Shigeyuki Kakuta, Kazufumi Nishida
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Publication number: 20120221275Abstract: A radiation inspection apparatus may include a radiation source that irradiates linear radiation, which is parallel to an inspection direction set on an inspection target, to the inspection target, a line type detector that detects the radiation transmitted through the inspection target, a correction detector that is disposed in at least one of a position between the radiation source and the inspection target and a position between the inspection target and the line type detector, the correction detector moving along the inspection direction to detect the radiation, which has been irradiated from the radiation source, at each of a plurality of inspection positions along the inspection direction, and a correction device that corrects the detection result of the line type detector by using the detection result of the correction detector.Type: ApplicationFiled: February 27, 2012Publication date: August 30, 2012Applicant: YOKOGAWA ELECTRIC CORPORATIONInventors: Hirohiko OBINATA, Kumiko HORIKOSHI
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Publication number: 20120218542Abstract: An infrared analysis apparatus may include a first head and a second head. The first head may include a plurality of light sources each of which irradiates rays of infrared light having different wavelengths on a test object, and an optical element that is disposed between the plurality of light sources and the test object, the optical element making intensity distribution of the infrared light uniform. The second head may include a detector that detects the infrared light transmitted through the test object.Type: ApplicationFiled: February 22, 2012Publication date: August 30, 2012Applicant: Yokogawa Electric CorporationInventors: Yasushi ICHIZAWA, Kumiko Horikoshi, Atsushi Tsujii, Shigeyuki Kakuta
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Publication number: 20120019815Abstract: A multichannel photometric measurement apparatus according to one embodiment includes: a single signal generator for generating an initial signal, the initial signal containing a harmonic component for collectively generating a plurality of modulation signals; a light emitting device including a plurality of light sources that are respectively drivable by each of the plurality of modulation signals having different frequencies; a light detector for detecting a plurality of kinds of light emitted from the light emitting device; and discriminating means for discriminating a detected signal output from the light detector per frequency domain of each of the different frequencies for each of the modulation signals.Type: ApplicationFiled: July 20, 2011Publication date: January 26, 2012Applicant: YOKOGAWA ELECTRIC CORPORATIONInventors: Kumiko Horikoshi, Yasushi Ichizawa, Shigeyuki Kakuta, Kazufumi Nishida