Patents by Inventor Kwan Han

Kwan Han has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20060104638
    Abstract: A communication recovering system for a wavelength division multiplexed passive optical network (WDM PON). The communication recovering system can recover fault of optical fibers between the central office and the remote nodes without additional optical fibers by grouping two remote nodes and employing an AWG having periodic transmission characteristics, and can also simply and rapidly recover such a fault with minimal optical loss using an AWG of 2×N structure and an On-Off optical switch, although protection optical fibers are additionally installed therein. The system can rapidly recover fault of optical fibers between a local office and optical network units, 1:N manner, using 2×2 optical switches, which are installed to each of the optical network units, a reserved transmitter and receiver, and a transceiver.
    Type: Application
    Filed: October 28, 2005
    Publication date: May 18, 2006
    Applicant: Korea Advanced Institute of Science and Technology
    Inventors: Yun Chung, Eui Son, Kyung Lim, Kwan Han
  • Publication number: 20050172192
    Abstract: A scan based Automatic Test Pattern Generation (ATPG) test circuit, a test method using the test method, and a scan chain reordering method are disclosed. The test circuit tests for scan chains comprising unknown values which could adversely influence a test result. The test circuit uses a scan test point circuit to prevent unknown values from propagating through the test circuit, thus keeping the unknown values from influencing the test result. The reordering method is used where two scan chains comprising an unknown value exist in a single scan cycle so that the unknown values can be located during different clock cycles.
    Type: Application
    Filed: January 31, 2005
    Publication date: August 4, 2005
    Inventor: Dong-kwan Han
  • Patent number: 6861866
    Abstract: A system on chip and method of testing and/or debugging the same, where the system on chip includes a plurality of circuits and a control circuit for receiving a serial-parallel mode control signal and at least one selection signal externally input from one or more of a plurality of pins and outputting an output signal depending on values of the serial-parallel mode control signal and the at least one selection signal.
    Type: Grant
    Filed: February 5, 2003
    Date of Patent: March 1, 2005
    Assignee: Samsung Electronics Co., Ltd.
    Inventor: Dong-Kwan Han
  • Publication number: 20040017219
    Abstract: A system on chip and method of testing and/or debugging the same, where the system on chip includes a plurality of circuits and a control circuit for receiving a serial-parallel mode control signal and at least one selection signal externally input from one or more of a plurality of pins and outputting an output signal depending on values of the serial-parallel mode control signal and the at least one selection signal.
    Type: Application
    Filed: February 5, 2003
    Publication date: January 29, 2004
    Inventor: Dong-Kwan Han
  • Publication number: 20020137779
    Abstract: The present invention provides the use of L-2-oxothiazolidine-4-carboxylic acid for the treatment of type 2 diabetes(NIDDM; non-insulin dependent diabetes mellitus). The present invention also provides the pharmaceutical composition containing the chemical L-2-oxothiazolidine-4-carboxylic acid as an active agent for the treatment of type 2 diabetes and the method for the treatment of type 2 diabetes comprising administering to a mammal having the same disease.
    Type: Application
    Filed: June 6, 2001
    Publication date: September 26, 2002
    Applicant: Advanced Biochemicals Inc.
    Inventors: Uh-Hyun Kim, Myung-Kwan Han, Young-Mi Shin, Kwang-Hyun Park, Kum-Jae Park
  • Patent number: 6088108
    Abstract: An optical inspection system for determining the positional information of a leaded electrical component with respect to a reference is provided. The system has a datum placed in proximity to leads of the leaded electrical component that provides the reference. It also has a light source that provides light that impinges on the leads and the datum so that the images of points on the leads and the datum are formed along various optical paths. The light source is set up so that a point on the leads and a point on the datum will lie in the same plane as their images along at least two optical paths that cross each other at an angle. In addition, the system has an imaging subsystem that captures the images along the two optical paths. The subsystem also correlates and analyses the captured images to provide positional information of the point on the leads with respect to the point on the datum.
    Type: Grant
    Filed: December 4, 1998
    Date of Patent: July 11, 2000
    Assignee: Hewlett-Packard Company
    Inventors: Peng Seng Toh, Chiat Pin Tay, Poh Loy Chow, Peh Kwan Han