Patents by Inventor Kurt Mandeville

Kurt Mandeville has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6907557
    Abstract: A system and method for testing a group of related products or devices. According to one embodiment, the user may first manually create a base test sequence, and child test sequences may then be created based on the base test sequence. The user may include various steps in the base test sequence, such that the base test sequence includes steps that need to be common to most or all of the child test sequences. The user may also configure parameters or properties for each step in the base test sequence, such that the parameter configuration is what is required for most or all of the child test sequences. Initial child test sequences may then be automatically created as instances of the base test sequence. The user may then manually edit the instances of the base test sequence to produce the desired child test sequences, such that each child test sequence is configured to appropriately test a particular product to which the child test sequence corresponds.
    Type: Grant
    Filed: February 22, 2001
    Date of Patent: June 14, 2005
    Assignee: National Instruments Corporation
    Inventors: Hjalmar Perez, Kurt Mandeville, Paul Packebush
  • Publication number: 20020116666
    Abstract: A system and method for testing a group of related products or devices. According to one embodiment, the user may first manually create a base test sequence, and child test sequences may then be created based on the base test sequence. The user may include various steps in the base test sequence, such that the base test sequence includes steps that need to be common to most or all of the child test sequences. The user may also configure parameters or properties for each step in the base test sequence, such that the parameter configuration is what is required for most or all of the child test sequences. Initial child test sequences may then be automatically created as instances of the base test sequence. The user may then manually edit the instances of the base test sequence to produce the desired child test sequences, such that each child test sequence is configured to appropriately test a particular product to which the child test sequence corresponds.
    Type: Application
    Filed: February 22, 2001
    Publication date: August 22, 2002
    Inventors: Hjalmar Perez, Kurt Mandeville, Paul Packebush