Patents by Inventor Kurt W. Kolasinski

Kurt W. Kolasinski has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20210035811
    Abstract: An electroless etching process. The process produces nanostructured semiconductors in which an oxidant (Ox1) is deposited as a metal on a semiconductor surface and used as a catalytic agent to facilitate reaction between a semiconductor and a second oxidant (Ox2). Ox2 is used to initiate etching by injecting holes into the semiconductor valence band as facilitated by the catalytic action of the deposited metal. The extent of reaction is controlled by the amount of Ox2 added; the reaction rate is controlled by the injection rate of Ox2. The process produces high specific surface area and/or hierarchically structured porous Si with higher and controllable yield. In addition, the ability is demonstrated to vary the pore size distribution of mesoporous silicon including producing hierarchically structured mesoporous silicon with more than one peak in the pore size distribution. In principle, the process applies to any semiconductor onto which metal can be deposited galvanically.
    Type: Application
    Filed: July 31, 2020
    Publication date: February 4, 2021
    Applicant: West Chester University
    Inventors: Kurt W. Kolasinski, Bret Unger
  • Patent number: 10590562
    Abstract: A regenerative electroless etching process produces nanostructured semiconductors in which an oxidant (Ox1) is used as a catalytic agent to facilitate reaction between a semiconductor and a second oxidant (Ox2) that would be unreactive (or slowly reactive compared to Ox1) in the primary reaction. Ox2 is used to regenerate Ox1, which can initiate etching by injecting holes into the semiconductor valence band. The extent of reaction is controlled by the amount of Ox2 added; the reaction rate, by the injection rate of Ox2. This general strategy is demonstrated specifically to produce highly luminescent nanocrystalline porous, amorphous pillared, and hierarchical porous silicon from the reaction of V2O5 in HF(aq) as Ox1 and H2O2(aq) as Ox2 with a silicon-comprising substrate. The process can be performed on silicon-comprising substrates of arbitrary size and shape including powders, reclaimed shards, wafers, pillared silicon, porous silicon, and silicon nanowires.
    Type: Grant
    Filed: October 29, 2018
    Date of Patent: March 17, 2020
    Assignee: West Chester University
    Inventors: Kurt W Kolasinski, Jarno Salonen, Ermei Makila
  • Publication number: 20190169766
    Abstract: A regenerative electroless etching process produces nanostructured semiconductors in which an oxidant (Ox1) is used as a catalytic agent to facilitate reaction between a semiconductor and a second oxidant (Ox2) that would be unreactive (or slowly reactive compared to Ox1) in the primary reaction. Ox2 is used to regenerate Ox1, which can initiate etching by injecting holes into the semiconductor valence band. The extent of reaction is controlled by the amount of Ox2 added; the reaction rate, by the injection rate of Ox2. This general strategy is demonstrated specifically to produce highly luminescent nanocrystalline porous, amorphous pillared, and hierarchical porous silicon from the reaction of V2O5 in HF(aq) as Ox1 and H2O2(aq) as Ox2 with a silicon-comprising substrate. The process can be performed on silicon-comprising substrates of arbitrary size and shape including powders, reclaimed shards, wafers, pillared silicon, porous silicon, and silicon nanowires.
    Type: Application
    Filed: October 29, 2018
    Publication date: June 6, 2019
    Applicant: West Chester University
    Inventors: Kurt W. Kolasinski, Jarno Salonen, Ermei Makila