Patents by Inventor Kusuo Ueno

Kusuo Ueno has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10823688
    Abstract: The radiation detection device is equipped with a sample holding unit; an irradiation unit for irradiating a sample held on the sample holding unit with radiations; a detection unit for detecting the radiations generated from the sample; an illumination unit for irradiating the sample with light; an observation unit for observing the sample; and a light transmitting plate for allowing the light from the illumination unit, with which the sample held on the sample holding unit is irradiated, to be transmitted therethrough. The light transmitting plate is disposed at a position between the sample holding unit and the irradiation unit, and has an opening portion for allowing the radiations from the irradiation unit, with which the sample is irradiated, to pass therethrough and a scattering portion for scattering light.
    Type: Grant
    Filed: November 28, 2017
    Date of Patent: November 3, 2020
    Assignee: HORIBA, LTD.
    Inventors: Hisashi Akiyama, Kusuo Ueno, Takeshi Akamatsu
  • Publication number: 20190331618
    Abstract: The radiation detection device according to the present invention comprises: a sample holding unit; an irradiation unit configured to irradiate a sample held by the sample holding unit with radioactive rays; a detection unit configured to detect radioactive rays generated from the sample; a distance calculation unit configured to calculate a distance from a predetermined base point to an irradiated part, which is to be irradiated with radioactive rays, of the sample held by the sample holding unit; a size specification unit configured to specify a size of the irradiated part on the sample based on the calculated distance; and a display unit configured to display the specified size of the irradiated part.
    Type: Application
    Filed: November 27, 2017
    Publication date: October 31, 2019
    Inventors: Azusa TAROURA, Kusuo UENO
  • Publication number: 20190317032
    Abstract: The radiation detection device is equipped with a sample holding unit; an irradiation unit for irradiating a sample held on the sample holding unit with radiations; a detection unit for detecting the radiations generated from the sample; an illumination unit for irradiating the sample with light; an observation unit for observing the sample; and a light transmitting plate for allowing the light from the illumination unit, with which the sample held on the sample holding unit is irradiated, to be transmitted therethrough. The light transmitting plate is disposed at a position between the sample holding unit and the irradiation unit, and has an opening portion for allowing the radiations from the irradiation unit, with which the sample is irradiated, to pass therethrough and a scattering portion for scattering light.
    Type: Application
    Filed: November 28, 2017
    Publication date: October 17, 2019
    Inventors: Hisashi AKIYAMA, Kusuo UENO, Takeshi AKAMATSU
  • Patent number: 9869615
    Abstract: A sample dispersion device capable of preparing a measurement sample in the most suitable dispersion state without repreparing the measurement sample many times, is one that by introducing sample particles into a container and injecting the sample particles in the container using a pressure difference, disperses sample particles onto a holding member provided in a container to make the holding member hold the sample particles. The holding member has a holding surface made to hold the sample particles; and the holding surface has multiple portions having mutually different tilt angles.
    Type: Grant
    Filed: April 14, 2015
    Date of Patent: January 16, 2018
    Assignee: HORIBA, LTD.
    Inventors: Kusuo Ueno, Tomoya Shimizu
  • Publication number: 20170045426
    Abstract: A main object is to provide a sample dispersion device capable of preparing a measurement sample in the most suitable dispersion state without repreparing the measurement sample many times, and the sample dispersion device is one 1 that that by introducing sample particles into a container 2 and injecting the sample particles in the container 2 using a pressure difference, disperses sample particles onto a holding member 9 provided in a container 2 to make the holding member 9 hold the sample particles, in which: the holding member 9 has a holding surface 11 made to hold the sample particles; and the holding surface 11 has multiple portions having mutually different tilt angles.
    Type: Application
    Filed: April 14, 2015
    Publication date: February 16, 2017
    Applicant: HORIBA, Ltd.
    Inventors: Kusuo UENO, Tomoya SHIMIZU
  • Publication number: 20090278045
    Abstract: The invention provides a substrate-examining apparatus which is capable of measuring the detailed shape of a contact hole and the state of a hole bottom. A substrate-examining apparatus includes an electron source (21) for generating an electron beam, a deflector (22) for irradiating a surface of a substrate to be examined with the electron beam from the electron source so as to scan the electron beam, and substrate current detecting means for detecting a current caused to flow from the substrate to a reference potential portion of the apparatus.
    Type: Application
    Filed: August 29, 2008
    Publication date: November 12, 2009
    Inventors: Kusuo Ueno, Masuo Anma
  • Publication number: 20070085004
    Abstract: The invention provides a substrate-examining apparatus which is capable of measuring the detailed shape of a contact hole and the state of a hole bottom. A substrate-examining apparatus includes an electron source (21) for generating an electron beam, a deflector (22) for irradiating a surface of a substrate to be examined with the electron beam from the electron source so as to scan the electron beam, and substrate current detecting means for detecting a current caused to flow from the substrate to a reference potential portion of the apparatus.
    Type: Application
    Filed: March 28, 2006
    Publication date: April 19, 2007
    Inventors: Kusuo Ueno, Masuo Anma