Patents by Inventor Kunal H. Patel

Kunal H. Patel has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9880030
    Abstract: System and method for extending programmable device functionality while preserving functionality of the device driver and driver IP. User input may be received specifying functionality of custom IP for a programmable measurement device with standard driver IP. The custom IP may be generated accordingly, and may be deployable to the programmable measurement device. During operation the custom IP may communicate directly with the standard driver IP and may provide custom functionality of the programmable measurement device while preserving functionality of the standard driver IP on the programmable measurement device and the standard device driver.
    Type: Grant
    Filed: June 4, 2014
    Date of Patent: January 30, 2018
    Assignee: NATIONAL INSTRUMENTS CORPORATION
    Inventors: Christopher F. Graf, Ryan P. Verret, Joseph H. DiGiovanni, Dustyn K. Blasig, Jeronimo Mota, Kunal H. Patel, Duncan G. Hudson, III, Brian K. Odom
  • Publication number: 20150039272
    Abstract: A digitizer system (DS) may include one or more input channels to receive sample data, and an acquisition state machine (ASM) to organize the sample data into one or more acquisition records according to events of interest, and generate framing information corresponding to the one or more acquisition records. The events of interest may be identified by a trigger circuit in the DS, and relayed to the ASM for organizing the sample data. The DS may further include a data interface capable of receiving the one or more acquisition records and the framing information, encoding the one or more acquisition records and the framing information into encoded data, and transmitting the encoded data to an expansion module. The expansion module may receive the encoded data, decode the encoded data, and recover the sample data from the decoded data according to the framing information and the one or more acquisition records.
    Type: Application
    Filed: July 31, 2013
    Publication date: February 5, 2015
    Applicant: NATIONAL INSTRUMENTS CORPORATION
    Inventors: Rafael Castro Scorsi, Kunal H. Patel, Hector Rubio
  • Patent number: 8942300
    Abstract: A digitizer system (DS) may include one or more input channels to receive sample data, and an acquisition state machine (ASM) to organize the sample data into one or more acquisition records according to events of interest, and generate framing information corresponding to the one or more acquisition records. The events of interest may be identified by a trigger circuit in the DS, and relayed to the ASM for organizing the sample data. The DS may further include a data interface capable of receiving the one or more acquisition records and the framing information, encoding the one or more acquisition records and the framing information into encoded data, and transmitting the encoded data to an expansion module. The expansion module may receive the encoded data, decode the encoded data, and recover the sample data from the decoded data according to the framing information and the one or more acquisition records.
    Type: Grant
    Filed: July 31, 2013
    Date of Patent: January 27, 2015
    Assignee: National Instruments Corporation
    Inventors: Rafael Castro Scorsi, Kunal H. Patel, Hector Rubio
  • Publication number: 20140358469
    Abstract: System and method for extending programmable device functionality while preserving functionality of the device driver and driver IP. User input may be received specifying functionality of custom IP for a programmable measurement device with standard driver IP. The custom IP may be generated accordingly, and may be deployable to the programmable measurement device. During operation the custom IP may communicate directly with the standard driver IP and may provide custom functionality of the programmable measurement device while preserving functionality of the standard driver IP on the programmable measurement device and the standard device driver.
    Type: Application
    Filed: June 4, 2014
    Publication date: December 4, 2014
    Applicant: NATIONAL INSTRUMENTS CORPORATION
    Inventors: Christopher F. Graf, Ryan P. Verret, Joseph H. DiGiovanni, David E. Klipec, Dustyn K. Blasig, Jeronimo Mota, Kunal H. Patel, Duncan G. Hudson, III, Brian K. Odom
  • Patent number: 8514978
    Abstract: Receiving a modulated carrier signal that is modulated using a reference signal, wherein an acquisition by a digitizer is synced to the reference signal such that the modulated carrier signal has known timing with respect to a start of an acquisition within the digitizer. Further including routing the modulated carrier signal through a receiver system to generate a processed signal, receiving the processed signal at the digitizer, digitizing the processed signal at the digitizer, and determining a delay of the modulated carrier signal routed through the receiver system based on the timing of the processed signal.
