Abstract: A test interface card includes: a first specification bus adapted for coupling between a first specification interface controller of a device under test (DUT) and a signal converting interface card, and for transmitting a first test signal that is outputted by the first specification interface controller to the signal converting interface card for processing; a second specification bus adapted for coupling between the signal converting interface card and a storage module of the DUT, and for transmitting a processed signal that is outputted by the signal converting interface card as a result of processing the first test signal to the storage module; and a third specification bus adapted for forming a closed circuit with a second specification interface controller of the DUT, and for transmitting a second test signal that is outputted by the second specification interface controller back to the second specification interface controller.