Patents by Inventor Kunio Nishi
Kunio Nishi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
-
Patent number: 10377881Abstract: The invention provides a composition capable of providing a molded article that has excellent heat resistance and a small weight change against both fluorine plasma exposure and oxygen plasma exposure during a semiconductor manufacturing step. The composition contains a fluorine-containing polymer and a cage silsesquioxane having a specific structure.Type: GrantFiled: February 17, 2016Date of Patent: August 13, 2019Assignees: Akita University, DAIKIN INDUSTRIES, LTD.Inventors: Kazuya Matsumoto, Mitsutoshi Jikei, Kunio Nishi, Tsuyoshi Noguchi, Fumihiro Kamiya
-
Publication number: 20180030246Abstract: The invention provides a composition capable of providing a molded article that has excellent heat resistance and a small weight change against both fluorine plasma exposure and oxygen plasma exposure during a semiconductor manufacturing step. The composition contains a fluorine-containing polymer and a cage silsesquioxane having a specific structure.Type: ApplicationFiled: February 17, 2016Publication date: February 1, 2018Applicants: AKITA UNIVERSITY, DAIKIN INDUSTRIES, LTD.Inventors: Kazuya MATSUMOTO, Mitsutoshi JIKEI, Kunio NISHI, Tsuyoshi NOGUCHI, Fumihiro KAMIYA
-
Patent number: 9618461Abstract: An X-ray analysis apparatus for detecting, using an X-ray detector, X-rays given off by a sample when the sample is irradiated with X-rays, the X-ray analysis apparatus having replaceable components. The X-ray analysis apparatus comprises labels attached to the replaceable components and including symbols indicating the types of replaceable components, a camera for photographing the replaceable components and the labels, and CPU and image recognition software for specifying the types of replaceable components by calculation based on the symbols in the labels.Type: GrantFiled: October 10, 2013Date of Patent: April 11, 2017Assignee: RIGAKU CORPORATIONInventors: Takao Ohara, Kenji Wakasaya, Tetsuya Ozawa, Kunio Nishi
-
Patent number: 9006673Abstract: An X-ray analysis apparatus converts an X-ray intensity distribution of discrete data determined for each pixel, from a first plane where the distribution is known into a second plane where the distribution is not known. The X-ray analysis apparatus projects onto the second plane, a grid point which specifies a pixel on the first plane and an intermediate point between the grid points, as nodes, calculates an area of a region where a polygon expressing a projected pixel specified by the projected nodes overlaps with each pixel on the second plane, to thereby calculate an occupancy ratio of the polygon expressing the projected pixel to each pixel on the second plane and distributes X-ray intensity in the pixel on the first plane to the pixel on the second plane based on the occupancy ratio, to thereby convert the X-ray intensity distribution.Type: GrantFiled: May 30, 2013Date of Patent: April 14, 2015Assignee: Rigaku CorporationInventors: Kazuki Ito, Yoshinori Ueji, Koichi Kajiyoshi, Kunio Nishi
-
Publication number: 20140105368Abstract: An X-ray analysis apparatus for detecting, using an X-ray detector, X-rays given off by a sample when the sample is irradiated with X-rays, the X-ray analysis apparatus having replaceable components. The X-ray analysis apparatus comprises labels attached to the replaceable components and including symbols indicating the types of replaceable components, a camera for photographing the replaceable components and the labels, and CPU and image recognition software for specifying the types of replaceable components by calculation based on the symbols in the labels.Type: ApplicationFiled: October 10, 2013Publication date: April 17, 2014Applicant: Rigaku CorporationInventors: Takao OHARA, Kenji WAKASAYA, Tetsuya OZAWA, Kunio NISHI
-
Publication number: 20140021364Abstract: An X-ray analysis apparatus converts an X-ray intensity distribution of discrete data determined for each pixel, from a first plane where the distribution is known into a second plane where the distribution is not known. The X-ray analysis apparatus projects onto the second plane, a grid point which specifies a pixel on the first plane and an intermediate point between the grid points, as nodes, calculates an area of a region where a polygon expressing a projected pixel specified by the projected nodes overlaps with each pixel on the second plane, to thereby calculate an occupancy ratio of the polygon expressing the projected pixel to each pixel on the second plane and distributes X-ray intensity in the pixel on the first plane to the pixel on the second plane based on the occupancy ratio, to thereby convert the X-ray intensity distribution.Type: ApplicationFiled: May 30, 2013Publication date: January 23, 2014Inventors: Kazuki ITO, Yoshinori UEJI, Koichi KAJIYOSHI, Kunio NISHI
-
