Patents by Inventor Kuo-Yi Liu
Kuo-Yi Liu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240113071Abstract: An integrated circuit package including electrically floating metal lines and a method of forming are provided. The integrated circuit package may include integrated circuit dies, an encapsulant around the integrated circuit dies, a redistribution structure on the encapsulant, a first electrically floating metal line disposed on the redistribution structure, a first electrical component connected to the redistribution structure, and an underfill between the first electrical component and the redistribution structure. A first opening in the underfill may expose a top surface of the first electrically floating metal line.Type: ApplicationFiled: January 5, 2023Publication date: April 4, 2024Inventors: Chung-Shi Liu, Mao-Yen Chang, Yu-Chia Lai, Kuo-Lung Pan, Hao-Yi Tsai, Ching-Hua Hsieh, Hsiu-Jen Lin, Po-Yuan Teng, Cheng-Chieh Wu, Jen-Chun Liao
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Publication number: 20220059415Abstract: Some embodiments of the present disclosure relate to a processing tool. The tool includes a housing enclosing a processing chamber, and an input/output port configured to pass a wafer through the housing into and out of the processing chamber. A back-side macro-inspection system is arranged within the processing chamber and is configured to image a back side of the wafer. A front-side macro-inspection system is arranged within the processing chamber and is configured to image a front side of the wafer according to a first image resolution. A front-side micro-inspection system is arranged within the processing chamber and is configured to image the front side of the wafer according to a second image resolution which is higher than the first image resolution.Type: ApplicationFiled: November 4, 2021Publication date: February 24, 2022Inventors: Chia-Han Lin, Chien-Fa Lee, Hsu-Shui Liu, Jiun-Rong Pai, Sheng-Hsiang Chuang, Surendra Kumar Soni, Shou-Wen Kuo, Wu-An Weng, Gary Tsai, Chien-Ko Liao, Ya Hsun Hsueh, Becky Liao, Ethan Yu, Ming-Chi Tsai, Kuo-Yi Liu
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Patent number: 11229320Abstract: A food heating device with multilayer shelf includes a base, one or more shelf support, a first side wall member, a second side wall member, a bottom cover member, a middle cover member, and a top lamp bracket. There are two or more layers of heating rollers between the first side wall member and the second side wall member. The bottom cover member and the middle cover member are disposed above bottom heating rollers and middle heating rollers. Each of the cover members at different layers has a cover body. The cover body covers foods on the heating rollers. In addition, one or more lamp bodies can be provided. The food heating device with multilayer shelf is capable of increasing space for exhibition of foods and also increasing overall brightness by adding the lamp bodies.Type: GrantFiled: October 30, 2018Date of Patent: January 25, 2022Assignee: PRESIDENT CHAIN STORE CORP.Inventors: Hung-Wei Chen, Hsiu-Chuan Chang, Kuo-Yi Liu, Li-Ping Yang, Chun-Ling Tai
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Patent number: 11171065Abstract: Some embodiments of the present disclosure relate to a processing tool. The tool includes a housing enclosing a processing chamber, and an input/output port configured to pass a wafer through the housing into and out of the processing chamber. A back-side macro-inspection system is arranged within the processing chamber and is configured to image a back side of the wafer. A front-side macro-inspection system is arranged within the processing chamber and is configured to image a front side of the wafer according to a first image resolution. A front-side micro-inspection system is arranged within the processing chamber and is configured to image the front side of the wafer according to a second image resolution which is higher than the first image resolution.Type: GrantFiled: October 14, 2019Date of Patent: November 9, 2021Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.Inventors: Chia-Han Lin, Chien-Fa Lee, Hsu-Shui Liu, Jiun-Rong Pai, Sheng-Hsiang Chuang, Surendra Kumar Soni, Shou-Wen Kuo, Wu-An Weng, Gary Tsai, Chien-Ko Liao, Ya Hsun Hsueh, Becky Liao, Ethan Yu, Ming-Chi Tsai, Kuo-Yi Liu
