Patents by Inventor Kun-Yen Wu

Kun-Yen Wu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and test equipment for inspecting functionality of display device
    Patent number: 11355040
    Abstract: A method for inspecting functionality of a display device and a test equipment are provided. The method for inspecting functionality of the display device is utilized in a test equipment of an auto-test system. The method includes controlling an image capturing device to capture a test image shown on a screen of the display device for generating a captured image, acquiring an encoded pattern from the captured image and decoding the encoded pattern, wherein the test image is a source image generated by an image providing device superposed with the encoded pattern, determining whether the encoded pattern is successfully decoded to generate a resultant data, and comparing the resultant data with reference data to generate a comparison result after the encoded pattern is successfully decoded, wherein the reference data comprises information associated with the test image and information associated with system configuration of the display device.
    Type: Grant
    Filed: November 11, 2020
    Date of Patent: June 7, 2022
    Assignee: NOVATEK Microelectronics Corp.
    Inventors: Sheng-Nan Sun, Jia-yu Wang, Chi-Cheng Hung, Kun-Yen Wu
  • Method and Test Equipment for Inspecting Functionality of Display Device
    Publication number: 20220148469
    Abstract: A method for inspecting functionality of a display device and a test equipment are provided. The method for inspecting functionality of the display device is utilized in a test equipment of an auto-test system. The method includes controlling an image capturing device to capture a test image shown on a screen of the display device for generating a captured image, acquiring an encoded pattern from the captured image and decoding the encoded pattern, wherein the test image is a source image generated by an image providing device superposed with the encoded pattern, determining whether the encoded pattern is successfully decoded to generate a resultant data, and comparing the resultant data with reference data to generate a comparison result after the encoded pattern is successfully decoded, wherein the reference data comprises information associated with the test image and information associated with system configuration of the display device.
    Type: Application
    Filed: November 11, 2020
    Publication date: May 12, 2022
    Inventors: Sheng-Nan Sun, Jia-yu Wang, Chi-Cheng Hung, Kun-Yen Wu