Patents by Inventor Kuninori Nakamura
Kuninori Nakamura has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 6847435Abstract: A laser distance measuring apparatus, for measuring the distance between objects existing in two directions at least as seen from the apparatus by using laser light, comprises two projectors for projecting laser beams along a specified projection axis toward each one of the objects, a photo detector for receiving reflected light of projection from each object, a distance measurement processor for measuring the distance from a reference point of the apparatus to each object on the basis of the reception signal to the projection by the photo detector, and a distance calculation processor for calculating the distance between the objects on the basis of the distance data measured by the distance measurement processor and the angle formed by two projection axes, in which the projection axis by one projector is variable in angle with respect to the other projector. Therefore, the distance between objects can be measured easily and at high precision by one distance measuring operation only.Type: GrantFiled: June 24, 2003Date of Patent: January 25, 2005Assignee: Matsushita Electric Works, Ltd.Inventors: Tatsuya Honda, Hiroshi Maeda, Takashi Kishida, Kazunari Yoshimura, Kazufumi Oogi, Hideshi Hamaguchi, Yoshimitsu Nakamura, Kuninori Nakamura
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Publication number: 20040252289Abstract: Distance measuring apparatus and method using a pulsed electromagnetic wave for making a high speed precise distance measurement between the apparatus and an object over a small distance. The electromagnetic wave is projected to an object from a single projector to provide a reflected electromagnetic wave from the object that is received by a single receiver also receiving a reference electromagnetic wave branched from the projected electromagnetic wave. The reference-wave reception time at the receiver is delayed by a delay time, so that a first time period between the electromagnetic wave projection time and the reference-wave reception time is longer than a second time period between the projection time and a reflection-wave reception time at the receiver. The distance is determined according to the delay time and the time difference between the reference-wave reception time and the reflection-wave reception time.Type: ApplicationFiled: May 29, 2003Publication date: December 16, 2004Applicant: MATSUSHITA ELECTRIC WORKS, LTD.Inventors: Tatsuya Honda, Kazunari Yoshimura, Kuninori Nakamura
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Patent number: 6829042Abstract: Distance measuring apparatus and method using a pulsed electromagnetic wave for making a high speed precise distance measurement between the apparatus and an object over a small distance. The electromagnetic wave is projected to an object from a single projector to provide a reflected electromagnetic wave from the object that is received by a single receiver also receiving a reference electromagnetic wave branched from the projected electromagnetic wave. The reference-wave reception time at the receiver is delayed by a delay time, so that a first time period between the electromagnetic wave projection time and the reference-wave reception time is longer than a second time period between the projection time and a reflection-wave reception time at the receiver. The distance is determined according to the delay time and the time difference between the reference-wave reception time and the reflection-wave reception time.Type: GrantFiled: May 29, 2003Date of Patent: December 7, 2004Assignee: Matsushita Electric Works, Ltd.Inventors: Tatsuya Honda, Kazunari Yoshimura, Kuninori Nakamura
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Publication number: 20040051860Abstract: A laser distance measuring apparatus, for measuring the distance between objects existing in two directions at least as seen from the apparatus by using laser light, comprises two projectors for projecting laser beams along a specified projection axis toward each one of the objects, a photo detector for receiving reflected light of projection from each object, a distance measurement processor for measuring the distance from a reference point of the apparatus to each object on the basis of the reception signal to the projection by the photo detector, and a distance calculation processor for calculating the distance between the objects on the basis of the distance data measured by the distance measurement processor and the angle formed by two projection axes, in which the projection axis by one projector is variable in angle with respect to the other projector. Therefore, the distance between objects can be measured easily and at high precision by one distance measuring operation only.Type: ApplicationFiled: June 24, 2003Publication date: March 18, 2004Applicant: Matsushita Electric Works, Ltd.Inventors: Tatsuya Honda, Hiroshi Maeda, Takashi Kishida, Kazunari Yoshimura, Kazufumi Oogi, Hideshi Hamaguchi, Yoshimitsu Nakamura, Kuninori Nakamura
