Patents by Inventor Kuniyuki MIYATA

Kuniyuki MIYATA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Antenna characteristic measuring system and antenna characteristic measuring method
    Patent number: 8823593
    Abstract: There is provided an antenna characteristic measuring system which includes a measuring point scanner to scan a measuring point, an antenna gain measuring device which measures an antenna gain of a measured antenna at a plurality of the measuring points, determines a reference point among the plurality of the measuring points, and obtains antenna gain difference values between the antenna gain at the reference point and each of the antenna gain at the plurality of the measuring points other than the reference point, and an antenna characteristic measuring device which measures a reference antenna characteristic of the measured antenna at the reference point and obtains an antenna characteristic of the measured antenna at each of the plurality of the measuring points other than the reference point by correcting the reference antenna characteristic with each of the difference values.
    Type: Grant
    Filed: July 27, 2011
    Date of Patent: September 2, 2014
    Assignee: Fujitsu Limited
    Inventor: Kuniyuki Miyata
  • ANTENNA CHARACTERISTIC MEASURING SYSTEM AND ANTENNA CHARACTERISTIC MEASURING METHOD
    Publication number: 20120038522
    Abstract: There is provided an antenna characteristic measuring system which includes a measuring point scanner to scan a measuring point, an antenna gain measuring device which measures an antenna gain of a measured antenna at a plurality of the measuring points, determines a reference point among the plurality of the measuring points, and obtains antenna gain difference values between the antenna gain at the reference point and each of the antenna gain at the plurality of the measuring points other than the reference point, and an antenna characteristic measuring device which measures a reference antenna characteristic of the measured antenna at the reference point and obtains an antenna characteristic of the measured antenna at each of the plurality of the measuring points other than the reference point by correcting the reference antenna characteristic with each of the difference values.
    Type: Application
    Filed: July 27, 2011
    Publication date: February 16, 2012
    Applicant: Fujitsu Limited
    Inventor: Kuniyuki MIYATA