Patents by Inventor Kunihiro Itagaki

Kunihiro Itagaki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Probe card, having cantilever-type probe and method
    Patent number: 7256591
    Abstract: A probe card is used to test an electronic device. The probe card includes a base plate and a cantilever-type probe arranged on the base plate. The cantilever-type probe has an end that contacts the contacted body and moves when contacting the contacted body. A stopper arranged on the base plate restricts the movement of the cantilever-type probe.
    Type: Grant
    Filed: October 31, 2002
    Date of Patent: August 14, 2007
    Assignee: Fujitsu Limited
    Inventors: Tsutomu Tatematsu, Kenji Togashi, Tetsuhiro Nanbu, Shigenobu Ishihara, Morihiko Hamada, Yoshikazu Arisaka, Kunihiro Itagaki, Shigekazu Aoki
  • Probe card and method for manufacturing probe card
    Publication number: 20070134824
    Abstract: A probe card that is manufactured inexpensively. The probe card includes a base plate, a flexible substrate, and a contact probe. The contact probe is a flexible substrate formed from polyimide resin. The contact probe has a plurality of parallel wires. Each wire has a distal end that functions as a contact. The contact probe is produced by cutting a general purpose substrate having a plurality of parallel wires formed at a predetermined pitch. The number of the parallel wires is equal to the number of pads of an LSI chip.
    Type: Application
    Filed: January 26, 2007
    Publication date: June 14, 2007
    Applicant: FUJITSU LIMITED
    Inventors: Yoshikazu Arisaka, Kunihiro Itagaki, Shigenobu Ishihara, Tomohiro Giga, Naoyoshi Kikuchi
  • Probe card and method for manufacturing probe card
    Patent number: 7180312
    Abstract: A probe card that is manufactured inexpensively. The probe card includes a base plate, a flexible substrate, and a contact probe. The contact probe is a flexible substrate formed from polyimide resin. The contact probe has a plurality of parallel wires. Each wire has a distal end that functions as a contact. The contact probe is produced by cutting a general purpose substrate having a plurality of parallel wires formed at a predetermined pitch. The number of the parallel wires is equal to the number of pads of an LSI chip.
    Type: Grant
    Filed: March 25, 2003
    Date of Patent: February 20, 2007
    Assignee: Fujitsu Limited
    Inventors: Yoshikazu Arisaka, Kunihiro Itagaki, Shigenobu Ishihara, Tomohiro Giga, Naoyoshi Kikuchi
  • Probe card and method for manufacturing probe card
    Publication number: 20030184330
    Abstract: A probe card that is manufactured inexpensively. The probe card includes a base plate, a flexible substrate, and a contact probe. The contact probe is a flexible substrate formed from polyimide resin. The contact probe has a plurality of parallel wires. Each wire has a distal end that functions as a contact. The contact probe is produced by cutting a general purpose substrate having a plurality of parallel wires formed at a predetermined pitch. The number of the parallel wires is equal to the number of pads of an LSI chip.
    Type: Application
    Filed: March 25, 2003
    Publication date: October 2, 2003
    Applicant: FUJITSU LIMITED
    Inventors: Yoshikazu Arisaka, Kunihiro Itagaki, Shigenobu Ishihara, Tomohiro Giga, Naoyoshi Kikuchi
  • Probe card and probe contact method
    Publication number: 20030098702
    Abstract: An inexpensive probing card that has probe pins for contacting pads with high reliability. The probe pins are arranged on a base plate. The probe pins move along the pads when contacting the pads. A stopper restricts the movement of the probe pins.
    Type: Application
    Filed: March 29, 2002
    Publication date: May 29, 2003
    Applicant: Fujitsu Limited
    Inventors: Tsutomu Tatematsu, Kenji Togashi, Tetsuhiro Nanbu, Shigenobu Ishihara, Morihiko Hamada, Yoshikazu Arisaka, Kunihiro Itagaki
  • Probe card, semiconductor device testing apparatus, and probe contact method
    Publication number: 20030098701
    Abstract: An inexpensive probing card that has probe pins for contacting pads with high reliability. The probe pins are arranged on a base plate. The probe pins move along the pads when contacting the pads. A stopper restricts the movement of the probe pins.
    Type: Application
    Filed: October 31, 2002
    Publication date: May 29, 2003
    Applicant: Fujitsu Limited
    Inventors: Tsutomu Tatematsu, Kenji Togashi, Tetsuhiro Nanbu, Shigenobu Ishihara, Morihiko Hamada, Yoshikazu Arisaka, Kunihiro Itagaki, Shigekazu Aoki