Patents by Inventor Kwang Geol Lee

Kwang Geol Lee has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240168106
    Abstract: Disclosed is a method and apparatus for measuring magnetic field and/or temperature using a diamond nitrogen-vacancy center sensor, and a measuring apparatus based on a diamond nitrogen-vacancy center (DNV) sensor may include: a diamond nitrogen-vacancy center sensor; a frequency synthesizer for generating a first reference signal and a second reference signal; a first microwave generator for generating a first microwave that is frequency modulated according to the first reference signal and causes a first spin transition in the diamond nitrogen-vacancy center sensor; a second microwave generator for generating a second microwave that is frequency modulated according to the second reference signal and causes a second spin transition in the diamond nitrogen-vacancy center sensor; a laser irradiator for applying a laser to excite the spin state of the diamond nitrogen-vacancy center sensor; a power amplifier for combining and amplifying the first microwave and the second microwave to apply to the diamond nitrog
    Type: Application
    Filed: November 21, 2022
    Publication date: May 23, 2024
    Inventors: Jeong Hyun Shim, Sang Won Oh, Ki Woong Kim, Kwang Geol Lee
  • Publication number: 20240053208
    Abstract: The present disclosure relates to an apparatus for measuring temperature distribution in a wide area using a diamond nitrogen vacancy center sensor and a method for fabricating the same, and disclosed is a diamond nitrogen-vacancy center sensor capable of measuring a temperature in a wide area including: a plurality of diamond thin films that are provided at different positions on an insulator and are not connected to each other, and it will be possible to measure temperature distribution in a wide area using the same.
    Type: Application
    Filed: December 1, 2020
    Publication date: February 15, 2024
    Inventors: Sangwon OH, Jeong Hyun SHIM, Seong-Joo LEE, Kwang-Geol LEE, Juil HWANG, Seung Hun SONG, Ouk Jae LEE
  • Publication number: 20100091294
    Abstract: A system for measuring an electric field vector includes an optical extractor configured to extract an optical signal having a spatial resolution of a nanometer level. The optical signal corresponds to incident light at a measuring position within an examination area of a surface of a specimen. The system further includes a polarization analyzer for analyzing a polarization characteristic of the optical signal extracted by the optical extractor, and an electric field vector determinator for determining at least a size and an orientation axis of an electric vector at the measuring position using the polarization characteristic analyzed by the polarization analyzer.
    Type: Application
    Filed: March 23, 2007
    Publication date: April 15, 2010
    Applicants: SAMSUNG ELECTRONICS CO., LTD., SEOUL NATIONAL UNIVERSITY R & DB FOUNDATION
    Inventors: Dai Sik Kim, Kwang Geol Lee, Hyun Woo Kihm