Patents by Inventor Kuo-Pei Lu

Kuo-Pei Lu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • TEST KEY AND SEMICONDUCTOR DIE INCLUDING THE SAME
    Publication number: 20230290694
    Abstract: A test key configured to measure resistance of a through semiconductor via in a semiconductor substrate is provided. The test key includes a first resistor, a first conductor, a first probe pad, a second conductor, a second probe pad, a third conductor, a third probe pad, a fourth conductor, and a fourth probe pad. The first probe pad is electrically connected to a first end of the through semiconductor via by the first resistor and the first conductor. The second probe pad is electrically connected to the first end of the through semiconductor via by the second conductor. The third probe pad is electrically connected to a second end of the through semiconductor via by the third conductor. The fourth probe pad is electrically connected to the second end of the through semiconductor via by the fourth conductor.
    Type: Application
    Filed: March 14, 2022
    Publication date: September 14, 2023
    Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Tse-Pan Yang, Wei Lee, Kuo-Pei Lu, Jen-Yuan Chang
  • Method and circuit for extracting current-voltage characteristics of device
    Patent number: 7362122
    Abstract: A method and a circuit for extracting current-voltage characteristics employ two pulse signals with different duty cycles into a device to be measured in order to extracting current-voltage characteristics of the device to be measured. The present invention may reduce the self-heating effect of the device to be measured and increase the measurable range of the device to be measured.
    Type: Grant
    Filed: July 8, 2005
    Date of Patent: April 22, 2008
    Assignee: MACRONIX International Co., Ltd.
    Inventors: Wei-Cheng Lin, Kuo-Pei Lu, Yao-Wen Chang
  • Method and circuit for extracting current-voltage characteristics of device
    Publication number: 20070007931
    Abstract: A method and a circuit for extracting current-voltage characteristics employ two pulse signals with different duty cycles into a device to be measured in order to extracting current-voltage characteristics of the device to be measured. The present invention may reduce the self-heating effect of the device to be measured and increase the measurable range of the device to be measured.
    Type: Application
    Filed: July 8, 2005
    Publication date: January 11, 2007
    Inventors: Wei-Cheng Lin, Kuo-Pei Lu, Yao-Wen Chang