Patents by Inventor Kurt B. Gusinow

Kurt B. Gusinow has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Semiconductor tester for testing devices with embedded memory
    Patent number: 5923675
    Abstract: A semiconductor tester with features to facilitate testing of embedded memories. The circuitry allows tests to be generated algorithmically, but can be used in conjunction with scan test structures of semiconductor devices. Programming and debug time can be significantly reduced. The tester includes an algorithmic pattern generator that can generate a pattern for testing a memory. The tester also includes serializer circuits coupled to the algorithmic pattern generators that can convert the test pattern generated by the algorithmic pattern generator into one or more serial bit streams useful for scan testing an embedded memory.
    Type: Grant
    Filed: February 20, 1997
    Date of Patent: July 13, 1999
    Assignee: Teradyne, Inc.
    Inventors: Benjamin J. Brown, John F. Donaldson, Kurt B. Gusinow