Patents by Inventor Kung-Chien Chen

Kung-Chien Chen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7240311
    Abstract: An equivalence checking method provides first and second logic functions. Don't care gates are inserted for don't care conditions in the first and second logic functions. The insertion of the don't care gates creates a first intermediate circuit and a second intermediate circuit. All 3DC gates of the first intermediate circuit are propagated and merged into a single 3DC gate when 3DC gates and SDC gates coexist in either of the first and second intermediate circuits. All 3DC gates of the second intermediate circuit are propagated and merged into a single 3DC gate when 3DC gates and SDC gates coexist in either of the first and second intermediate circuits. First and second circuit are produced in response to propagating and merging the 3DC gates. A combinational equivalence check is then performed of the first circuit to the second circuit under different equivalence relations.
    Type: Grant
    Filed: November 22, 2004
    Date of Patent: July 3, 2007
    Assignee: Cadence Design Systems, Inc.
    Inventors: Yung-Te Lai, Chioumin Chang, Kung-Chien Chen, Chih-Chang Lin
  • Publication number: 20050155002
    Abstract: An equivalence checking method provides first and second logic functions. Don't care gates are inserted for don't care conditions in the first and second logic functions. The insertion of the don't care gates creates a first intermediate circuit and a second intermediate circuit. All 3DC gates of the first intermediate circuit are propagated and merged into a single 3DC gate when 3DC gates and SDC gates coexist in either of the first and second intermediate circuits. All 3DC gates of the second intermediate circuit are propagated and merged into a single 3DC gate when 3DC gates and SDC gates coexist in either of the first and second intermediate circuits. First and second circuit are produced in response to propagating and merging the 3DC gates. A combinational equivalence check is then performed of the first circuit to the second circuit under different equivalence relations.
    Type: Application
    Filed: November 22, 2004
    Publication date: July 14, 2005
    Inventors: Yung-Te Lai, Chioumin Chang, Kung-Chien Chen, Chih-Chang Lin
  • Patent number: 6842884
    Abstract: An equivalence checking method provides first and second logic functions. Don't care gates are inserted for don't care conditions in the first and second logic functions. The insertion of the don't care gates creates a first intermediate circuit and a second intermediate circuit. All 3DC gates of the first intermediate circuit are propagated and merged into a single 3DC gate when 3DC gates and SDC gates coexist in either of the first and second intermediate circuits. All 3DC gates of the second intermediate circuit are propagated and merged into a single 3DC gate when 3DC gates and SDC gates coexist in either of the first and second intermediate circuits. First and second circuits are produced in response to propagating and merging the 3DC gates. A combinational equivalence check is then performed of the first circuit to the second circuit under different equivalence relations.
    Type: Grant
    Filed: August 28, 2002
    Date of Patent: January 11, 2005
    Assignee: Verplex Systems, Inc.
    Inventors: Yung-Te Lai, Chioumin Chang, Kung-Chien Chen, Chih-Chang Lin
  • Publication number: 20040044975
    Abstract: An equivalence checking method provides first and second logic functions. Don't care gates are inserted for don't care conditions in the first and second logic functions. The insertion of the don't care gates creates a first intermediate circuit and a second intermediate circuit. All 3DC gates of the first intermediate circuit are propagated and merged into a single 3DC gate when 3DC gates and SDC gates coexist in either of the first and second intermediate circuits. All 3DC gates of the second intermediate circuit are propagated and merged into a single 3DC gate when 3DC gates and SDC gates coexist in either of the first and second intermediate circuits. First and second circuit are produced in response to propagating and merging the 3DC gates. A combinational equivalence check is then performed of the first circuit to the second circuit under different equivalence relations.
    Type: Application
    Filed: August 28, 2002
    Publication date: March 4, 2004
    Inventors: Yung-Te Lai, Chioumin Chang, Kung-Chien Chen, Chih-Chang Lin