Patents by Inventor Kuong H. Hii

Kuong H. Hii has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Apparatus and method for subarray testing in dynamic random access memories using a built-in-self-test unit
    Patent number: 5923599
    Abstract: In a built-in-self-test (BIST) unit or a memory unit, an address limits unit is provided which, prior to initiation of the test procedures, has start and stop addresses stored therein. Upon the initiation of the test procedures by the BIST unit, the start address of the address limits unit is transferred to the address counters units wherein the start address serves as the initial test address. The stop address is transferred to the address counters unit wherein the stop address will be compared with the current address. When the stop address and the current address match, the test procedure being executed by the BIST unit will be terminated. In this manner, any subarray in the memory unit can be selected for test.
    Type: Grant
    Filed: April 29, 1997
    Date of Patent: July 13, 1999
    Assignee: Texas Instruments Incorporated
    Inventors: Kuong H. Hii, Danny R. Cline, Theo J. Powell, Wah K. Loh