Patents by Inventor Kun-Ying Shin

Kun-Ying Shin has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9202405
    Abstract: A display panel including a plurality of unit regions is provided. The unit regions are arranged along a first direction and a second direction to form a plurality of columns and a plurality of rows. Each of the unit regions of the display panel includes a plurality of first color sub-pixels, a plurality of second color sub-pixels, and a plurality of third color sub-pixels. In any of the rows, a first pitch between any one of the first color sub-pixels and a next of the first color sub-pixels has at least four kinds of distances.
    Type: Grant
    Filed: May 21, 2014
    Date of Patent: December 1, 2015
    Assignee: Au Optronics Corporation
    Inventors: Yi-Yang Liao, Chia-Wei Kuo, Kun-Ying Shin, Ching-Huan Lin
  • Publication number: 20150228214
    Abstract: A display panel including a plurality of unit regions is provided. The unit regions are arranged along a first direction and a second direction to form a plurality of columns and a plurality of rows. Each of the unit regions of the display panel includes a plurality of first color sub-pixels, a plurality of second color sub-pixels, and a plurality of third color sub-pixels. In any of the rows, a first pitch between any one of the first color sub-pixels and a next of the first color sub-pixels has at least four kinds of distances.
    Type: Application
    Filed: May 21, 2014
    Publication date: August 13, 2015
    Applicant: Au Optronics Corporation
    Inventors: Yi-Yang Liao, Chia-Wei Kuo, Kun-Ying Shin, Ching-Huan Lin
  • Publication number: 20140104547
    Abstract: A pixel structure of transparent LCD panel includes a pixel, a pixel electrode and liquid crystal molecules. The pixel consists of a first alignment region and a second alignment region having different aligning directions. The pixel electrode includes a main electrode disposed between the first alignment region and the second alignment region, and branch electrodes. The main electrode is a bar-shaped electrode. A portion of the branch electrodes are connected to one side of the main electrode and extending along a first direction to the first alignment region, another portion of the branch electrodes are connected to the other side of the main electrode and extending along a second direction to the second alignment region. The first direction and the second direction are opposite and parallel, the an included angle between the first direction and the gate line is between 45±10 degrees.
    Type: Application
    Filed: May 26, 2013
    Publication date: April 17, 2014
    Applicant: AU Optronics Corp.
    Inventors: Chia-Wei Kuo, Yi-Yang Liao, Ching-Huan Lin, Ting-Wei Guo, Kun-Ying Shin, Bo-Shiang Tseng, Kang-Hung Liu, Jen-Kuei Lu, Norio Sugiura
  • Patent number: 7435954
    Abstract: An electron microscope suitable for observing at least one sample is provided. The sample has at least one testing area, and a material of the sample on the testing area is semiconductive or conductive. The electron microscope includes a stage, an electron gun, and at least one probe. The stage is suitable for carrying the sample and the sample is not electrically grounded. The electron gun is suitable for generating an electron beam and accumulating charges on the sample. When the probe contacts with the testing area, the image contrast of the testing area will change. The current through the probe will also change upon contact. Methods have been provided based on these principles to determine “when” and “where” the probe starts to contact the sample surface inside an electron microscope.
    Type: Grant
    Filed: July 23, 2006
    Date of Patent: October 14, 2008
    Assignee: National Central University
    Inventors: Cheng-Hsun Nien, Chuen-Horng Tsai, Kun-Ying Shin, Wen-Bin Jian
  • Publication number: 20070262254
    Abstract: An electron microscope suitable for observing at least one sample is provided. The sample has at least one testing area, and a material of the sample on the testing area is semiconductive or conductive. The electron microscope includes a stage, an electron gun, and at least one probe. The stage is suitable for carrying the sample and the sample is not electrically grounded. The electron gun is suitable for generating an electron beam and accumulating charges on the sample. When the probe contacts with the testing area, the image contrast of the testing area will change. The current through the probe will also change upon contact. Methods have been provided based on these principles to determine “when” and “where” the probe starts to contact the sample surface inside an electron microscope.
    Type: Application
    Filed: July 23, 2006
    Publication date: November 15, 2007
    Applicant: NATIONAL CENTRAL UNIVERSITY
    Inventors: Cheng-Hsun Nien, Chuen-Horng Tsai, Kun-Ying Shin, Wen-Bin Jian