Patents by Inventor Kuo-Chien Hsu

Kuo-Chien Hsu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • High Voltage Semiconductor Device
    Publication number: 20220216308
    Abstract: The present disclosure provides a high voltage semiconductor device includes a substrate, a first well region, a second well region, a source, a drain, a first electrode structure and a second electrode structure. The first well region and the second well region are disposed in the substrate, and which includes a first conductive type and a second conductive type which are complementary with each other. The source and the drain are respectively disposed within the first well region and the second well region. The first electrode structure and the second electrode structure are both disposed on the substrate, and the distance between the top surface of an electrode of the first electrode structure and the top surface of the substrate includes a first height and a second height which are different from each other.
    Type: Application
    Filed: January 4, 2021
    Publication date: July 7, 2022
    Inventors: Chung-Ren Lao, Kuan-I Ho, Kuo-Chien Hsu, Che-Hua Chang, Hsiao-Ying Yang, Chih-Cherng Liao
  • High voltage semiconductor device
    Patent number: 11374096
    Abstract: The present disclosure provides a high voltage semiconductor device includes a substrate, a first well region, a second well region, a source, a drain, a first electrode structure and a second electrode structure. The first well region and the second well region are disposed in the substrate, and which includes a first conductive type and a second conductive type which are complementary with each other. The source and the drain are respectively disposed within the first well region and the second well region. The first electrode structure and the second electrode structure are both disposed on the substrate, and the distance between the top surface of an electrode of the first electrode structure and the top surface of the substrate includes a first height and a second height which are different from each other.
    Type: Grant
    Filed: January 4, 2021
    Date of Patent: June 28, 2022
    Assignee: Vanguard International Semiconductor Corporation
    Inventors: Chung-Ren Lao, Kuan-I Ho, Kuo-Chien Hsu, Che-Hua Chang, Hsiao-Ying Yang, Chih-Cherng Liao