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Patent number: 6061126Abstract: A detecting system for a surface form of an object is disclosed. The system comprises a light source section emitting a plurality of slit-like probe rays incidenting on a predetermined inspected area of an inspected object at predetermined pitches, an image pick-up section imaging reflected lights of the probe rays from the inspected area, the image pick-up section imaging the reflected lights from a direction different from a transmission axis of the light source section, the image pick-up section disposed so as to image the reflected light from the inspected area in a batch, and a computation section converting image data from the image pick-up section into data of surface height of the inspected object using a trigonometrical survey method.Type: GrantFiled: May 27, 1998Date of Patent: May 9, 2000Assignee: Matsushita Electric Works, Ltd.Inventors: Kazunari Yoshimura, Kuninori Nakamura, Yasuyuki Yuuki
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Patent number: 5946029Abstract: An image processing process disposes a television (TV) camera for observing a direct reflection of an incident light in a direction substantially coinciding with rolling direction of such detection object as a laminating substrate or the like, and observes a direct reflection component of the light with mutual positional relationship between the TV camera, object and a light source varied. Measuring thus sequentially the brightness with the angle of incident light varied, a lighting angle at which the brightness of reflection is the largest, that is, an incident angle of direct reflection light is obtained with respect to respective measuring points on the object, and an image representing a distribution of incident angles of the direction reflection light can be obtained by obtaining the incident angles of the direct reflection light with respect to the whole points on the detection object.Type: GrantFiled: June 2, 1997Date of Patent: August 31, 1999Assignee: Matsushita Electric Works, LtdInventors: Kazunari Yoshimura, Ryosuke Mitaka, Kuninori Nakamura, Yasuyuki Yuki
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Patent number: 5606174Abstract: An arrangement for detecting a shape of object to measure any displacement of its surface from a reference plane with a high resolution, and to improve to precision of the measurement.Type: GrantFiled: May 2, 1995Date of Patent: February 25, 1997Assignee: Matsushita Electric Works, Ltd.Inventors: Kazunari Yoshimura, Kuninori Nakamura, Katsuji Komaki
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Patent number: 5444537Abstract: A shape detecting arrangement allows a shape of an object to be very precisely detected at a high resolution, by projecting a plurality of light beams in mutually different ways onto an identical spot of the object substantially in an identical direction, forming on a position detector images of beams of the projected beams reflected back from the object, obtaining a ratio of intensity of the reflected beams by virtue of outputs from the position detector, obtaining positions of the respective reflected beams by virtue of variation component of the ratio of intensity with respect to a reference plane for detecting the position of the object, and finally obtaining height displacement of the respective positions obtained with respect to the reference plane on the basis of the positions and angles of incidence of the reflected beams into the position detector.Type: GrantFiled: October 20, 1993Date of Patent: August 22, 1995Assignee: Matsushita Electric Works, Ltd.Inventors: Kazunari Yoshimura, Kuninori Nakamura
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Patent number: 5416591Abstract: A light beam is emitted to a target point on a target, so that the reflected light beam from the target point forms an illumination spot on a array sensor. The array sensor comprises a plurality of light receiving elements. The receiving elements are divided into a plurality of repeating units consisting of the same number of the receiving elements. The receiving elements in each of the repeating units are assigned respectively to different indexes. The receiving elements having the same index are commonly coupled so as to provide a single output indicative of the same index when the reflected light beam hits any one of the receiving elements.Type: GrantFiled: June 22, 1993Date of Patent: May 16, 1995Assignee: Matsushita Electric Works, Ltd.Inventors: Kazunari Yoshimura, Kuninori Nakamura
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Patent number: 5111056Abstract: An optical measurement system for determination of an object profile includes a light source for emitting a light beam, light directing means for directing the light beam to scan a surface of the object surface and for directing a reflected light beam from the object surface in a direction angled from that of the light beam incident to the surface. The reflected light beam is received at position detecting means to provide position data with respect to the individual scanned points on the object surface. The position data is analyzed to measure a series of distances to the individual scanned points on the object surface to obtain from the measured distances height data of the individual scanned points and to determine an object profile along the scanned point on the object surface.Type: GrantFiled: April 12, 1991Date of Patent: May 5, 1992Assignee: Matsushita Electric Works, Ltd.Inventors: Kazunari Yoshimura, Kuninori Nakamura