Abstract: An electrode controls transmittance of a blocking layer over a photodiode of a pixel sensor (e.g., a photodiode of a small pixel detector) by changing oxidation of a metal material included in the blocking layer. By using the electrode to adjust transmittance of the blocking layer, pixel sensors for different uses and/or products may be produced using a single manufacturing process. As a result, power and processing resources are conserved that otherwise would have been expended in switching manufacturing processes. Additionally, production time is decreased (e.g., by eliminating downtime that would otherwise have been used to reconfigure fabrication machines.

Abstract: A screen protection device for protecting a display screen of an electronic apparatus includes: a tempered glass sheet, a mask layer, an adhesive layer, and a two-part Epoxy glue layer. The mask layer is positioned on the tempered glass sheet and defines a transparent region for the screen protection device. The adhesive layer is positioned on at least a portion of the mask layer and surrounds the transparent region, and is utilized for detachably attaching to a target region on a surface of the hand-held electronic apparatus. The two-part Epoxy glue layer is positioned on the tempered glass sheet and covers the transparent region. When the adhesive layer is attached to the target region, the two-part Epoxy glue layer is positioned between the tempered glass sheet and the display screen, directly contacts with the display screen, and detachably attaches to the display screen.

Abstract: A screen protection device for protecting a display screen of an electronic apparatus includes: a tempered glass sheet, a mask layer, an optical clear adhesive layer, and an adhesive layer. The mask layer is positioned on the tempered glass sheet and defines a transparent region for the screen protection device. The optical clear adhesive layer is positioned on the tempered glass sheet and covers the transparent region, but does not cover the mask layer. The adhesive layer is positioned on the mask layer and the optical clear adhesive layer, and is utilized for detachably attaching to the display screen of the electronic apparatus. A thickness of the optical clear adhesive layer is at least 80% of a thickness of the mask layer.

Abstract: A screen protection device for protecting a display screen of an electronic apparatus includes: a plastic film, a mask layer, a UV cured layer, and an adhesive layer. The mask layer is positioned on the plastic film and defines a transparent region for the screen protection device. The UV cured layer is positioned on the plastic film and covers the transparent region, but does not cover the mask layer. The adhesive layer is positioned on the mask layer and the UV cured layer, and is utilized for detachably attaching to the display screen of the electronic apparatus. A thickness of the UV cured layer is at least 80% of a thickness of the mask layer.

Abstract: The present invention discloses a diagonal testing method for flash memories. The testing method regards the flash memory as several squares, and executes in the direction from top to bottom and from left to right. Each square is provided with a first diagonal in ?45 degrees from the upper left to the lower right, and a second diagonal in +45 degrees from the lower left to the upper right. The present invention is to program the cells in the first diagonal or the second diagonal, and then read the cells except the first diagonal or the second diagonal; or, program the cells except the first diagonal or the second diagonal, and then read the cells in the first diagonal or the second diagonal so as to detect the disturb fault in the flash memories and normal memory fault models.

Abstract: A method and system of fault patterns oriented defect diagnosis for memories can analyze and recognize fault patterns and failure patterns after Memory Error Catches and Analyses (MECA) are done. The existent fault patterns are compared with a pre-simulated and grouped defect dictionary that defines possible defects of different fault patterns, and the defects of memories caused from their manufacturing process or circuit layout can be detected.

Abstract: The present invention discloses a diagonal testing method for flash memories. The testing method regards the flash memory as several squares, and executes in the direction from top to bottom and from left to right. Each square is provided with a first diagonal in −45 degrees from the upper left to the lower right, and a second diagonal in +45 degrees from the lower left to the upper right. The present invention is to program the cells in the first diagonal or the second diagonal, and then read the cells except the first diagonal or the second diagonal; or, program the cells except the first diagonal or the second diagonal, and then read the cells in the first diagonal or the second diagonal so as to detect the disturb fault in the flash memories and normal memory fault models.