Abstract: An integrating sphere (10) of the present disclosure includes a hollow member (1) and a diffusive coating (4), on the inner surface of the hollow member (1), configured to scatter and reflect light from a light source within the hollow member (1) to yield diffused light. The diffusive coating (4) is coated with a hydrophobic coating (5). The accuracy of optical measurements using the integrating sphere (10) is improved by suppressed moisture absorption of the integrating sphere (10) and suppressed fluctuations in the efficiency of the integrating sphere (10).

Abstract: A radiation inspection apparatus may include a radiation source that irradiates linear radiation, which is parallel to an inspection direction set on an inspection target, to the inspection target, a line type detector that detects the radiation transmitted through the inspection target, a correction detector that is disposed in at least one of a position between the radiation source and the inspection target and a position between the inspection target and the line type detector, the correction detector moving along the inspection direction to detect the radiation, which has been irradiated from the radiation source, at each of a plurality of inspection positions along the inspection direction, and a correction device that corrects the detection result of the line type detector by using the detection result of the correction detector.

Abstract: A material property measuring apparatus includes a radiation source irradiator configured to irradiate a measurement target material with radiation beams having n different wavelengths, a detector configured to detect intensities of radiation beams having the respective wavelengths after the irradiation of the measurement target material, and a processing unit configured to correct the detected intensity of the radiation beam having at least a part of the respective wavelengths using a correction coefficient in which rows and columns are respectively represented by a matrix of an order of n or less, and to calculate an index value indicating a property of the measurement target material on the basis of relative intensities of the radiation beams having the respective wavelengths after the correction.

Abstract: A material property measuring apparatus includes a radiation source irradiator configured to irradiate a measurement target material with radiation beams having n different wavelengths, a detector configured to detect intensities of radiation beams having the respective wavelengths after the irradiation of the measurement target material, and a processing unit configured to correct the detected intensity of the radiation beam having at least a part of the respective wavelengths using a correction coefficient in which rows and columns are respectively represented by a matrix of an order of n or less, and to calculate an index value indicating a property of the measurement target material on the basis of relative intensities of the radiation beams having the respective wavelengths after the correction.

Abstract: A multichannel photometric measurement apparatus according to one embodiment includes: a single signal generator for generating an initial signal, the initial signal containing a harmonic component for collectively generating a plurality of modulation signals; a light emitting device including a plurality of light sources that are respectively drivable by each of the plurality of modulation signals having different frequencies; a light detector for detecting a plurality of kinds of light emitted from the light emitting device; and discriminating means for discriminating a detected signal output from the light detector per frequency domain of each of the different frequencies for each of the modulation signals.

Abstract: An infrared analysis apparatus may include a first head and a second head. The first head may include a plurality of light sources each of which irradiates rays of infrared light having different wavelengths on a test object, and an optical element that is disposed between the plurality of light sources and the test object, the optical element making intensity distribution of the infrared light uniform. The second head may include a detector that detects the infrared light transmitted through the test object.

Abstract: A radiation inspection apparatus may include a radiation source that irradiates linear radiation, which is parallel to an inspection direction set on an inspection target, to the inspection target, a line type detector that detects the radiation transmitted through the inspection target, a correction detector that is disposed in at least one of a position between the radiation source and the inspection target and a position between the inspection target and the line type detector, the correction detector moving along the inspection direction to detect the radiation, which has been irradiated from the radiation source, at each of a plurality of inspection positions along the inspection direction, and a correction device that corrects the detection result of the line type detector by using the detection result of the correction detector.

Abstract: A multichannel photometric measurement apparatus according to one embodiment includes: a single signal generator for generating an initial signal, the initial signal containing a harmonic component for collectively generating a plurality of modulation signals; a light emitting device including a plurality of light sources that are respectively drivable by each of the plurality of modulation signals having different frequencies; a light detector for detecting a plurality of kinds of light emitted from the light emitting device; and discriminating means for discriminating a detected signal output from the light detector per frequency domain of each of the different frequencies for each of the modulation signals.