Patent number: 7711091Abstract: An X-ray analysis apparatus has information about a relationship between selection of a measurement type and a replacement work of optical parts and shows, on a screen of a display, graphical information about optical parts which should be changed, to make it easy for an operator to perform a preliminary work before measurement. When the operator selects one desired measurement type among a plurality of measurement types in a selection window, there is displayed on the display, depending on the selected measurement type, graphical information about necessary optical parts which should be newly installed and/or installed optical parts which should be removed. The operator looks at the operating instructions and then performs the replacement work. The graphical information may be: graphical indication of the installation locations of the optical parts; different pictorial expressions about the installation and the removal works; and graphical indication of the identification marks of the optical parts.Type: GrantFiled: July 23, 2007Date of Patent: May 4, 2010Assignee: Rigaku CorporationInventors: Akito Sasaki, Aya Kuribayashi, Keiichi Morikawa, Kunio Nishi, Takao Ohara, Toshiyuki Kato, Yuji Tsuji
-
Publication number: 20080056452Abstract: An X-ray analysis apparatus has information about a relationship between selection of a measurement type and a replacement work of optical parts and shows, on a screen of a display, graphical information about optical parts which should be changed, to make it easy for an operator to perform a preliminary work before measurement. When the operator selects one desired measurement type among a plurality of measurement types in a selection window, there is displayed on the display, depending on the selected measurement type, graphical information about necessary optical parts which should be newly installed and/or installed optical parts which should be removed. The operator looks at the operating instructions and then performs the replacement work. The graphical information may be: graphical indication of the installation locations of the optical parts; different pictorial expressions about the installation and the removal works; and graphical indication of the identification marks of the optical parts.Type: ApplicationFiled: July 23, 2007Publication date: March 6, 2008Applicant: Rigaku CorporationInventors: Akito Sasaki, Aya Kuribayashi, Keiichi Morikawa, Kunio Nishi, Takao Ohara, Toshiyuki Kato, Yuji Tsuji
-
Patent number: 7280667Abstract: A speaker system, preferably for a large-screen TV includes: a horizontal member including a left speaker, a right speaker and a center speaker and functioning as an enclosure for the left speaker, the right speaker and the center speaker, wherein each of the speakers includes at least one speaker element, and centers of the speaker elements of the speakers are all aligned along a single horizontal line; and a leg for holding the horizontal member in a horizontal position.Type: GrantFiled: September 22, 2004Date of Patent: October 9, 2007Assignee: Onkyo CorporationInventors: Hajime Furuno, Tomohiro Yuzawa, Kunio Nishi, Haruo Takenaka, Masami Kobayashi
-
Publication number: 20050238196Abstract: A speaker system, preferably for a large-screen TV, includes: a horizontal member including a left speaker, a right speaker and a center speaker and functioning as an enclosure for the left speaker, the right speaker and the center speaker, wherein each of the speakers includes at least one speaker element, and centers of the speaker elements of the speakers are all aligned along a single horizontal line; and a leg for holding the horizontal member in a horizontal position.Type: ApplicationFiled: September 22, 2004Publication date: October 27, 2005Inventors: Hajime Furuno, Tomohiro Yuzawa, Kunio Nishi, Haruo Takenaka, Masami Kobayashi
-
Patent number: 5274915Abstract: The invention has been achieved to solve the problem mentioned above. The object of the invention is to provide a novel method of manufacturing a printed wiring board by allowing manufacturers to provide a slit and perforations on the substrate without causing even the slightest crack to be generated in the course of manufacturing the printed wiring board.In the course of manufacturing printed wiring boards splittable across a slit and perforations,the method embodied by the invention executes those sequential steps including the following; provision of thickness adjusting film for specific regions adjacent to the slit and perforations; adjustment of the thickness of a main substrate and a splittable substrate which is splittable by means of the slit and the perforations; and formation of the slit and the perforations by applying a pressing and punching process.Type: GrantFiled: June 18, 1991Date of Patent: January 4, 1994Assignee: Nippon CMK Corp.Inventors: Yasunori Matsushima, Kunio Nishi
-
Patent number: 4045374Abstract: A voltage-dependent resistor (varistor) of the bulk type comprising a sintered body consisting essentially of, as a main constituent, ZnO and additives of various metal oxides and further containing an additive of at least one of Al.sub.2 O.sub.3, In.sub.2 O.sub.3 Ga.sub.2 O.sub.3 provide much improved characteristics, especially superior limiting voltage ratio, surge resistance and life of the varistor.Type: GrantFiled: October 10, 1975Date of Patent: August 30, 1977Assignee: Matsushita Electric Industrial Co., Ltd.Inventors: Masahiro Nagasawa, Yasuo Wakahata, Kensuke Kuchiba, Kunio Nishi, Hiroshi Abe