    Type: Grant
    Filed: December 22, 2010
    Date of Patent: August 20, 2013
    Assignee: National Instruments Corporation
    Inventors: Daniel S. Wertz, Charles L. Corley, II, Kunal H. Patel
  • Patent number: 8423314
    Abstract: Configuring at least one radio frequency (RF) instrument according to a plurality of RF measurement configurations for performing a plurality of tests on a device under test (DUT). A list of RF measurement configurations may be stored in a computer memory. The list of RF measurement configurations comprises a plurality of parameters for configuring operation of the at least one instrument. Information regarding the list of RF measurement configurations (e.g., a data stream) may be provided to the at least one RF instrument. The at least one RF instrument may perform the plurality of tests on the DUT, including the at least one RF instrument configuring itself according to the RF measurement configurations based on processing of the information. Configuring enables the at least one RF instrument to perform the plurality of tests on the DUT in a deterministic manner.
    Type: Grant
    Filed: February 25, 2010
    Date of Patent: April 16, 2013
    Assignee: National Instruments Corporation
    Inventors: Kunal H. Patel, David E. Klipec
  • Patent number: 8307235
    Abstract: A system may include a plurality of subsystems, e.g. instrumentation units housed in separate chassis, each chassis including multiple instrumentation devices, e.g. data acquisition cards. Each subsystem may generate a local reference clock, which may be phase aligned and locked with respect to one or more similar reference clocks of other subsystems, via a high-level precision time protocol (PTP). Each instrumentation device within a given subsystem may generate its own sample clock based on the local reference clock, and may generate its own trigger clock based on its own sample clock. All trigger clocks may be synchronized with respect to each other through a future time event issued using the PTP, and each instrumentation device may then use its trigger clock to synchronize any received trigger pulses, which may also be issued through future time events using the PTP.
    Type: Grant
    Filed: May 5, 2010
    Date of Patent: November 6, 2012
    Assignee: National Instruments Corporation
    Inventors: Kunal H. Patel, Adam C. Ullrich, Kalyanramu Vemishetty, Stephen A. Hanssen
  • Publication number: 20120027063
    Abstract: Receiving a modulated carrier signal that is modulated using a reference signal, wherein an acquisition by a digitizer is synced to the reference signal such that the modulated carrier signal has known timing with respect to a start of an acquisition within the digitizer. Further including routing the modulated carrier signal through a receiver system to generate a processed signal, receiving the processed signal at the digitizer, digitizing the processed signal at the digitizer, and determining a delay of the modulated carrier signal routed through the receiver system based on the timing of the processed signal.
    Type: Application
    Filed: December 22, 2010
    Publication date: February 2, 2012
    Inventors: Daniel S. Wertz, Charles L. Corley, II, Kunal H. Patel
  • Publication number: 20110276820
    Abstract: A system may include a plurality of subsystems, e.g. instrumentation units housed in separate chassis, each chassis including multiple instrumentation devices, e.g. data acquisition cards. Each subsystem may generate a local reference clock, which may be phase aligned and locked with respect to one or more similar reference clocks of other subsystems, via a high-level precision time protocol (PTP). Each instrumentation device within a given subsystem may generate its own sample clock based on the local reference clock, and may generate its own trigger clock based on its own sample clock. All trigger clocks may be synchronized with respect to each other through a future time event issued using the PTP, and each instrumentation device may then use its trigger clock to synchronize any received trigger pulses, which may also be issued through future time events using the PTP.
    Type: Application
    Filed: May 5, 2010
    Publication date: November 10, 2011
    Inventors: Kunal H. Patel, Adam C. Ullrich, Kalyanramu Vemishetty, Stephen A. Hanssen
  • Publication number: 20110119016
    Abstract: Configuring at least one radio frequency (RF) instrument according to a plurality of RF measurement configurations for performing a plurality of tests on a device under test (DUT). A list of RF measurement configurations may be stored in a computer memory. The list of RF measurement configurations comprises a plurality of parameters for configuring operation of the at least one instrument. Information regarding the list of RF measurement configurations (e.g., a data stream) may be provided to the at least one RF instrument. The at least one RF instrument may perform the plurality of tests on the DUT, including the at least one RF instrument configuring itself according to the RF measurement configurations based on processing of the information. Configuring enables the at least one RF instrument to perform the plurality of tests on the DUT in a deterministic manner.
    Type: Application
    Filed: February 25, 2010
    Publication date: May 19, 2011
    Inventors: Kunal H. Patel, David E. Klipec