Abstract: A method of transferring IC devices with use of a horizontal transfer test handler in horizontal directions to and from a test head wherein the test handler includes a device tray for carrying a plurality of IC devices to be tested, an IC socket mounted on the test head to interface between the IC device under test and an IC tester by establishing electrical connections therebetween, and a reference position marker provided on an upper surface of the test handler.

Abstract: A horizontal transfer test handler for transferring IC devices under test in horizontal directions to and from a test head.

Abstract: A handler is provided in which an operator can easily input test conditions for ICs of a lot. The handler includes a test parameter memory part, a parameter set memory part, a schedule memory part, a lot data memory part, a retest data memory part, and a control. The test parameter memory part restores, as the test conditions for the ICs to be tested of each lot, at least parameters of basic conditions of operation, parameters of classifying conditions for the tested devices, at least one parameter of socket selecting conditions in the test section, and parameters of temperature conditions for the constant temperature chamber. The parameter set memory part stores a plurality of parameter sets each set of which is a combination of parameters, one for one condition stored in the test parameter memory part. The schedule memory part stores a name of each lot, and a parameter set and a status corresponding to each lot name in testing sequence. The lot data memory part stores data of the test results for each lot.