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Publication number: 20200043812Abstract: Some embodiments of the present disclosure relate to a processing tool. The tool includes a housing enclosing a processing chamber, and an input/output port configured to pass a wafer through the housing into and out of the processing chamber. A back-side macro-inspection system is arranged within the processing chamber and is configured to image a back side of the wafer. A front-side macro-inspection system is arranged within the processing chamber and is configured to image a front side of the wafer according to a first image resolution. A front-side micro-inspection system is arranged within the processing chamber and is configured to image the front side of the wafer according to a second image resolution which is higher than the first image resolution.Type: ApplicationFiled: October 14, 2019Publication date: February 6, 2020Inventors: Chia-Han Lin, Chien-Fa Lee, Hsu-Shui Liu, Jiun-Rong Pai, Sheng-Hsiang Chuang, Surendra Kumar Soni, Shou-Wen Kuo, Wu-An Weng, Gary Tsai, Chien-Ko Liao, Ya Hsun Hsueh, Becky Liao, Ethan Yu, Ming-Chi Tsai, Kuo-Yi Liu
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Patent number: 10490463Abstract: Some embodiments of the present disclosure relate to a processing tool. The tool includes a housing enclosing a processing chamber, and an input/output port configured to pass a wafer through the housing into and out of the processing chamber. A back-side macro-inspection system is arranged within the processing chamber and is configured to image a back side of the wafer. A front-side macro-inspection system is arranged within the processing chamber and is configured to image a front side of the wafer according to a first image resolution. A front-side micro-inspection system is arranged within the processing chamber and is configured to image the front side of the wafer according to a second image resolution which is higher than the first image resolution.Type: GrantFiled: February 26, 2018Date of Patent: November 26, 2019Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.Inventors: Chia-Han Lin, Chien-Fa Lee, Hsu-Shui Liu, Jiun-Rong Pai, Sheng-Hsiang Chuang, Surendra Kumar Soni, Shou-Wen Kuo, Wu-An Weng, Gary Tsai, Chien-Ko Liao, Ya Hsun Hsueh, Becky Liao, Ethan Yu, Ming-Chi Tsai, Kuo-Yi Liu
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Publication number: 20190208956Abstract: A food heating device with multilayer shelf includes a base, one or more shelf support, a first side wall member, a second side wall member, a bottom cover member, a middle cover member, and a top lamp bracket. There are two or more layers of heating rollers between the first side wall member and the second side wall member. The bottom cover member and the middle cover member are disposed above bottom heating rollers and middle heating rollers. Each of the cover members at different layers has a cover body. The cover body covers foods on the heating rollers. In addition, one or more lamp bodies can be provided. The food heating device with multilayer shelf is capable of increasing space for exhibition of foods and also increasing overall brightness by adding the lamp bodies.Type: ApplicationFiled: October 30, 2018Publication date: July 11, 2019Inventors: Hung-Wei Chen, Hsiu-Chuan Chang, Kuo-Yi Liu, Li-Ping Yang, Chun-Ling Tai
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Publication number: 20190035696Abstract: Some embodiments of the present disclosure relate to a processing tool. The tool includes a housing enclosing a processing chamber, and an input/output port configured to pass a wafer through the housing into and out of the processing chamber. A back-side macro-inspection system is arranged within the processing chamber and is configured to image a back side of the wafer. A front-side macro-inspection system is arranged within the processing chamber and is configured to image a front side of the wafer according to a first image resolution. A front-side micro-inspection system is arranged within the processing chamber and is configured to image the front side of the wafer according to a second image resolution which is higher than the first image resolution.Type: ApplicationFiled: February 26, 2018Publication date: January 31, 2019Inventors: Chia-Han Lin, Chien-Fa Lee, Hsu-Shui Liu, Jiun-Rong Pai, Sheng-Hsiang Chuang, Surendra Kumar Soni, Shou-Wen Kuo, Wu-An Weng, Gary Tsai, Chien-Ko Liao, Ya Hsun Hsueh, Becky Liao, Ethan Yu, Ming-Chi Tsai, Kuo-Yi Liu
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Patent number: D887768Type: GrantFiled: July 11, 2018Date of Patent: June 23, 2020Assignee: PRESIDENT CHAIN STORE CORP.Inventors: Hung-Wei Chen, Hsiu-Chuan Chang, Kuo-Yi Liu, Li-Ping Yang, Chun-Ling Tai