Abstract: A package structure and method for fabricating the same are provided. The package structure includes a substrate, a semiconductor package, a side dam, a flexible thermal conductor and a first heat sink. The substrate has a first board surface. The semiconductor package has an upper surface, a lower surface and a side surface, and the semiconductor package is disposed on the first board surface. The side dam is formed on the first board to surround a first accommodating space for accommodating the semiconductor package. The side dam has a height that is higher than a height of the upper surface. The flexible heat conductor is formed on the upper surface. The first heat sink is disposed on the side dam. The first heat sink, the side dam and the semiconductor package jointly define a second accommodation space to confine the flexible heat conductor.

Abstract: A package structure and a method for fabricating the same are provided. The package structure includes a substrate, a semiconductor package and an adhesive body. The substrate has a first board surface and a second board surface. The semiconductor package has an upper surface and a lower surface, is disposed on the first board surface and electrically connected to the substrate through pins, and has a first vertical projection on the first board surface. An adhesive groove is disposed on the first board surface and is located in at least one portion of the first vertical projection and a periphery of the first vertical projection. The adhesive body is disposed in the adhesive groove, and protrudes to contact the lower surface, so as to fix the semiconductor package. The adhesive groove does not overlap with the pins, and the adhesive body does not contact the pins.

Abstract: A package structure and a method for fabricating the same are provided. The package structure includes a substrate, a semiconductor package, a first adhesive and a second adhesive. The substrate has a first board surface and a second board surface, and a second region surrounds a first region on the first board surface. The semiconductor package has an upper surface, a lower surface, and a side surface, and is disposed on the first board surface. The first adhesive is formed on the first board surface, in the second region and in a portion of the first region adjacent to the second region. The second adhesive is formed between the side surface and the first adhesive and contacts the side surface and the first adhesive, and the first adhesive and the second adhesive together form a pier adhesive.

Abstract: A semiconductor wafer is provided, which comprises at least a first die and a second die, which are grouped into different regions according to a wafer map. A saw and assembly process is performed, which packages the first dies and the second dies into a first packaged unit and a second packaged unit, respectively. A first burn-in test on the first packaged unit is performed for a first testing period to eliminate dies that fail at infancy. A second burn-in test on the second package unit is performed for a second time period to eliminate dies that fail at infancy. The first time period is shorter than the second time period.