Abstract: A method of designing an integrated circuit includes performing a pre-layout simulation of the integrated circuit. The pre-layout simulation is performed using a netlist generated from a process design kit (PDK) file. The PDK file includes a plurality of device model cards that are assigned to plurality of devices. The plurality of devices include a first device having at least one parasitic diode that is associated with at least one isolation well, the PDK file including information of the at least one parasitic diode. A design layout of the integrated circuit corresponding to a result of the pre-layout simulation is generated.

Abstract: A method of designing an integrated circuit includes performing a pre-layout simulation of the integrated circuit. The pre-layout simulation is performed using a netlist generated from a process design kit (PDK) file. The PDK file includes a plurality of device model cards that are assigned to plurality of devices. The plurality of devices include a first device having at least one parasitic diode that is associated with at least one isolation well, the PDK file including information of the at least one parasitic diode. A design layout of the integrated circuit corresponding to a result of the pre-layout simulation is generated.

Abstract: A testline structure made for integrated circuit tests is presented. The structure includes an array of testline pads formed in the scribe line area or integrated circuit die area on a semiconductor substrate, a plurality of test devices formed under the pads area, and a select circuit selectively connecting one of the test devices. The testline structure of this invention enables access to a large number of test devices through the same number of pads as on a conventional testline and can be employed to conduct parametric, reliability, and functional tests on the same. A source measurement unit (SMU) in a conventional integrated circuit tester is employed to sense and force predetermined test conditions on the test device terminals and conduct accurate Kelvin tests on the selected device. A method of using this testline structure is also presented.

Abstract: A testline structure made for integrated circuit tests is presented. The structure includes an array of testline pads formed in the scribe line area or integrated circuit die area on a semiconductor substrate, a plurality of test devices formed under the pads area, and a select circuit selectively connecting one of the test devices. The testline structure of this invention enables access to a large number of test devices through the same number of pads as on a conventional testline and can be employed to conduct parametric, reliability, and functional tests on the same. A source measurement unit (SMU) in a conventional integrated circuit tester is employed to sense and force predetermined test conditions on the test device terminals and conduct accurate Kelvin tests on the selected device. A method of using this testline structure is also presented.

Abstract: A network based integrated circuit testline generating system and method of using the same is described. The system includes a user interface for generating and submitting requests which specify types and configurations of needed testlines for device parametric test. A testline generator receives the requests and creates a layout data base which includes layout information of needed testlines.

Abstract: An I/O circuit between a low voltage circuit and a high voltage circuit includes a switching device, a native device and a gate control logic circuit. The switching device provides an output signal to the high voltage circuit in response to a data input signal received from the low voltage circuit. The native device passes the data input signal to control an on or off state of the switching device. The gate control logic circuit operates in an output disabled mode and an output enabled mode. In the output disabled mode, the gate control logic circuit disables the native device for preventing a leakage current passing therethrough. In the output enabled mode, the gate control logic circuit enables the native device to pass the data input signal through without a substantial voltage drop, thereby enhancing a switching speed of the switching device.

Abstract: An I/O circuit between a low voltage circuit and a high voltage circuit includes a switching device, a native device and a gate control logic circuit. The switching device provides an output signal to the high voltage circuit in response to a data input signal received from the low voltage circuit. The native device passes the data input signal to control an on or off state of the switching device. The gate control logic circuit operates in an output disabled mode and an output enabled mode. In the output disabled mode, the gate control logic circuit disables the native device for preventing a leakage current passing therethrough. In the output enabled mode, the gate control logic circuit enables the native device to pass the data input signal through without a substantial voltage drop, thereby enhancing a switching speed of the switching device.