Abstract: A recording device which records data onto a recording medium includes a nonvolatile memory storing and holding data on a free capacity of the recording medium, and a control unit controlling the data recording. The control unit determines the free-capacity data stored in the nonvolatile memory based on the total capacity of the recording medium when power is turned on. When the determination result indicates that a value of the free-capacity data stored in the nonvolatile memory does not exceed a value of the total capacity of the recording medium, the control unit records the data onto the recording medium with reference to the free-capacity data. When the power is turned off, the control unit updates the free-capacity data so as to reduce the value of the free-capacity data by as much as an amount of the data recorded onto the recording medium.

Abstract: A recording control apparatus includes an attribute information reader, a medium determining unit, and a command transmitter. When a recording medium is removably loaded into a loading unit, the attribute information reader reads attribute information therefrom. On the basis of the attribute information, the medium determining unit determines whether or not the recording medium is a one-time recording medium capable of writing data once. If the recording medium is determined to be a one-time recording medium that has been set to a write-protected state in advance, the command transmitter transmits to the recording medium an unlock command for unlocking the write-protected state thereof.

Abstract: A recording device which records data onto a recording medium includes a nonvolatile memory storing and holding data on a free capacity of the recording medium, and a control unit controlling the data recording. The control unit determines the free-capacity data stored in the nonvolatile memory based on the total capacity of the recording medium when power is turned on. When the determination result indicates that a value of the free-capacity data stored in the nonvolatile memory does not exceed a value of the total capacity of the recording medium, the control unit records the data onto the recording medium with reference to the free-capacity data. When the power is turned off, the control unit updates the free-capacity data so as to reduce the value of the free-capacity data by as much as an amount of the data recorded onto the recording medium.

Abstract: A semiconductor wafer examination system can accurately and reliably detects defects of semiconductor wafers. The semiconductor wafer examination system 1 comprises a defect classification device for automatically classifying defects of semiconductor wafers on the basis of defect detection parameters and a knowledge base and a classification support device for supporting the operation of the defect classification device. The defect detection parameters define the permissible deviation of the surface image of a defective semiconductor wafer from that of a normal semiconductor wafer. The knowledge base contains data for the types of defects that can occur in semiconductor wafers and data for showing the characteristics of each type. The classification support device prepares data on isolated defective areas that are used for selecting and/or altering the defect detection parameters and preparing the knowledge base.

Abstract: A semiconductor wafer examination system can accurately and reliably detects defects of semiconductor wafers. The semiconductor wafer examination system 1 comprises a defect classification device for automatically classifying defects of semiconductor wafers on the basis of defect detection parameters and a knowledge base and a classification support device for supporting the operation of the defect classification device. The defect detection parameters define the permissible deviation of the surface image of a defective semiconductor wafer from that of a normal semiconductor wafer. The knowledge base contains data for the types of defects that can occur in semiconductor wafers and data for showing the characteristics of each type. The classification support device prepares data on isolated defective areas that are used for selecting and/or altering the defect detection parameters and preparing the knowledge base.