Patents by Inventor Kwan Heng Lee

Kwan Heng Lee has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10587865
    Abstract: An apparatus and method capable of simultaneously acquiring 3D geometry and appearance modeling data. The 3D reconstruction apparatus including material appearance modeling includes a light source arc including light sources configured to irradiate an object located at a photographing stage, a camera arc including cameras configured to photograph the object at the photographing stage, a driving operation unit configured to rotate the light source arc and camera arc, and a control unit configured to control the light source arc, camera arc, and driving operation unit. The control unit rotates the light source arc and camera arc at a constant interval based on an operation axis through the driving operation unit, and multiple image samples are acquired by operating the light source and camera at a predefined location in a hemi-sphere direction with respect to the object, whereby 3D modeling information including information about geometry and texture can be provided.
    Type: Grant
    Filed: March 6, 2018
    Date of Patent: March 10, 2020
    Assignee: GWANGJU INSTITUTE OF SCIENCE AND TECHNOLOGY
    Inventors: Jun Ho Choi, Kwan Heng Lee, Yong Hwi Kim, Ahmed Bilal
  • Patent number: 10197809
    Abstract: The present disclosure relates to a holographic display system including: a projection object having a three-dimensional shape corresponding to an original item; an image projection unit comprising projectors projecting unit images of parts selected from a three-dimensional image of the original item on the projection object; and a reflector disposed adjacent to the projection object and reflecting images reflected from the projection object to provide an augmented three-dimensional holographic image. In the disclosure, the unit images corresponding to a three-dimensional image of an original item are projected on the projection object having a three-dimensional shape corresponding to the original item using the projectors and reflected by the projection object and augmented by the reflector, thereby providing a virtual image having three dimensional information corresponding to the original item, whereby a proper image is provided to an observer even when the viewpoint of the observer is changed.
    Type: Grant
    Filed: November 29, 2016
    Date of Patent: February 5, 2019
    Assignee: GWANGJU INSTITUTE OF SCIENCE AND TECHNOLOGY
    Inventors: Yong Yi Lee, Kwan Heng Lee, Moon Gu Son, Bilal Ahmed, Jong Hun Lee
  • Publication number: 20180262750
    Abstract: An apparatus and method capable of simultaneously acquiring 3D geometry and appearance modeling data. The 3D reconstruction apparatus including material appearance modeling includes a light source arc including light sources configured to irradiate an object located at a photographing stage, a camera arc including cameras configured to photograph the object at the photographing stage, a driving operation unit configured to rotate the light source arc and camera arc, and a control unit configured to control the light source arc, camera arc, and driving operation unit. The control unit rotates the light source arc and camera arc at a constant interval based on an operation axis through the driving operation unit, and multiple image samples are acquired by operating the light source and camera at a predefined location in a hemi-sphere direction with respect to the object, whereby 3D modeling information including information about geometry and texture can be provided.
    Type: Application
    Filed: March 6, 2018
    Publication date: September 13, 2018
    Applicant: GWANGJU INSTITUTE OF SCIENCE AND TECHNOLOGY
    Inventors: Jun Ho CHOI, Kwan Heng LEE, Yong Hwi KIM, Ahmed BILAL
  • Publication number: 20170255023
    Abstract: The present disclosure relates to a holographic display system including: a projection object having a three-dimensional shape corresponding to an original item; an image projection unit comprising projectors projecting unit images of parts selected from a three-dimensional image of the original item on the projection object; and a reflector disposed adjacent to the projection object and reflecting images reflected from the projection object to provide an augmented three-dimensional holographic image. In the disclosure, the unit images corresponding to a three-dimensional image of an original item are projected on the projection object having a three-dimensional shape corresponding to the original item using the projectors and reflected by the projection object and augmented by the reflector, thereby providing a virtual image having three dimensional information corresponding to the original item, whereby a proper image is provided to an observer even when the viewpoint of the observer is changed.
    Type: Application
    Filed: November 29, 2016
    Publication date: September 7, 2017
    Inventors: Yong Yi LEE, Kwan Heng LEE, Moon Gu SON, Bilal Ahmed, Jong Hun LEE
  • Patent number: 7990536
    Abstract: There are disclosed a system and a method for measuring reflectance of an object. The system for measuring reflectance of an object according to the present invention includes: a light source unit including a light source irradiating light to the object; a light source position adjusting unit that adjusts a position and a direction of the light source unit; a light receiving unit that acquires image data by detecting light reflected on the object; and a reflectance acquiring unit that acquires the reflectance of the object from the image data. According to the present invention, it is possible to more precisely acquire the reflectance of the object within a shorter time.
    Type: Grant
    Filed: August 5, 2009
    Date of Patent: August 2, 2011
    Assignee: Gwangju Institute of Science and Technology
    Inventors: Kwan Heng Lee, Duck Bong Kim, Kang Su Park, Kang Yeon Kim, Myoung Kook Seo
  • Publication number: 20100033721
    Abstract: There are disclosed a system and a method for measuring reflectance of an object. The system for measuring reflectance of an object according to the present invention includes: a light source unit including a light source irradiating light to the object; a light source position adjusting unit that adjusts a position and a direction of the light source unit; a light receiving unit that acquires image data by detecting light reflected on the object; and a reflectance acquiring unit that acquires the reflectance of the object from the image data. According to the present invention, it is possible to more precisely acquire the reflectance of the object within a shorter time.
    Type: Application
    Filed: August 5, 2009
    Publication date: February 11, 2010
    Applicant: Gwangji Institute of Science and Technology
    Inventors: Kwan Heng LEE, Duck Bong KIM, Kang Su PARK, Kang Yeon KIM, Myoung Kook SEO