Patents by Inventor Kuo-Chen Wen

Kuo-Chen Wen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Memory module testing/repairing method and device
    Publication number: 20030237031
    Abstract: A memory module testing/repairing method and device that uses standby memory cells inside a memory chip to replace any faulty memory addresses found inside the memory module. The method includes testing the memory module, registering any faulty memory addresses, and finally blocking the fixed address paths to the faulty memory addresses and replacing the faulty memory addresses with standby addresses by selectively blowing an electrical fuse.
    Type: Application
    Filed: October 7, 2002
    Publication date: December 25, 2003
    Inventors: Jui-Lin Hung, Kuo-Chen Wen