Abstract: In sensorless control for a rotary machine, when variations in inductances for U, V, W phases due to manufacturing error are great, imbalance occurs among detected currents for the respective phases. Thus, estimation error of a magnetic pole position of a rotor increases, so that positioning accuracy is reduced. Correction filters for imparting gains in accordance with rotary machine constants for the respective phases are provided to control means or magnetic pole position calculation means, thereby correcting the imbalance occurring among the detected currents for the respective phases.

Abstract: In sensorless control for a rotary machine, when variations in inductances for U, V, W phases due to manufacturing error are great, imbalance occurs among detected currents for the respective phases. Thus, estimation error of a magnetic pole position of a rotor increases, so that positioning accuracy is reduced. Correction filters for imparting gains in accordance with rotary machine constants for the respective phases are provided to control means or magnetic pole position calculation means, thereby correcting the imbalance occurring among the detected currents for the respective phases.

Abstract: A control device for an AC rotary machine includes a magnetic-pole-position correction amount calculation device that calculates a magnetic-pole-position correction amount based on a detection-current vector detected when a voltage application device applies a voltage to the AC rotary machine according to a voltage command and on the voltage command, and stores in a storage device the magnetic-pole-position correction amount as it is associated with the detection-current vector. At normal operation of the AC rotary machine, a voltage-vector command generation device generates a voltage command for normal operation based on the detection-current vector detected by a current vector detection device and the magnetic-pole-position correction amount associated with the detection-current vector.

Abstract: A chip data providing system is provided. The chip data providing system is equipped with an inspection device for inspecting each chip after processing steps of forming integrated circuits on a plurality chips included in a semiconductor wafer are completed, an inspection server that generates, based on an inspection result, first chip data including information concerning the inspection result of each of the chips, and a chip data providing server that generates, based on the first chip data generated by the inspection server and information concerning an assembly enterprise stored in advance, second chip data in a format suitable for a system of the assembly enterprise that selects and uses the plurality of chips included in the semiconductor wafer, and provides the second chip data to the assembly enterprise.

Abstract: A method of intercorporate information-sharing between a product-manufacturing company and a product-inspecting company includes transmitting product quality and manufacturing number information from a product-manufacturing company's database storage device to a product-inspecting company's database storage device, inspecting a product, manufactured by the product-manufacturing company, by the product-inspecting company and storing an inspected result information of the product in the product-inspecting company's database storage device and transmitting the inspected result information from the product-inspecting company's database storage device to the product-manufacturing company's database storage device.

Abstract: A semiconductor-device order-entry/placement management support system is installed in an affiliated company, and includes: an order-entry/placement management server for receiving an ordering information: process control servers which are installed in subcontract companies A-C, and transmits an invoice information that is prepared based on the manufacturing results in the entrusted manufacturing process; and an order-entry/placement management support server, which is installed in the semiconductor maker, transmits an ordering information to the order-entry/placement management server, and transfers the invoice information received from the process control server to the order-entry/placement management server, and at the same time automatically prepares a document used for controlling the manufacturing of the semiconductor device, based on the ordering information and the invoice information.

Abstract: A semiconductor device manufacturing information service system comprises: step control servers, etc. that collect and store manufacturing data indicating the manufacturing result and/or quality in the manufacturing steps accepted by consignee companies X to Z; a manufacturing information service server, in a manufacturing information service company W, that generates customer company basis manufacturing data used in a customer company A by receiving the manufacturing data from the step control servers and changing the data form using a pre-recorded conversion table; and a production and sales control server, in the customer company A, that receives the customer company basis manufacturing data from the manufacturing information service server and displays or prints such data.

Abstract: A chip data providing system is provided. The chip data providing system is equipped with an inspection device for inspecting each chip after processing steps of forming integrated circuits on a plurality chips included in a semiconductor wafer are completed, an inspection server that generates, based on an inspection result, first chip data including information concerning the inspection result of each of the chips, and a chip data providing server that generates, based on the first chip data generated by the inspection server and information concerning an assembly enterprise stored in advance, second chip data in a format suitable for a system of the assembly enterprise that selects and uses the plurality of chips included in the semiconductor wafer, and provides the second chip data to the assembly enterprise.

Abstract: A method of intercorporate information-sharing between a product-manufacturing company and a product-inspecting company includes transmitting product quality and manufacturing number information from a product-manufacturing company's database storage device to a product-inspecting company's database storage device, inspecting a product, manufactured by the product-manufacturing company, by the product-inspecting company and storing an inspected result information of the product in the product-inspecting company's database storage device and transmitting the inspected result information from the product-inspecting company's database storage device to the product-manufacturing company's database storage device.