Patents by Inventor Kun-Yen Wu

Kun-Yen Wu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11982866
    Abstract: An optical element driving mechanism is provided and includes a fixed assembly, a movable assembly, a driving assembly and a stopping assembly. The fixed assembly has a main axis. The movable assembly is configured to connect an optical element, and the movable assembly is movable relative to the fixed assembly. The driving assembly is configured to drive the movable assembly to move relative to the fixed assembly. The stopping assembly is configured to limit the movement of the movable assembly relative to the fixed assembly within a range of motion.
    Type: Grant
    Filed: December 15, 2022
    Date of Patent: May 14, 2024
    Assignee: TDK TAIWAN CORP.
    Inventors: Chao-Chang Hu, Liang-Ting Ho, Chen-Er Hsu, Yi-Liang Chan, Fu-Lai Tseng, Fu-Yuan Wu, Chen-Chi Kuo, Ying-Jen Wang, Wei-Han Hsia, Yi-Hsin Tseng, Wen-Chang Lin, Chun-Chia Liao, Shou-Jen Liu, Chao-Chun Chang, Yi-Chieh Lin, Shang-Yu Hsu, Yu-Huai Liao, Shih-Wei Hung, Sin-Hong Lin, Kun-Shih Lin, Yu-Cheng Lin, Wen-Yen Huang, Wei-Jhe Shen, Chih-Shiang Wu, Sin-Jhong Song, Che-Hsiang Chiu, Sheng-Chang Lin
  • Publication number: 20240114683
    Abstract: A method of manufacturing a memory device includes providing a substrate and sequentially forming a stack layer and a hard mask layer on the substrate. The method includes forming a first patterned mandrel and a plurality of second patterned mandrels on the hard mask layer, wherein the first patterned mandrel is adjacent to and spaced apart from an end of the second patterned mandrels in the first direction. The method further includes using the first patterned mandrel and the second patterned mandrels as masks, patterning the hard mask layer and the stack layer sequentially to form a dummy structure and a plurality of word lines separated from each other on the substrate. A portion of the stack layer corresponding to the first mandrel is formed into the dummy structure, and a portion of the stack layer corresponding to the second patterned mandrels is formed into the word lines.
    Type: Application
    Filed: October 3, 2022
    Publication date: April 4, 2024
    Inventors: Tsung-Wei LIN, Kun-Che WU, Chun-Yen LIAO, Chun-Sheng WU
  • Patent number: 11355040
    Abstract: A method for inspecting functionality of a display device and a test equipment are provided. The method for inspecting functionality of the display device is utilized in a test equipment of an auto-test system. The method includes controlling an image capturing device to capture a test image shown on a screen of the display device for generating a captured image, acquiring an encoded pattern from the captured image and decoding the encoded pattern, wherein the test image is a source image generated by an image providing device superposed with the encoded pattern, determining whether the encoded pattern is successfully decoded to generate a resultant data, and comparing the resultant data with reference data to generate a comparison result after the encoded pattern is successfully decoded, wherein the reference data comprises information associated with the test image and information associated with system configuration of the display device.
    Type: Grant
    Filed: November 11, 2020
    Date of Patent: June 7, 2022
    Assignee: NOVATEK Microelectronics Corp.
    Inventors: Sheng-Nan Sun, Jia-yu Wang, Chi-Cheng Hung, Kun-Yen Wu
  • Publication number: 20220148469
    Abstract: A method for inspecting functionality of a display device and a test equipment are provided. The method for inspecting functionality of the display device is utilized in a test equipment of an auto-test system. The method includes controlling an image capturing device to capture a test image shown on a screen of the display device for generating a captured image, acquiring an encoded pattern from the captured image and decoding the encoded pattern, wherein the test image is a source image generated by an image providing device superposed with the encoded pattern, determining whether the encoded pattern is successfully decoded to generate a resultant data, and comparing the resultant data with reference data to generate a comparison result after the encoded pattern is successfully decoded, wherein the reference data comprises information associated with the test image and information associated with system configuration of the display device.
    Type: Application
    Filed: November 11, 2020
    Publication date: May 12, 2022
    Inventors: Sheng-Nan Sun, Jia-yu Wang, Chi-Cheng Hung, Kun-Yen Wu