Patents by Inventor Kusuo Ueno
Kusuo Ueno has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
-
Patent number: 11486800Abstract: A sample dispersing device contains a container inside of which a dispersal chamber where a power sample is dispersed is formed, and an introducing mechanism that introduces a gas containing the powder sample from the outside of the container into the dispersal chamber based on a pressure difference between the inside and the outside of the container. The introducing mechanism contains an introduction pipe where the gas containing the powder sample flows, and several restrictors arranged in the introduction pipe.Type: GrantFiled: September 10, 2018Date of Patent: November 1, 2022Assignee: HORIBA, LTD.Inventors: Makoto Nagura, Kazuma Aoyagi, Akihiro Minami, Hiroshi Tateno, Tomoya Shimizu, Kusuo Ueno
-
Publication number: 20210356365Abstract: The present claimed invention shortens cleaning time of a container of a sample dispersing device and reduces variation of a cleaning state. The present claimed invention is a sample dispersing device 100 that disperses a powder sample (W) on an upper surface of an analytical member 10 and that comprises a container 2 that has a placing surface 2x on which the analytical member 10 is placed, an introducing mechanism 3 that introduces the powder sample (W) into inside of the container 2, and a covering member 4 that covers an inner surface of the container 2 and that can be attached to and removed from the container 2.Type: ApplicationFiled: May 12, 2021Publication date: November 18, 2021Inventors: Aya TAKEDA, Seiji HIGUCHI, Kusuo UENO
-
Patent number: 11125703Abstract: The radiation detection device according to the present invention comprises: a sample holding unit; an irradiation unit configured to irradiate a sample held by the sample holding unit with radioactive rays; a detection unit configured to detect radioactive rays generated from the sample; a distance calculation unit configured to calculate a distance from a predetermined base point to an irradiated part, which is to be irradiated with radioactive rays, of the sample held by the sample holding unit; a size specification unit configured to specify a size of the irradiated part on the sample based on the calculated distance; and a display unit configured to display the specified size of the irradiated part.Type: GrantFiled: November 27, 2017Date of Patent: September 21, 2021Assignee: HORIBA, LTD.Inventors: Azusa Taroura, Kusuo Ueno
-
Publication number: 20210088423Abstract: A sample dispersing device contains a container inside of which a dispersal chamber where a power sample is dispersed is formed, and an introducing mechanism that introduces a gas containing the powder sample from the outside of the container into the dispersal chamber based on a pressure difference between the inside and the outside of the container. The introducing mechanism contains an introduction pipe where the gas containing the powder sample flows, and several restrictors arranged in the introduction pipe.Type: ApplicationFiled: September 10, 2018Publication date: March 25, 2021Inventors: Makoto NAGURA, Kazuma AOYAGI, Akihiro MINAMI, Hiroshi TATENO, Tomoya SHIMIZU, Kusuo UENO
-
Patent number: 10823688Abstract: The radiation detection device is equipped with a sample holding unit; an irradiation unit for irradiating a sample held on the sample holding unit with radiations; a detection unit for detecting the radiations generated from the sample; an illumination unit for irradiating the sample with light; an observation unit for observing the sample; and a light transmitting plate for allowing the light from the illumination unit, with which the sample held on the sample holding unit is irradiated, to be transmitted therethrough. The light transmitting plate is disposed at a position between the sample holding unit and the irradiation unit, and has an opening portion for allowing the radiations from the irradiation unit, with which the sample is irradiated, to pass therethrough and a scattering portion for scattering light.Type: GrantFiled: November 28, 2017Date of Patent: November 3, 2020Assignee: HORIBA, LTD.Inventors: Hisashi Akiyama, Kusuo Ueno, Takeshi Akamatsu
-
Publication number: 20190331618Abstract: The radiation detection device according to the present invention comprises: a sample holding unit; an irradiation unit configured to irradiate a sample held by the sample holding unit with radioactive rays; a detection unit configured to detect radioactive rays generated from the sample; a distance calculation unit configured to calculate a distance from a predetermined base point to an irradiated part, which is to be irradiated with radioactive rays, of the sample held by the sample holding unit; a size specification unit configured to specify a size of the irradiated part on the sample based on the calculated distance; and a display unit configured to display the specified size of the irradiated part.Type: ApplicationFiled: November 27, 2017Publication date: October 31, 2019Inventors: Azusa TAROURA, Kusuo UENO
-
Publication number: 20190317032Abstract: The radiation detection device is equipped with a sample holding unit; an irradiation unit for irradiating a sample held on the sample holding unit with radiations; a detection unit for detecting the radiations generated from the sample; an illumination unit for irradiating the sample with light; an observation unit for observing the sample; and a light transmitting plate for allowing the light from the illumination unit, with which the sample held on the sample holding unit is irradiated, to be transmitted therethrough. The light transmitting plate is disposed at a position between the sample holding unit and the irradiation unit, and has an opening portion for allowing the radiations from the irradiation unit, with which the sample is irradiated, to pass therethrough and a scattering portion for scattering light.Type: ApplicationFiled: November 28, 2017Publication date: October 17, 2019Inventors: Hisashi AKIYAMA, Kusuo UENO, Takeshi AKAMATSU
-
Patent number: 9869615Abstract: A sample dispersion device capable of preparing a measurement sample in the most suitable dispersion state without repreparing the measurement sample many times, is one that by introducing sample particles into a container and injecting the sample particles in the container using a pressure difference, disperses sample particles onto a holding member provided in a container to make the holding member hold the sample particles. The holding member has a holding surface made to hold the sample particles; and the holding surface has multiple portions having mutually different tilt angles.Type: GrantFiled: April 14, 2015Date of Patent: January 16, 2018Assignee: HORIBA, LTD.Inventors: Kusuo Ueno, Tomoya Shimizu
-
Publication number: 20170045426Abstract: A main object is to provide a sample dispersion device capable of preparing a measurement sample in the most suitable dispersion state without repreparing the measurement sample many times, and the sample dispersion device is one 1 that that by introducing sample particles into a container 2 and injecting the sample particles in the container 2 using a pressure difference, disperses sample particles onto a holding member 9 provided in a container 2 to make the holding member 9 hold the sample particles, in which: the holding member 9 has a holding surface 11 made to hold the sample particles; and the holding surface 11 has multiple portions having mutually different tilt angles.Type: ApplicationFiled: April 14, 2015Publication date: February 16, 2017Applicant: HORIBA, Ltd.Inventors: Kusuo UENO, Tomoya SHIMIZU
-
Publication number: 20090278045Abstract: The invention provides a substrate-examining apparatus which is capable of measuring the detailed shape of a contact hole and the state of a hole bottom. A substrate-examining apparatus includes an electron source (21) for generating an electron beam, a deflector (22) for irradiating a surface of a substrate to be examined with the electron beam from the electron source so as to scan the electron beam, and substrate current detecting means for detecting a current caused to flow from the substrate to a reference potential portion of the apparatus.Type: ApplicationFiled: August 29, 2008Publication date: November 12, 2009Inventors: Kusuo Ueno, Masuo Anma
-
Publication number: 20070085004Abstract: The invention provides a substrate-examining apparatus which is capable of measuring the detailed shape of a contact hole and the state of a hole bottom. A substrate-examining apparatus includes an electron source (21) for generating an electron beam, a deflector (22) for irradiating a surface of a substrate to be examined with the electron beam from the electron source so as to scan the electron beam, and substrate current detecting means for detecting a current caused to flow from the substrate to a reference potential portion of the apparatus.Type: ApplicationFiled: March 28, 2006Publication date: April 19, 2007Inventors: Kusuo Ueno, Masuo Anma