Patents by Inventor Kun-Yong Yoon

Kun-Yong Yoon has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20180012069
    Abstract: At least some example embodiments provide a fingerprint sensor, a fingerprint sensor package, and a fingerprint sensing system using light sources of a display panel. The fingerprint sensor includes an image sensor including a plurality of sensor pixels, the sensor pixels configured to sense light reflected by a fingerprint and generate image information corresponding to the fingerprint and a pinhole mask defining a plurality of pinholes, wherein each of the pinholes forms a focus for transmitting the light reflected by the fingerprint to the image sensor, wherein light is emitted from a plurality of organic light-emitting diodes (OLEDs) and is reflected by the fingerprint.
    Type: Application
    Filed: June 30, 2017
    Publication date: January 11, 2018
    Applicant: Samsung Electronics Co., Ltd.
    Inventors: Dae-young Chung, Hee-chang Hwang, Kun-yong Yoon, Woon-bae Kim, Bum-suk Kim, Min Jang, Min-chul Lee, Jung-woo Kim
  • Patent number: 9632126
    Abstract: An integrated circuit includes an operational circuit and a test circuit for measuring a leakage current associated with all or part of the operational circuit. The leakage current measurement circuit may include a mirror circuit configured to mirror leakage current to a current-to-voltage converter and an analog-to-digital converter configured to convert the analog voltage representative of the leakage current developed by the current-to-voltage converter to a digital value.
    Type: Grant
    Filed: October 29, 2014
    Date of Patent: April 25, 2017
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Kun-Yong Yoon, Jae-Jin Park, Ji-Hwan Hyun
  • Publication number: 20150233996
    Abstract: An integrated circuit includes an operational circuit and a test circuit for measuring a leakage current associated with all or part of the operational circuit. The leakage current measurement circuit may include a mirror circuit configured to mirror leakage current to a current-to-voltage converter and an analog-to-digital converter configured to convert the analog voltage representative of the leakage current developed by the current-to-voltage converter to a digital value.
    Type: Application
    Filed: October 29, 2014
    Publication date: August 20, 2015
    Inventors: Kun-Yong Yoon, Jae-Jin Park, Ji-Hwan Hyun