Patents by Inventor Kwan-seong Kim

Kwan-seong Kim has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20220330420
    Abstract: A method of verifying a fault of an inspection unit, an inspection apparatus, and an inspection system are disclosed. The method according to the present disclosure includes: providing a verification reference body which is formed on a frame attached to an inspection system; placing the inspection unit on the verification reference body; obtaining image data of the verification reference body through the inspection unit; verifying a fault of the inspection unit by extracting a movement error and height error of the inspection unit from the image data; and generating a verification result indicating the fault of the inspection unit.
    Type: Application
    Filed: June 29, 2022
    Publication date: October 13, 2022
    Applicant: KOH YOUNG TECHNOLOGY INC.
    Inventors: Kwan Seong KIM, Myung Ho KIM, Nam Kyu PARK, Joo Hyuk KIM
  • Patent number: 11410297
    Abstract: A method of verifying a fault of an inspection unit, an inspection apparatus, and an inspection system are disclosed. The method according to the present disclosure includes: providing a verification reference body which is formed on a frame attached to an inspection system; placing the inspection unit on the verification reference body; obtaining image data of the verification reference body through the inspection unit; verifying a fault of the inspection unit by extracting a movement error and height error of the inspection unit from the image data; and generating a verification result indicating the fault of the inspection unit.
    Type: Grant
    Filed: February 6, 2017
    Date of Patent: August 9, 2022
    Assignee: KOH YOUNG TECHNOLOGY INC.
    Inventors: Kwan Seong Kim, Myung Ho Kim, Nam Kyu Park, Joo Hyuk Kim
  • Publication number: 20190035068
    Abstract: A method of verifying a fault of an inspection unit, an inspection apparatus, and an inspection system are disclosed. The method according to the present disclosure includes: providing a verification reference body which is formed on a frame attached to an inspection system; placing the inspection unit on the verification reference body; obtaining image data of the verification reference body through the inspection unit; verifying a fault of the inspection unit by extracting a movement error and height error of the inspection unit from the image data; and generating a verification result indicating the fault of the inspection unit.
    Type: Application
    Filed: February 6, 2017
    Publication date: January 31, 2019
    Applicant: KOH YOUNG TECHNOLOGY INC.
    Inventors: Kwan Seong KIM, Myung Ho KIM, Nam Kyu PARK, Joo Hyuk KIM
  • Patent number: 5546428
    Abstract: A differentially encoded quadrature modulation method comprises the steps of setting an index corresponding to a phase variation value constituted of input data, forming a phase value to obtain a phase-modulated output phase value from a given table and forming a channel signal to obtain in-phase (I) and quadrature (Q) channel signals from a given table using the phase value. The apparatus for performing the above comprises a signal converter for converting serially input data into two binary signal trains, a signal forming portion for obtaining channel signals, a digital-to-analog converter for converting the respective signals into two analog signals, a baseband filter for baseband-pass-filtering the signals, a phase shifter for shifting a carrier by 90.degree., first and second multipliers for multiplying the filtered signals with the carrier and phase-shifted carrier, respectively, and a mixer for mixing the respectively obtained signals and outputting a combined signal.
    Type: Grant
    Filed: October 6, 1993
    Date of Patent: August 13, 1996
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Il-hyun Nam, Kwan-seong Kim